Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
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Product
Kelvin Probe Systems
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Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
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Product
MPI Fully Automatic Probe Systems
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MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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Probe Systems
Mini-PS4L
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The mini-PS4L series of probe systems are built using a similar concept as our patented Probe System for Life (PS4L) Architecture. The base system is built on a 300 mm x 300 mm metric breadboard and that allows the user to configure the system to meet the application and budget.
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Product
MPI SiPH Probe Systems
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MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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Product
MPI Manual Probe Systems
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MPI Advanced Semiconductor Test
manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150, 200 and 300mm.
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Product
MPI PCB Probe Systems
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MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Probe Systems
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These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Product
Probe System for Life
PS4L
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The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Product
Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Bridge Coordinate Measuring Machines
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Measurement results with high accuracy are particularly important for quality assurance. Bridge coordinate measuring machines from ZEISS have a precise probe system that convinces with high measuring speed. The various solutions and systems can be tailored directly to individual requirements.
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Product
Four-Point Probe
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Materials Development Corporation
Materials Development Corporation offers the complete line of Four Point Probe systems from AIT. Systems are available to measue up to 12" diameter (300 mm) wafers as well as specialty systems for Photovoltaic wafers and substrates. For more information on these systems, contact MDC.
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Product
Failure Analysis
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Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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Product
Software
DIGITIZER
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The Digitizer allows the recovery of design data of unknown assemblies by an electrical analysis with a Condor flying probe test system
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Product
Revolution CMMs
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Advanced Industrial Measurement Systems
A coordinate measuring machine (CMM) measures the geometry of certain physical objects along their X, Y, and Z axes. The CMM’s probing system scans objects at precise points to determine dimensions, angularity, size, profile, and angularity. These capabilities have many applications across different industries. In this blog post, we’ll explain the benefits of CMM technology and the types of machines we offer.
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Product
Wafer/Chip/Package Semi-automated ESD Tester
400SW
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Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
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Product
PORTABLE COORDINATE MEASURING MACHINE
CMM
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The HandyPROBE arm-free probing system generates high-accuracy measurements (accuracy of up to 22 µm), and outperforms traditional portable CMMs on the shop floor. The HandyPROBE portable CMM is currently used on the production lines of major players from the automotive, aerospace and manufacturing industries.
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Software Module for Analyzing Measured Data to any CAD Model
Verisurf Analysis
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Simplifies part inspection through the comparison of measured points, clouds, and meshes, to all CAD file formats. Check part characteristics such as position and profile quickly and easily using a variety of alignment, analysis, and reporting techniques.Analyze to CAD with imported data sets or directly from measured points, clouds, or meshes from 3D measuring devices including portable probing and scanning systems and both manual and CNC CMMs to analyze part tolerance compliance.
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Product
Relative Humidity Kelvin Probe
RHC
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The Relative Humidity Kelvin Probe (RHC) systems are the ideal solution for monitoring samples in a controlled atmosphere for contact potential difference (CPD)/work function (Φ) measurements.
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Product
Single-Point Kelvin Probe
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Our Single-Point Kelvin Probe system (KP020) is the introductory system in the KP Technology product family. The off-null signal detection method allows high-quality measurements of the Work Function/Fermi Level of materials.
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Active Probe
TETRIS®
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PMK Mess- und Kommunikationstechnik GmbH
MK presents a unique inline probing system – the TETRIS® Active Probe which can contact adjacent square pins in 2.54 mm pitch simultaneously. 1 MΩ / 0.9 pF
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Product
2.92mm to ProBus Probe Adapter
L2.92A-PBUS
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The Teledyne LeCroy LabMaster 10 Zi oscilloscope utilizes precision 2.92mm input connectors to achieve up to 36GHz of input bandwidth. But some applications may require the use of lower-bandwidth probes for performance and cost reasons.The L2.92A-PBUS adapter converts the 2.92mm interface to a ProBus interface. This brings the benefits of a wider selection of probes to the LabMaster 10 Zi from high-impedance ZS active probes to the high-bandwidth WaveLink differential probing system. Full probe power and control is provided through a built-in LEMO interface.
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Magnetic Probing Systems
MPS-C-300 and MPS-C-350
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MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Fully Manual Systems
SPS-1000, SPS-2000, and SPS-2200
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The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own.
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Environmental (Radiation) Monitoring System
Hawk® EMS
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The Hawk® EMS is a wall or tripod-mounted radiation monitoring and alarm system designed for use with the Hawk® Radius dual sensor radiation probe. Each EMS System comes with a Hawk Radius Probe. The system is extremely energy efficient and can run for weeks on an internal 9 volt back-up battery if power fails. It is well suited for operating on a small solar panel, which is an optional accessory. The Hawk® EMS features two displays that show the radiation levels measured by each of the probe’s two detectors: the weatherized “pancake-style” Geiger-Mueller tube — which measures alpha (if configured for it), beta, low energy gamma, and x-radiation — and the energy-compensated gamma tube which measures penetrating gamma dose rate. The probe can be mounted next to the EMS system or outdoors, or in adjacent rooms on cables up to 100 ft in length. Standard cable is 3 meters in length. Optional signal booster can support cable lengths longer than 100 feet. Optionally the system can also be configured to share data on ethernet or wireless networks.
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Pilot Control Software Suite
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The SemiProbe PILOT Control Software Suite semiautomatic and fully automatic probe systems employs the SemiProbe patented Adaptive Architecture. Software modules can be added to the base system as needed. PILOT Control Software consists of a Microsoft Windows-based user interface built on the SemiServer application for communicating to and from the probe system. Individual customer applications can be integrated with PILOT Control Software for a customized system to meet individual needs.
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Probe Systems
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We offer a complete line of premium performance analytical probe stations for precise device test and measurement directly on wafer.
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Supported Test Systems
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TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Product
Precise 3D Profilometry
µscan
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Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
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Product
Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
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*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
