Recognition
See Also: Detection
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Product
Flaw Detector & Thickness Gauge
DFX-7
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Automatic: probe zero, probe recognition, and Temperature compensation.Measurement: Variety of modes to address a number of applications.Large data storage with multiple formats: Alpha numeric grid and sequential w/auto identifier.Windows PC interface software.2 year limited warranty.
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Product
EMI/EMC Filters And EMI Solutions
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Chengdu Mengsheng Electronics Co., Ltd.
DOREXS is a company specializing in the manufacture of EMI/EMC filters. For more than a decade, it has been committed to providing cost-effective EMI/EMC filters and EMI solutions for commercial, medical, military and industrial applications. We help your equipment gain recognition for its stable and reliable functions.
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Product
Meter with "3-in-1" pH/Temperature Combi Electrode
pH 5+
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Multi-Point Calibration (up to 5 points) with Auto-Buffer Recognition - choice of USA, NIST or pure water buffer standards with ±0.01 pH accuracy
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Product
ESM/ELINT System
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Shoghi’s Electronic Support Measures (ESM) are designed for electronic warfare techniques involving actions to detect, intercept, identify, locate, record, and/or analyze sources of radiated electromagnetic energy for the purposes of immediate threat recognition.
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Product
Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Product
NUV-PL SiC Defect Inspection System
VS6845E
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Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Product
Design & Manufacturing Services
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Since its inception, APLAB has been serving the Global Market with a wide range of Electronic Products meeting the International standards for safety and reliability such as UL, VDE, etc. APLAB enjoys worldwide recognition for the quality of its products, our business integrity and innovative engineering skills.
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Product
Waterproof Portable pH Meter
CyberScan pH 310
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Multi-Point Push-button Calibration (up to 5/6 points) with Auto-Buffer Recognition - choice of USA, NIST or DIN buffer standards for quick calibration with no calibration mistakes
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Product
Meter with "3-in-1" pH/Temperature Combi Electrode
pH 6+
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Multi-Point Calibration (up to 3 points) with Auto-Buffer Recognition - choice of USA, NIST or pure water buffer standards with ±0.01 pH accuracy
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Product
MEMS Microphone Test
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The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.
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Product
Single Front Slot + Single Rear Slot Universal PCI To PCMCIA Adapter With Black Bezel
P416B
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The P416 addresses the need to have front access to a PCMCIA slot for use with cards like Flash media, or Finger Print recognition, while also having a rear slot for cards that are less frequently swapped, like Wireless LAN or Bluetooth. The rear slot is 32-bit capable meaning it supports CardBus cards which makes it forward compatible with some of the newer high speed Wireless LAN standards like 802.11a and 11g.
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Product
Sound Analysis-Synthesis
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iNSTiTUT DE RECHERCHE ET COORDiNATiON ACOUSTiQUE/MUSiQUE
The analysis of sounds includes methods enabling the permanent extraction or automatic structuring of diverse sorts of information given off by the signal, such as the fundamental frequency or the spectral evolution determining the pitch and timbre of a perceived sound. Information outside what is strictly musical is also taken into consideration, notably concerning industrial acoustics, sound design and multimedia as well as the automatic indexing of recorded sounds. The methods used are based on signal processing, statistical analysis, information theory, machine learning and recognition techniques, but also on knowledge of auditory perception.
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Product
Data Extraction Solution
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Axiomtek's intelligent data extractor utilizes optical character recognition (OCR) to collect and process legacy PC-based data and convert various sources of data into a unified raw data format.
