EV Test Systems
See Also: Electric Vehicle Test Systems, EV Testers
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Product
Nanomechanical Test System
Hysitron TS 77 Select
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The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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Product
Electrical Test System TY-CHECKER
DS Series
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FPC electrical test systems with efficient step-conveyance and rotation features. Original tensionless conveyance method handles atypical shapes and reinforced FPCs. Highly accurate self-learning alignment ensures smooth throughput.
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Product
High Power & Voltage Pack Testing System
FTF
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Drive simulations with standard Electric Vehicle tests: FUDS, SFUDS, GSFUDS, DST and ECE-15LDrive Cycle TestingIntegration with motor test benchesCycle testing of EV/HEV Battery Packs
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Product
WEIGHING SYSTEM TESTING
1006
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The Tester 1006 has a simultaneous control function of up to 4 load cells in any weighing system, upload and download function for programming the DAT and MC 302 series instruments, but it can also be used as a Calibrator and Peak detector. It is very useful for the correct mechanical installation and for fault diagnosis. The Tester 1006 is supplied as standard with cable for connection to our junction boxes / sum mod. CEM 4 / C and CGS 4 / C. Simultaneous display of the signal of each individual load cell allows to control the entire weighing system, weight distribution, overloads, faulty cells and faulty connections. OUT OF PRODUCTION. Pavone systems provides a new version of Tester 1006: Tester 1008.
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Product
VLF Test System
BAUR PHG 70 portable
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Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Product
System Instruments
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Product
Integration of Inline Test Systems
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The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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Product
High Temperature Test System
129620A
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Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
Versatile quality control testing system
QuickSun® 550Ei
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QuickSun 550Ei is a versatile testing system for qualifying of PV modules with dimensions up to 105 x 205 cm2. Basic set up includes a top class solar simulator which measures modules in sunny side up position enabling e.g. soiling simulations. Several additional measurement methods can be integrated to the same system including high resolution EL imaging with analysis software from one of the most recognized EL system suppliers. Also hot spot revealing IR images can be recorded by applying either forward or reverse bias current, and true nA scale leakage current measurements can be performed with sensitive enough instruments.
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Product
Testing
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Apogee Labs offers a wide variety of modular chassis types used for test applications with various Data Link Test Modules.
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Product
Battery Test System
WBCS3000Le32
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : -1V to 5Vmax. current range : ±1A
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Product
Test System Elowerk
eloZ1
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the latest generation. It reliably finds connection errors and assembly errors in electronic assemblies. The test electronics can be integrated both in table systems and in inline systems.
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Product
Metrology System
IMPULSE V
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With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
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Product
Thermocouple System
Model TCIC
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Industrial Measurement Systems Ltd.
High Speed 8 Channel Thermocouple Interface CardPDF VersionModel TCIC Thermocouple Interface Card with USB or RS232 / 485Main FeaturesLow cost high speed thermocouple measurement 400 channels / second
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Product
Control Systems
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Complete real-time control and data acquisition solutions for hydraulic and servo-hydraulic applications. Don’t have the time or budget for a fully custom-built test system? Consider one of Genuen’s turnkey solutions for multi-loop control and data acquisition. We offer powerful, flexible solutions ranging from low cost desktop controllers to pre-configured rack systems, all standardized on the same technology platform.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Measurement System
CmForce
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CeTaQ has developed a measuring system for the determination of placement force under real process conditions. This makes it possible to identify weaknesses at an early stage and to avoid component damage during the assembly process. With only one measurement; force and energy input of each nozzle are now known.
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Product
Test System
LPDDR4 and LPDDR3
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Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Product
ADAS System
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Is the precise physical alignment, testing, and electronic aiming of sensors that collect data to inform your vehicle’s advanced driver assistance systems (ADAS).
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Product
Electrolytic Capacitor Test & Scanning System
DU-9001
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Delta United Instrument Co., Ltd.
The 10 capacitor - LCC/DZ/R in order to automatically scan test improve the test reliability and test efficiencyEach test channel can be opened / short circuit return to zero with high precision.Wide range scan box can be used to test 3mm~35mm 10 capacitorsSuitable for high voltage capacitance test, 450V330uF 10 capacitors can be smooth test
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Product
QE System
PVE300
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The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
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Product
Ionic Contamination Test System
Omegameter SMD 650
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The SCS Omegameter SMD 650, the long-time industry standard for ionic testing utilizing “static test” methodology, is designed to perform cleanliness testing on printed circuits and assemblies. Identifies the presence of ionic contamination on bare and assembled printed circuit boards and other electronic components. Provides an accurate and repeatable method for determining cleanliness on site. Provides immediate process control results, eliminating the need for outside laboratory testing.
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Product
Metrology System
IVS
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The IVS 220 system is the latest generation in the IVS series and has been designed for ultimate precision, TIS (tool induced shift) and throughput on 200mm wafers. The cornerstone of the system’s reliability and stability is its mean time between failure (MTBF) of 2,100 hours. The IVS 280 provides the same capability in a package designed for overhead track handling with full E84 GEM300 capability.
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Product
Circuit Breaker Test Systems
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Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
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Product
Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
System Level Test
SLT
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As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
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Product
System Integration
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The most powerful of these is the flagship SC5100 System Controller that provides integration throughout the stationary industrial scanner portfolio of DS/DX laser readers, AV imagers, DM dimensioners.
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Product
Tensile Testing System With Thermostatic Chamber
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This thermostatic chamber is ideal for long-stroke tensile testing of large-elongation materials such as rubber and plastic in controlled temperature environments.
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Product
VLF Testing and Diagnostics System
PHG 70 TD/PD
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Cable testing and diagnostics with the BAUR PHG 70 TD/PD. With the PHG TD/PD, you get a multifunctional cable testing and diagnostics system that was specially designed and developed for medium-voltage networks. The PHG TD/PD system is also the only cable testing and diagnostics system that gives a comprehensive overview of the quality and ageing condition of the test sample. The diagnostic methods TD and PD are mutually complementary, because on one hand you can detect the complete condition and on the other hand locate * individual faults in the operating resources.* High performance VLF truesinus testing device (3 kW) with regulated output voltageCompact, enclosed design in 19" format* Variable installation option with separate control and voltage unit* Variable connection options to cable stations of different models
