Image Analysis
The extraction and analysis of data from images.
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Product
Imaging Luminance Meter
CX1000
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Hangzhou Hopoo Optoelectronics Technology Co., Ltd
CX-1000 imaging brightness meter is used to measure the brightness, brightness distribution and uniformity of LED modules, lamps, lamps, displays, street brightness and other light sources.
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Product
Failure Analysis – Materials
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Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Product
Cell Isolation & Analysis
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Life's complexity originates in cells, spanning cellular structure, genetic diversity, gene expression, and complex tissue formation. Serving as the fundamental unit, cells form the foundation of all biology. Characterization of cells, their processes and interactions can provide insights into areas like medicine, symbiosis, and biological diversity. Bio-Rad supports these inquiries, offering innovative technologies for your cell biology research.
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Product
Ultra-compact, Uncooled Thermal Imaging Core
Dione 1280 CAM Series
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The Dione 1280 CAM series is based on the Dione 1280 OEM thermal imaging core with 1280 x 1024 pixels and 12 μm pixel pitch. The NETD is less than 40 mK (available upon request) or 50 mK. The maximum frame rate is 60 Hz.The camera cores are optimized for low SWaP (Size, Weight and Power). The Dione 1280 CAM is both lightweight and small. It utilizes Xenics image enhancement for advanced image processing while keeping power consumption low.Dione 1280 CAM is a LWIR uncooled thermal imaging SWAP module with housing supporting M34/M45 lens (optional).The ultra-compact Dione 1280 CAM series find application in safety and security systems, as well as in industrial thermal imaging systems.
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Product
Device Parameter Analysis
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Product
AC Line Harmonics Analyzer Including Flicker Analysis With UK, Schuko Or US Socket.
HA1600A
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Compliance quality measurements to EN61000-3-2 and EN61000-3-3Measures peak or rms voltage or current, real or apparent power, power factor, phase etc.Tabular/histogram of 40 harmonicsVoltage/current waveforms displaysContinuous analysis with real-time graphical updateWide range of power connectors available320 x 240 pixel high-contrast displayUSB, RS232 and printer interfaces fittedPC control and documentation software supplied (HA-PC-Link+)
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Product
Vibration Analysis and Balancing Tools
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PRÜFTECHNIK Condition Monitoring GmbH
Predictive maintenance tools for vibration analysis can help prevent machine failure and avoid costly production downtime. Our vibration analysis tools are used for condition monitoring on rotating equipment to help detect early component wear and damage. Vibration analysis and balancing are integral parts of any condition-based and predictive maintenance program.
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Product
Noise Analysis Software
noiseLAB
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noiseLAB is a professional software recording and analysis package for making Type 1 Precision measurements to international standards. Precision Recorder: noiseLAB makes high quality recordings of up to 8 channels of sound. Precision Analysis of: Sound Level (Fast, Slow, Impulse, Taktmak. Custom Time Constant, Leq). Statistical Values (L1, L5, L10, L50, L90, L95, L99). Octave Spectra (1/1, 1/3, 1/6, 1/12, and 1/24th octave).....
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Product
3D Image Processing Software
EyeVision
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EyeVision is the base for numerous measurement and inspection tasks in image processing. Features are: Creation of inspection programs with drag and drop function. EyeVision supports all hardware platforms such as; Smart Cameras, Vision Sensors, PC & Embedded support.
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Product
FPGA Image Processing (IP) Development Kit
ProcVision
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Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
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Product
Long Exposure Time Imaging Cooled CCD Camera
Retiga LUMO
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The Retiga LUMO CCD camera is a cooled, 6 megapixel camera that takes advantage of advanced technical features to enable detection and quantification of ultra-low light luminescence signals and for applications that require long exposure times.
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Product
Visual Analysis of any Embedded System
SystemView
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SEGGER Microcontroller GmbH & Co. KG
SEGGER is announcing the release of SystemView, a free tool enabling the visual analysis of any embedded system. SystemView gives complete insight into the behavior of a program, with minimal side effects on the observed embedded system. SystemView offers cycle accurate tracing of interrupts and task start stop as well as task activation and API calls when an RTOS is used. It visualizes and analyzes CPU load by task and interrupts and scheduler. Test setups with LED and oscilloscope are a thing of the past.
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Product
Particle Analysis for Liquids
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With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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Product
Pattern Region of Interest Analysis System
PRIAS
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PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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Product
Surface Imaging & Metrology Software
Mountains®
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Analyze multiple types of surface data. Turn your surface data into accurate, visual surface analysis reports. See every feature with high quality real-time 3D imaging of surface topography. Characterize surfaces in accordance with the latest metrology standards.
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Product
Thermal Imager with App
testo 871
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The testo 871 thermal imager combines high infrared resolution with professional measuring performance and easy handling. Its high-quality pixel detector, an integrated digital camera and, last but not least, the innovative functions are the features that impress. The testo Thermography App enables the testo 871 to offer smart thermography to meet professional requirements in industry and trade. The case supplied with the thermal imager means it can be conveniently transported, so it is always there for you when needed.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Structural Analysis Professional Software
Robot™
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Robot Structural Analysis Professional software provides engineers with advanced BIM-integrated analysis and design tools to understand the behavior of any structure type and verify code compliance.
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Product
Embedded Serial Triggering and Analysis for InfiniiVision DSOX1000 Series Oscilloscopes
DSOX1EMBD
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The IC, SPI, and UART/RS-232 serial decode option for InfiniiVision 1000 X-Series oscilloscopes (DSO models) displays responsive, time-aligned, on-screen decode of Inter-Integrated Circuit (IC), 3-wire Serial Peripheral Interface (SPI), and UART/RS232 serial communication buses. Because it is hardware-based, this option provides the fastest throughput solution for triggering on and analyzing IC, SPI and UART/RS-232 serial buses found in a wide variety of embedded designs.
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Product
Big Data Analysis Platform
Essentia
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Essentia is a highly efficient and highly scalable solution for managing, processing and analyzing vast amounts of unstructured, semi-structured and structured data stored in cloud data lakes. This can be categorized as big data and/or complex data.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Product
Arc Flash Analysis
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ETAP Arc Flash Analysis allows you to identify and analyze high risk arc flash areas in your electrical system, and it also allows simulation of several different methods used by engineers to mitigate high incident energy.
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Product
STDF Test Data Analysis Tool
DataView
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DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Product
Terahertz Imagers
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Terahertz imagers represent a groundbreaking technological innovation in the realm of imaging, utilizing terahertz radiation to visualize and explore objects and structures that are otherwise hidden from view.
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Product
AFM-Raman for Physical and Chemical Imaging
XploRA Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
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Product
Vibration Analysis Software For Squeak & Rattle Testing
MB BSR Suite
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MB BSR SUITE is the complete solution for all measurement tasks in the field of NVH, Squeak & Rattle and Sound Quality testing. Comprehensive analysis and assessment capabilities also enable the use of the BSR Suite for analysis and evaluation of functional and operating noise, vibrational effects on humans as well as the acoustic and haptic feedback of controls and actuators. Predefined test configurations for typical tasks such as multi-channel road load data acquisition, drive-file generation and objective Squeak & Rattle and Sound Quality testing allow for fast and simple operation. Signal statistics and user defined thresholds or reference-curves can be used for objective evaluation of different acoustic or haptic quality criteria. In addition the development and integration of application- or customer-specific analyses and evaluation methods is also possible at any time. Contact MB to find a solution for your measurement task!
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Product
Quantitative Optical Gas Imaging System for GF620/GFx320/GF320
FLIR QL320
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The QL320 is a quantitative optical gas imaging (QOGI) system that allows surveyors to measure the leak rates for methane and other hydrocarbons. This eliminates the need for secondary sampling with a toxic vapor analyzer or similar tool. In addition, the QL320 does not require close contact with the gas in order to measure emission rates, making it a safer solution for quantifying difficult-to-measure gas leaks.
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Product
Measuring Microscopes, Image Processing + Optics Test Equipment
Development And Production Services
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Optik Elektronik Gerätetechnik GmbH
Development and assembly of opto-mechanical building groups, including software development.
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Product
*Interferometer Fringe Analysis Software
IFA
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Optik Elektronik Gerätetechnik GmbH
IFA serves for the analysis of open interference fringes of interferograms. The system was developed as alternative of difficult and complicated solutions and is ideally suited for the employment in practice. IFA is a low-cost and easy to handle software, which includes all of the mostly used functions of data evaluation.
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Product
Imaging Photometers and Colorimeters
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Instrument Systems Optische Messtechnik GmbH
The use of imaging photometers and colorimeters for fast recording of photometric and colorimetric quantities with spatial resolution has attracted increasing interest. Compared with measuring instruments without spatial resolution, such as spectrometers, this technology offers the following advantages:
