Image Analysis
The extraction and analysis of data from images.
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Surface Analysis and Materials Characterization Services
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The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Vapor Sorption Analysis
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Vapor Sorption Analysis is a technique in which a sample is subjected to varying conditions of humidity and temperature, and the response of the sample is measured gravimetrically. Understanding the effects of water content on structure and properties is critical in the development, processing and end use of a broad spectrum of materials. TA Instruments offers the most sensitive, versatile, and productive moisture sorption analyzers on the market. The Discovery SA combines a high-sensitivity thermobalance, innovative humidity control chamber, and reliable autosampler. Innovative technology combined with our unparalleled reputation for service and support make TA Instruments the clear choice of scientists worldwide for vapor sorption studies.
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System Grounding & Earthing Analysis
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ETAP's system grounding & earthing foundation automatically detects the system earthing configuration based on source and transformer grounding or earthing type selection. The resulting earthing types are displayed both on the one line diagram and for the various connected cables.
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Structural Analysis
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With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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PCI Express Image Acquisition Frame Grabber
Xcelera-HS PX8
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The Xcelera-HS PX8 has been built within Teledyne DALSA’s Trigger-to-Image Reliability technology framework. Trigger-to-Image Reliability leverages Teledyne DALSA’s hardware and software innovations to control, monitor and correct the image acquisition process from the time that an external trigger event occurs to the moment the data is sent to the host, providing traceability when errors do occur and permitting recovery from those errors.
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Digital Image Correlation System for Complete 3D Warpage, Thermal Expansion, and Strain Analysis of Materials and Components in the Heating and Cooling Phase
Q-400 TCT
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The Q-400 TCT system is designed for complete three-dimensional and highly sensitive warpage, thermal expansion measurement and strain analysis of materials and components in the heating and cooling phase. Areas from 50 mm x 70 mm down to 2 mm x 3 mm can be investigated. Measurements can be done from room temperature up to 300°C and down to -40°C. The system is specially suited for thermal expansion measurement of electronic components and is frequently used in the development and testing of complex anisotropic materials, components, and structures in electronic applications.
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THz Pulsed Imaging and Spectroscopy
TeraPulse 4000
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TeraView’s proprietary semiconductor technology gives the TeraPulse 4000 a market leading signal-to-noise specification with over 90 dB at peak. As standard, the TeraPulse offers a bandwidth of 60 GHz up to typically 4.5 THz; with an option to extend this beyond 6 THz.
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Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Analysis Software
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The Waveform Processing Software AS-70 reads data from WAVE files and offers a wide range of functions, including graph display, level processing, frequency analysis(FFT analysis and octave band analysis), file output, and playback.
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Device Parameter Analysis
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Online Dissolved Gas Analysis
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Haomai Electric Power Automation Co.,Ltd.
The laser-based photoacoustic spectroscopy transformer oil and gas online monitoring system developed has a lot of advantages comparing with the traditional oil chromatography oil and gas online monitoring equipment and wide light source photoacoustic spectroscopy transformer oil and gas monitoring system. Please check the following figure to see the details:
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Arc Flash Analysis
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ETAP Arc Flash Analysis allows you to identify and analyze high risk arc flash areas in your electrical system, and it also allows simulation of several different methods used by engineers to mitigate high incident energy.
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Water Analysis Meters & Electrodes
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Ideal for Accurate Everyday Measurements in the Laboratory
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Image Processing Module
IMP20
Processing Module
The IMP20 video processing mezzanine card significantly increases the ease of acquiring and interpreting images from multiple sensors and cameras, thus speeding reaction time and potentially saving lives. The card adds image fusion capabilities to Abaco Systems’ ADEPT104 and AIM12 automatic video trackers, and allows the design of highly integrated, high performance graphics capabilities in any environment where the input from multiple devices needs to be combined in order to provide a complete, easy-to-interpret image.
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Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Biomolecule Analysis Tools
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In gene therapy and vaccine products, ensuring purity during downstream processing is especially challenging. Fast and efficient tracking of target biomolecules and removal of impurities is critical, because it directly affects product yield and purity. Sartorius‘ analytical chromatography column solutions can help provide this information in real-time, through at-line monitoring of large biomolecules including viruses, pDNA, and mRNA.
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Imaging
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Welcome to Thorlabs; below you will find links to our imaging systems and components. The products below are not only designed specifically for imaging applications, but they can be easily integrated into our entire line of photonics products. This makes it easy to modify or build custom imaging systems. Thorlabs’ Selection of Imaging Systems consists of our Laser Scanning Microscopy systems and OCT Imaging Systems.
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DFT Testability Analysis Software
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Landrex Technologies Co., Ltd.
DFT Testability Analysis Software
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Cross-Section Analysis Laboratory
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PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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hyperspectral imaging sensor
Hyper-Cam
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The Hyper-Cam is a lightweight and compact hyperspectral imaging sensor which uses Fourier Transform Infrared (FT-IR) technology. This advanced high-performance spectrometer allows to detect and identify substances either gases or solids from a distance of up to 5 kilometers. It provides real-time chemical imaging as well as unparalleled spatial and spectral information about the IR targets under measurement.
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Modal Analysis
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The Modal Analysis package is part of m+p Analyzer, m+p international's dynamic signal analyzer for noise & vibration measurements and analysis. It provides a complete set of tools for observing, analysing and documenting the vibrational behaviour of machines and mechanical structures. Software modules are available for classical and operational modal analysis, shaker measurements (SIMO and MIMO) as well as for ODS, SDOF and MDOF analysis. A modal model validation module is also provided.
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Profile Imaging Modules
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The Opto profile imaging modules are characterized by the U-shaped all-aluminum housing, which is only 40mm wide.
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Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
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The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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*Interferometer Fringe Analysis Software
IFA
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Optik Elektronik Gerätetechnik GmbH
IFA serves for the analysis of open interference fringes of interferograms. The system was developed as alternative of difficult and complicated solutions and is ideally suited for the employment in practice. IFA is a low-cost and easy to handle software, which includes all of the mostly used functions of data evaluation.
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Spectrum Analysis, Up To 50 GHz
S930905B
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The S930905B spectrum analysis adds high-performance microwave spectrum analysis to the N522xB/N523xB/N524xB PNA network analyzer family up to 50 GHz.
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Datalogger for IAQ Analysis
HD37AB1347
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Datalogger for indoor air quality analysis (IAQ). Measurement of airspeed, temperature, relative humidity, atmospheric pressure, CO² and CO.
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Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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LPDDR5 Protocol Debug And Analysis Solution
U4971A
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The LPDDR5 Solution Bundle provides a systemized hardware, probing, and software solution for LPDDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
