Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Product
4% Beam Splitter
10725B
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The 10725B 4% beam splitter, designed for beam diameters of 9 mm or less, reflects 4% of the total incoming laser beam and transmits 96% straight through. This optic is without housing and requires a user-supplied mount.
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Product
Ion Sources
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Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
