System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Missile Warning System Test Set
Baringa™ IR/UV
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Baringa™ is a handheld, ruggedized aircraft survivability test set used to stimulate the electro-optic sensor suites on various aircraft platforms. Available in ultraviolet (UV) as well as one-color or two-color infrared (IR), Baringa simulates dynamic multi-engagement profiles and is easily reprogrammable to meet user testing needs.
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Product
System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Product
Weapon Control System Test Set
MS 1102
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- Provides serviceability checks on armament system- Portable instrument- Check the Bomb release sequence, practice bomb release sequence, rocket release sequence, fuzing, and jettison of aircraft stores- Helps to identify faults of conventional armament- Microprocessor based design
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Product
Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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EW System Test Set
MS 1107
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PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
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EMI Test System
TS9975
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The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Sealed Beam Bulb Testing System
H710019SSL
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EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Functional Test System
TS-5040
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The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Parallel Test Systems
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Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Product
JTAG Test Procedures
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Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete “turn-key” service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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High Energy Shock Test System
KRD13 series
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KRD13 series high energy shock test system is specially designed to meet the requirements of military and automotive testing. The system adopts the principle of pneumatic energy storage expansion. By adjusting the inflation pressure, various high-level acceleration tests can be easily implemented in a short stroke.For the high-G classic shock test, it’s equipped with the corresponding shock amplifier to complete high-peak shock test.
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Product
Bloomy Simulation Reference System
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The Bloomy Simulation Reference System provides a hardware in-the-loop (HIL) test environment for dynamic, closed-loop testing of many aerospace and transportation control systems. The reference system integrates the computing, I/O, and software components needed for standalone use or to form the basis of a more complex test system.
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Product
Eddy Current Test System
CIRCOGRAPH® Product Family
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Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Product
Microhardness Tester
MT91 Series
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Newage Testing Instruments, Inc.
The Newage MT91 System is an automatic microhardness testing system that uses the Rockwell method for the hardness result. Hardness is measured based on the depth of penetration rather than using an optical system to determine hardness based on the impression diameter.
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Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Visible / Infrared / Imaging Test System
System 1808
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Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
PXI Precision Resistor Module 18-Channel, 1 to 122
40-297-012
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This 18-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
PXI High Density Precision Resistor Module, 4-Channel, 2.5Ω to 472Ω
40-298-120
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The 40-298-120 is a high density programmable resistor module with 4 channels which can be set between 2.5Ω and 472Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI Precision Resistor Module 4-Channel, 1.5 to 472
40-297-120
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This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Electronics Functional Test
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Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 3.55kΩ
40-251-023
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The 40-251-023 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 3.55kΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXIe-2746, 2.7 GHz, Quad 4x1 PXI RF Multiplexer Switch Module
780587-46
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PXIe, 2.7 GHz, Quad 4x1 PXI RF Multiplexer Switch Module—The PXIe‑2746 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2746 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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Saluki S87234 Series USB Peak and Average Power Sensor (max. 67GHz)
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S87234D/E/F/L USB peak and average power sensor is a diode-detection broadband power measurement instrument based on the USB 2.0 interface, which can realize accurate average power measurement, pulse power measurement with large dynamic range and CCDF statistical measurement analysis. The frequency range covers 50MHz to 67GHz, the highest power accuracy can reach 0.2dB, the video bandwidth is ≥30MHz, and the rise/fall time is ≤13ns.S87234 series can flexibly expand the power measurement function of electronic measuring instruments and test systems, and is mainly used for field testing, production line testing and system integration.
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System Testing
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TestOrigen Software Testing Services Pvt Ltd.
System testing is basically a sequence of various test performed to check the whole computer-based system. The key objective of system testing is to confirm the system level testing should meet the user’s viewpoint.
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Product
NFC Conformance Test System
T3111S
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The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
PCI High Density Potentiometer Card 9-Channel, 8-Bit, 0 To 255 Ohm
50-296A-121-9/8
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The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
ARTES Automatic Relay Test Systems
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The purpose of power system protection is to use accurate and reliable protection devices to detect faults promptly and without fail and to minimize impairments to the power supply by selectively switching off faulted sections of the system.The use of suitable protection devices can significantly improve the safety and reliability of complex electrical power systems and installations. Regular testing is the only way to ensure that these protection devices function correctly throughout their operational life.More than 20 years of experience in developing and manufacturing automatic relay test systems have gone into creating the third generation of ARTES test instruments. Back in 1996, KoCoS was the first company to present Windowsbased testing software for controlling and operating test equipment and the company continues to play a pioneering role in the design of clearly structured and ergonomic user interfaces today.
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Product
Damped Oscillatory Wave Simulators
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Suzhou 3ctest Electronic Co.,Ltd.
Damped oscillatory wave test system for new energy can produce repeatable transient on HV or medium voltage power cord, control line and signal line. It can meet the requirements of CE and CCC certificate. With internal three-phase five-wire high power CDN DOPN 69100T, it can conduct new energy test and high power load test with good reliability, stable performance and easy operation.
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Flying Prober Test
QTOUCH1202C
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Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
