X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
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Real-time X-ray Medical Device Inspection System
The Bench-X
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Our latest real-time, compact system used for Medical Device X-ray Inspection. Very configurable and compact with high resolution at relatively low radiation levels.
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Total Reflection X-Ray Fluorescence (TXRF) Products
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Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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Refurbished And Demo X-ray Inspection Systems
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Our 2024 collection of refurbished and demo X-ray inspection systems offers high-quality performance at an affordable price. These precision X-ray inspection systems provide exceptional value without compromising on quality.
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Automated X-ray Inspection (AXI)
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Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
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Product
Detachable X-Ray Detector
RadEye HR
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The Remote RadEye HR x-ray detector is a slim, lightweight, rugged solution for high-resolution radiation imaging. The detector is suitable for industrial inspection applications where images are taken in tight or difficult-to-reach spaces.
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Gamma Spectrometer
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Quaesta now offers two gamma spectrometer products which have many of the features in our neutron detection products such as data logging, computer interface and software. These devices include standard crystal scintillators such as Nal and Csl.
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Product
Nuclear Magnetic Resonance Spectrometer
NMR
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NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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Windows-Based Software Suite for Rigaku's X-Ray Diffractometers
SmartLab Studio II
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SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.
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Product
X-ray Inspection System
RTX-113™
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Glenbrook’s RTX-113 is designed for heavy production environments where X-ray is used to inspect PCBs and assembled PCBs containing advanced components such as BGA, micro BGA, QFN and other devices.
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Product
X-Ray Inspection
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X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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Product
Glow Discharge Atomic Emission Spectrometer
GDS900
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LECO's Glow Discharge Spectrometer (GDS) offers you state-of-the-art technology designed specifically for routine elemental determination in most conductive ferrous and nonferrous materials. The GDS900 features improved performance, stability, accuracy, and precision in steel, iron (including as-cast), aluminum, copper, zinc, nickel, cobalt, tungsten, and titanium materials, while featuring our user-friendly Cornerstone® brand software to help streamline your analysis.
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Product
Continuous Particulate Monitor with X-ray Fluorescence
PX-375
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There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
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Product
X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
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Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm. X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure. Mapping area size up to 350 x 350 mm2 <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution. Dual types of detectors for transmission and fluorescent X-rays. Detectable element range down to C with a light element detector and He purge module.
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Product
TAPPIR Femtosecond Transient Absorption Pump-Probe Infrared Spectrometer
TAPPIR
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A femtosecond difference frequency generator (DFG) is installed inside the TAPPIR optical unit for the tunable probe of transient absorption within 3 mm - 11 mm. DFG is pumped with signal and idler waves delivered together from an external optical parametric amplifier.
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Packaged Food X-ray Inspection System
EPX100
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Our revolutionary new x-ray system is so advanced it will not only improve your product safety and meet regulatory compliance but also will optimize and streamline your product inspection.
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Product
Small Footprint NIR Spectrometer
PGS Series
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ZEISS PGS modules with a spectral coverage of 960 - 2200 nm are among the market leading NIR spectrometers, providing a small footprint, highest throughput and excellent SNR. Special TE-cooled/uncooled InGaAs detectors ensure lowest noise conditions.
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Product
TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Product
Proton Induced X-ray Emission (PIXE)
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Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
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Product
Spectrometers
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Since spectroscopy is used for numerous applications, we have defined our products in different lines, as seen below. We offer instruments with a small form factor to integrate into other devices in the CompactLine: high-sensitivity instruments for more demanding applications in the SensLine and spectrometers especially configured for the near-infrared range in our NIRLine. The StarLine spectrometers are our most versatile instruments for general spectroscopy applications.
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Product
Stable Isotope Ratio Mass Spectrometer
isoprime precisION (IRMS)
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Elementar Analysensysteme GmbH
Stable isotope analysis provides great insight into diverse applications and delivers a greater understanding of the micro and macro cycling mechanisms of the organic elements through the world around us. Though our collective knowledge continues to grow, so does our desire to explore further. The more we know, the more we question.
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X-ray and CT Inspection Systems
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YXLON X-ray and CT systems come in many different configurations. We've developed a Product Finder to help narrow your search for the system that best meets your needs. Can't find what you're looking for? Our specialists will customize a system to your exact specifications. Contact us today for more information.
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Product
High Spectral Rate and High Dynamic Range Miniature Spectrometers
VS70-HSR & VS70-HDR
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VS70 is a high performance compact fiber coupled spectrometer system covering wide spectral range of 200 to 1050 nm. This OEM optical module is built around Horiba’stype-IV Aberration-Corrected Flat-Field Holographic Ion-Etched concave grating and is specially designed to easily adapt to a large variety of detectors and electronic drivers. This system is fitted with a custom variable order-sorting filter to eliminate higher orders.
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Spectrometers
EAGLE
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The EAGLE platform is a series of high-resolution spectrometers, that offers:*High resolution*High efficiency, transmission grating-based design*Robust and athermal performance
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Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Product
X-ray Camera
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Up until the introduction of SID-A50, X-ray inspection systems has been using detectors such as Image Intensifier (I.I.) and C-MOS Flat Panel Detectors, which needs to convert X-ray into optical light first, in order to visualize X-ray.These Indirect Conversion Method X-ray Detectors comes with multitude of issues. These problems include but not limited to; Low Sensitivity, Fuzziness, Time Degradation, Inadequate Life
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Product
FTIR Spectrometers
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FTIR spectroscopy is used to quickly and definitively identify compounds such as compounded plastics, blends, fillers, paints, rubbers, coatings, resins, and adhesives. It can be applied across all phases of the product lifecycle including design, manufacture, and failure analysis.
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Bench-top Microreactor & Combined Mass Spectrometer System
CATLAB-PCS
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The Hiden CATLAB is a bench-top microreactor and combined mass spectrometer system for rapid and reproducible catalyst characterisation and reaction studies. The modular benchtop system features an advanced fast-response low thermal mass 1000oC furnace, multistream gas flow control of up to eight integrated gas streams, together with the precision Hiden quadrupole gas analyser.
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Product
X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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Ultra-High Resolution Spectrometers
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Fabry-Pérot interferometers are optical resonators used for high-resolution spectroscopy. They use the phenomenon of multiple-beam interference that results when light shines through a cavity bounded by two reflective parallel surfaces. When the light hits one of the surfaces, some is transmitted out, and the remaining part is reflected back. Fabry-Pérot produces a circular fringe pattern, similar to the Michelson pattern. However, the fringes are thinning, brighter, and more widely spaced. As a result, these instruments are able to detect and resolve the fine features of a transmission spectrum with high precision.
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Product
Energy Dispersive X-ray Fluorescence Analyzer
X-5000
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HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation.





























