-
Product
Reflective Memory PCIE card
PCIE-5565PIORC
-
The PCIE-5565PIORC low profile PCI Express (PCIe) Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data. Writes are stored in local SDRAM and broadcast over a high speed fiber-optic data path to other Reflective Memory nodes.
-
-
Product
Memory Interface Chips
-
Providing memory bandwidth and capacity to unleash the power of multicore processors
-
Product
Reflective Memory
-
An innovative solution designed to provide highly deterministic data communications for your real time applications such as distributed simulation.
-
Product
Programmer AUTO300 Weilei Memory
-
AUTO300 is the newest programmer from weilei company. That programmer is dedicated to automotive electronics. The main advantages are : reliability, speed, and the ratio of quality to price, the software in ten languages and 3-year warranty
-
Product
SO-DIMM DDR3 Memory
-
Deliver stable memory technology with Advantech! We offer industrial grade SO-DDR3 1866/1600/1333 memory with 30μ" gold plating connector (204 pin) featuring increased power efficiency and bandwidth.
-
Product
288-Pin Dual In-Line Memory Module
SQR-UD4N
-
UDIMM DDR4 2400/2666/3200, Data Transfer Rate: 2400/2666/3200 MT/s. Capacity: 2GB/4GB/8GB/16GB, Operating Temperature: 0°C ~ 85°C, Fixed BOM / Lifetime warranty.
-
Product
Memory Burn-In Test
-
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
-
Product
Memory Test System
T5835
-
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
-
Product
Memory Testing
-
C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
-
Product
Memory Analysis Software for Logic Analyzers
B4661A
-
DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
-
Product
Programmer Memories VP-598
-
Support more than 21 637+ memories . We are official distributor of Wellon products in Poland. Our customers receive 3 years warranty and 72h support.
-
Product
Parallel Memory Test Solution
Magnum2
-
Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
-
Product
Shared Memory Network XMC Interface
XMC-SMN
-
Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
-
Product
Shared Memory Network PCI & PCIx Interface
PCI-SMN
-
Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Compatible with PCI & PCIx Host System Slots - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
-
Product
Timing, Logic & Memory
-
Offering an extensive portfolio of products for programmable clocks, clock generation and distribution, standard logic and memory (Flash, EEPROM and SRAM) across various applications.
-
Product
HD-TVI Tester, HD-CVI Tester, AHD Tester
M-IPC-300 series
-
Fuzhou Metricu Technology Co Ltd
4 inch IP camera tester
-
Product
Shared Memory Network
-
Avionics Interface Technologies
AIT's Shared Memory Network (SMN) interface modules provide host systems with an interface to a high speed (2.125 Gbps) optical data network which can be used to share data, in real-time, between multiple distributed systems.
-
Product
MXE EMI Test Receiver, 3 Hz to 44 GHz
N9038B
Receiver Tester
The Keysight N9038B is a standards-compliant MXE EMI test receiver and diagnostic signal analyzer built on an upgradeable platform. You choose the frequency coverage you need to fully test devices with outstanding accuracy and sensitivity across required ranges.
-
Product
CXL Memory
-
SQRAM launches next-gen CXL 2.0 Memory Expansion, offering high-speed, low-latency performance to meet the needs of large AI training and HPC clusters.
-
Product
Memory Burn-in Tester
B6700 Series
-
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
-
Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
-
Product
Acute 4GS/s 68 Channel Logic Analyzer With 32Gb Memory
Acute LA3068B+
-
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM*Active Probes*Logic, State, Protocol triggers
-
Product
Industrial Flash & Memory Solutions DDR4 Memory
-
SQRAM DDR4 memory modules perform at superior speeds of up to 3200 MT/s, a 20% reduction in power consumption, and higher capacity than DDR3.
-
Product
Memory Test Software
-
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
-
Product
Battery Tester
CS-3001
-
The CS-3001 test system records all block voltages, total voltage and current during a discharge test. The modular design makes it easy to connect most of all battery installations, starting from a single block and ending up with 960 block voltages. Up to four parallel strings can be tested. All measuring modules are electrically isolated (600VDC CAT III, 5000VAC test voltage).
-
Product
Installation Tester
M74
-
M74 measures Overall earth resistance, tripping time of RCDs type AC, Insulation and Continuity of earth and equipotential conductors according to the laws in force in private electric installations.
-
Product
Alternator Tester
ALTALYZER Tester
-
The Altalyzer tester is used to check the correct operation of alternators equipped with electronically controlled voltage regulators. In alternators of this type, the charging voltage is not constant, but varies depending on external factors such as: engine revolutions, number of current receivers, etc. The voltage at a given moment is determined by the motor controller by sending the appropriate information to the alternator.
-
-
Product
Speedometer/Taximeter Testers
-
Machines for checking the accuracy of speedometers, taximeters, speed limiters, speed warning devices. As with most VLT equipment, these machines can be used stand-alone, or in an integrated test lane.
