Bruker Nano Surfaces
From leading edge scientific research to high-speed production, Bruker provides the critical surface measurements necessary for success with the world's broadest range of AFMs, stylus profilers, mechanical testers, non-contact 3D optical microscopes, and fluorescence optical microscopes.
- 978-663-3660
- 978-663-5585
- pr@bruker.com
- 40 Manning Road
Billerica, MA 01821
United States of America
-
Product
CMP Process and Material Characterization System
CP-4
-
he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
-
Product
Microscopes
-
Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
-
Product
Electron Microscope Analyzers
-
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
-
Product
3D Optical Microscopy
-
Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our microscopes are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.
-
Product
Optical Emission Spectrometers
-
Optical emission spectrometers (OES) and the measuring principle of the atomic emission are the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments.













