Surface Profiling
See Also: Surface Profile, Surface Profilers
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Product
Chloride Ion Test Kit for Surfaces
134S
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Elcometer 134S test method: a latex sleeve is filled with a Chlor*Rid extract solution and stuck to the test surface where the solution is worked against the surface to extract the salts. The titration tube is inserted and the results can be recorded.
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Product
Extrusions and Profiles
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A wide range of extrusions for any kind of 19" frames and applications as well as EMC front panels, profile panels or back panels.
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Product
Low Profile PCI Express 8-Port
7803ec
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The 7803ec low-profile PCI Express serial interface provides eight RS-232 serial ports. All modem control signals are implemented for maximum compatibility with a wide range of serial peripherals. Each serial port features an ultra high-speed UART, flexible clock prescalar, and large 256-byte Tx/Rx FIFOs allowing the adapter to support the widest range of standard and non-standard baud rates to 230.4 Kbps. These features make the 7803ec ideal for data-intensive applications that require reliable, fast throughput rates.
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Product
3U OpenVPX 3 Slot Profile BKP3-CEN03-15.3.5-3
1OVX303PZ6-1X11R
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Single star FP data plane with two V66.4 optical slot interfaces.
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Product
Beam Profiling System
BeamCheck
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BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
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Product
Low Profile PCI 8 Reed Relay Output
8012
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The 8012 Low Profile PCI digital interface provides eight Reed relay outputs (SPST) and eight optically isolated inputs. Reed relays are well suited for low current applications. The relays are normally open, and close when energized. The board is MD1 Low Profile and Universal Bus (3.3V and 5V) compatible.
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Product
6U OpenVPX 12 Slot Profile BKP6-CEN12-11.2.21-5
1OVX612FZM-1X01
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VPX Dual Star with data plane and control plane switches channel Gbaud rate up to 10.
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Product
K Thermocouple Surface Probe
TP754
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Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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Product
Low Profile Isolated Digital Input/Output Card
LPCI-IIRO-8
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The LPCI-IIRO-8 is a half-size Low-Profile PCI bus compatible card that provides isolated digital input and output interface for PCI-Bus computers. The card has eight optically-isolated digital inputs for AC or DC control signals and eight electromechanical relay outputs. LPCI-IIRO-8 occupies four consecutive 8-bit registers in I/O space.
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Product
Inclined Surface Coefficient Of Friction
DRK138
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Shandong Drick Instruments Co., Ltd.
DRK138 Inclined Surface Coefficient Of Friction Tester is applied to testing the COF of film, paper, card board, sheet and so on. By testing the material’s frictional properties, the open performance of packages, packaging speed of packers and other indexes could be controlled to meet the requirements for production
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Surface Analysis
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Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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Product
3U OpenVPX 9 Slot Variant to Profile BKP3-CEN09-15.2.17X-3
1OVX309KZ6-1X11R
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Hierarchical star, no expansion plane| control plane| open slot 3.
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Product
Optical Profiler
DRK8090
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Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Product
LIXI Profiler
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The LIXI Profiler uses our proprietary technology, Radiometric Profiling, the only NDT technology that allows you to see everything you need to manage a healthy pipe system without touching a thing.
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Product
In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
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ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Product
Digital Surface Resistance Meter
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NEW Enclosure with Rubber Grip EdgesThinner and narrower design is easier to hold and provides protection from drops.NEW Quick Check ButtonBypasses the 15 second electrification period to allow quick spot checks.NEW Battery Compartment
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Product
Surface Mount Package Emulation
SMT Adapters
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Ironwood’s SMT package emulation adapters are often called “surface mount feet” or “emulator bases”. These adapters provide access and interconnections to surface mount lands. Typically, the adapters are soldered to the target board in place of the IC device and provide a pluggable array of pins interface for sockets, probing adapters, package converters, and even board-to-board connections. These adapters are often utilized as a base for many of our probing adapter products. We constantly innovate to provide the most reliable, cost effective interfaces available. For example, many of our PLCC, QFP and SOIC emulation bases use our proprietary shaped solder techniques, replacing expensive, and often fragile, J-lead and Gull Wing leads. Shaped solder parts are easily fluxed and reflowed onto the target system. Our emulator bases can present either a male or female interface at 1.27mm or 1mm or 0.8mm pitch gold plated array pins for pluggable connection.
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Product
Wind Profilers
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Bristol Industrial & Research Associates Ltd
Biral provides Sodar systems for the 3-dimensional measurement of wind speed and direction in a vertical column extending hundreds of metres above the sensor. Sodar systems are used in applications such as wind energy site assessment, wind shear detection at airports, plume modelling and basic research.
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Surface Quality Monitors
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PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.
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Product
3U OpenVPX 3-Slot Profile BKP3-DIS03-15-2.XX-3
1OVX303QZ3-1X11R
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Single star, 2 x SATA slots on expansion plane, no control plane.
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Product
Skin Surface Probe
SST-1
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The SST-1 skin surface temperature probe for humans, to be taped on is re-useable and has a fast response time.
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Product
Surface Measurement Instrument
SMI
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Redefining speed and accuracy in non-contact metrology, the Optikos SMI is a high-speed surface topography instrument that characterizes spherical, toric, and aspheric surfaces. The SMI measures surface shape deviations of precision surfaces using wavefront analysis technology. Configured to measure such items as: micro-optics, ball lenses, and contact lens molds, the instrument allows users to easily measure aspheric and toric parts without the need for reference surfaces.
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Profile Projectors and Vision Systems
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Aberlink's revolutionary measurement software provides you with a powerful, yet easy-to-use user interface. This means you can use the Aberlink 2D software on your profile projector or vision system within 15 minutes of being shown the inspection routines for the first time. You will substantially increase the measurement capability of your profile projector and part inspection through-put.
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Product
Surface Analysis
Dimension FastScan Bio
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The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Product
3U OpenVPX 2 Slot Profile BKP3-DIS02-15.2.8-3
1OVX302CZ3-1X11R
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Distributed mesh, no expansion or control planes 3U, 2 Slot.
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Product
Skin Surface Probe
SST-2
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The SST-2 skin surface temperature probe for humans, with convenient plastic handle. Probe re-useable and has a fast response time.
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Product
Water quality profiler with optical fast DO sensor
AAQ-RINKO
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The water quality profiler, AAQ 1183 has been redesigned as AAQ-RINKO with an optical fast response (63% response in water, 0.4 s) DO sensor, RINKO. Conventional water quality profilers with a slow response DO sensor require holding the instrument for a certain period at the measurement depths. AAQ-RINKO makes vertical measurements possible with a profiling speed of 0.5 m/s, similar to CTD observation, thereby significantly reducing the observation time. In addition to conductivity, temperature, depth, chlorophyll, turbidity, DO and pH, AAQ-RINKO also enables simultaneous installation of PAR (Photosynthetic Available Radiation) and ORP (Oxidation Reduction Potential) sensors. The processing unit is available in three types in accordance with the observation applications.
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Product
Surface Water Absorption Tester
TF167
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TESTEX Testing Equipment Systems Ltd.
Specimens are placed at an angle on the base of the apparatus. After water flows down the surface of each specimen, the amount of water retained by each specimen is measured. Six specimens are tested, three on the face of the fabric and three on the back of the fabric. The six observations are averaged to determine the surface water absorption of the fabric.
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Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
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Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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Product
Sub-bottom Profiling
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The EdgeTech Sub-bottom Profiling System is a wideband Frequency Modulated (FM) sub-bottom profiler utilizing EdgeTech’s proprietary Full Spectrum CHIRP technology. The systems generate high-resolution images of the sub-bottom stratigraphy in oceans, lakes, and rivers.
