Diamond
an allotropic form of carbon.
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Product
Digitizer
751Family
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The 751 is a family of CAEN Waveform Digitizer able to perform basic waveform recording and run online advanced algorithms (DPP) of charge integration and pulse shape discrimination with constant fraction timing and zero-length encoding. Data is read by a Flash ADC, 10-bit resolution and 1GS/s sampling rate (2GS/s using half of the channels in DES mode), which is well suited for fast signals as the ones coming from fast organic, inorganic and liquid scintillators coupled to PMTs or Silicon Photomultipliers, Diamond detectors and others. The acquisitioncan be channel independent and it is possible to make coincidence/ anti-coincidence logic among diferent channels and external veto/ gating. Multiple boards can be synchronized to build up complex systems.
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Product
Bi-directional SFP Modules
BiDi SPF
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The DIAMOND SA flexos BiDi-SFP modules (transceivers) make it possible to transfer data via fibre optics. The Bi-Di SFP modules are available in single-mode and Gigabit Ethernet. The SFPs have metal housings with latches for the simple removal of the module. They are compatible with connector types F-3000™ and LC.
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Product
Millimeter-Wave Isolators
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Our millimeter wave Faraday rotation isolators are the best choice to suppress standing waves in your systems. They have the lowest insertion loss in the industry and are the perfect choice for sensitive millimeter wave instrumentation. Our millimeter wave isolators employ unique diamond heat spreaders for cooler operating temperatures and improved power handling. They are 100% made in the USA and can be sole-sourced in US government acquisitions.
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Product
Non-Destructive Testing (NDT)
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Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.
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Product
Air-Cooled Universal Test Platform
Diamondx
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Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Product
Digitizer
761 Family
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The 761 is the family of CAEN Waveform Digitizer with the highest sampling rate Flash ADC (10 bit @ 4GS/s). It can record fast signals from fast organic, inorganic and liquid scintillators coupled to PMTs or Silicon Photomultipliers, Diamond detectors and others, and save them with high efficiency and precision for advanced timing analysis. The acquisition can be externally vetoed/gated. Multiple boards can be synchronized to build up complex systems.
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Product
Hardness Testers
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The hardness tester products you will find at PCE Instruments (PCE) are used for determining surface hardness. Each hardness tester uses a standard method of measurement. The measuring principles of most hardness tester devices are based on either the penetration of a diamond indentor into the material being tested or a calculation related to the force of the rebound after striking the tested material. However, material hardness can also be measured accurately through ultrasonic testing. Each hardness testing method has its benefits and will allow for the precise measurement of material hardness in accordance with the technical specifications of the hardness testing instrument.
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Product
Linear Electron Accelerators Where Electrons Reach Energy Of Up To 10 MegaWatt
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*Processing polymer materials and modifying their parameters*Processing semiconductor materials and devices*For treating food products for disinfection, eliminated bugs, pathogens, and micro-organisms, and increasing their shelf life*Processing diamonds, precious stones and semi-precious stones to change their color
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Product
Semiconductor Test Platform
Diamondx DxV
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The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop:
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Product
Boron Enhanced Diamond-like Carbon Hybrid Foils
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can be increased by sandwiching a thin layer of boron between two layers of diamond-like carbon. MICROMATTER DLC-B hybrid foils contain between 5% and 10% boron.DLC-B foils have remarkable flexibility, higher tensile strength and hardness. In most applications, their lifetime in particle beams is significantly greater than regular DLC foils. DLC-B foils are recommended for applications that require highest mechanical robustness and improved durability under beam conditions.
