3D X-ray
produces three dimensional images inspecting target object's surface and below.
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Product
3D Semiconductor & MEMS Process Modeling Platform
SEMulator3D
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SEMulator3D® is a semiconductor process modeling platform that offers wide ranging technology development capabilities. Based on highly efficient physics-driven voxel modeling technology, SEMulator3D has a unique ability to model complete process flows. Starting from input design data, SEMulator3D follows an integrated process flow description to create the virtual equivalent of the complex, 3D structures created in the fab.SEMulator3D process modeling and analysis is used for fast and accurate “virtual fabrication” of advanced nano-fabrication processes, allowing engineers to understand manufacturing effects early in the development process and reduce time-consuming and costly silicon learning cycles.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
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Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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Product
(X-ray and XUV) Streak Cameras
AXIS-PX
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We build streak camera systems that can achieve time resolution on the femtosecond time scale while conserving and ultra-fine spatial resolution on a very long slit length.
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X5 Spacesaver X-Ray Inspection
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Designed to be integrated into line with optional free standing reject, Available in 300mm and 500mm belt width models, the X5 SpaceSaver is perfect for packed products with a width of up to 250mm.
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Product
3D Solder Paste Inspection Machine (3D-SPI)
3Si Series
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Saki's 3D SPI identifies critical defects and assists with process improvement.
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Product
Industrial CT X-Ray Inspection System
X25
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The X25 is quite possibly the most conveniently sized industrial CT system on the market. The system offers all of the same features as the larger systems while still maintaining the ability to fit through a standard interior door. The X25 is well suited for small to medium sized objects.
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Product
3D Sensor (Shiny Surfaces)
reflectCONTROL
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reflectCONTROL is designed specifically to meet the high quality requirements that ensure high quality for shiny surfaces. The system based on deflectometry projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software.
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Product
Refurbished And Demo X-ray Inspection Systems
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Our 2024 collection of refurbished and demo X-ray inspection systems offers high-quality performance at an affordable price. These precision X-ray inspection systems provide exceptional value without compromising on quality.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
3D Cameras
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*Visual assessment of distance, level or volume*Time-of-flight measurement principle*Illumination, measurement and evaluation in one unit*Output of distance and grey values*Integration by means of intuitive parameter setting software
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Product
Solid Optical 3D Measurement Instrument
IF-SensorR25
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The IF-Sensor25 is a solid optical 3D measurement instrument for automated form and roughness measurement in production. The sensor is integrated into a production line and delivers you high resolution, repeatable and traceable results when measuring surface characteristics in the m or sub-m range. This resolution can hardly be achieved by conventional 2D solutions or tactile techniques.
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Product
Precise 3D Profilometry
µscan
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Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
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Product
Full 3D Inline Metrological & Imaging AOI
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Metrological Full 3D AOI is achieved by measuring all 3 dimensions (X, Y and Height) to detect every measurable solder and component defect pre-reflow and/or post reflow soldering.
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Product
Handheld X-Ray Backscatter Imaging System
Nighthawk™
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Nighthawk Handheld X-Ray Backscatter Imaging System sees what is invisible to the human eye, detecting concealed contraband, weapons, narcotics and explosives in luggage, barrels, vehicles, upholstery, and many other applications.
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Product
X-ray Diffraction and Elemental Analysis
D2 PHASER
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The D2 PHASER is the most compact and fastest, all-in-one crystalline phase analysis tool available on the market. It is mobile and easy to install with only the need for standard electrical power. The D2 PHASER is therefore ideal for laboratory or on-location operation, in other words, it is a true Plug'n Analyze system.
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Product
X5 Pack X-Ray Inspection
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Designed to be integrated into line with built-in automatic reject and available in 300, 500 and 600 mm belt width models, the X5 Pack is perfect for a variety of unpackaged and packaged products.
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Product
Omniblock Integrated X-Ray Systems
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Omniblock® X-ray generators from Excelitas Technologies integrate the high-voltage source and X-ray tube into one consolidated housing. This design configuration eliminates the high-voltage cables and connectors reducing cost while improving system design flexibility and streamlining integration. They are specifically designed for generating X-rays in static or rotating applications using proven designs of up to 180 kV and 2.4 kW. Typical applications for Omniblock X-ray generators include baggage screening, medical imaging, food inspection, industrial analysis and many other cost-sensitive and space-constrained X-ray applications.
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Product
Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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X-RAY Cameras Based On CCD
XiRAY
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*High resolution direct phosphor imaging, ideal for Micro CT*Ultra-low readout noise with CCD and especially the new sCMOS sensors*Crystal clear 14 bit/pixel images*Partial readout and binning modes for enhanced sensitivity and higher speed*Non-linearity over full dynamic range <2% (of full scale) to 95% of full scale*External triggering, LVTTL*Low power consumption 6 Watt with Cooling or 2W without*Antiblooming, Enhanced Statistical Extra-Mural Absorption*Radiation hardened, Support of Energy levels 7 to 100keV*Measures just 63 x 63 x 46 mm*Peltier TE Cooled with Heatsink and optional fan
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Product
A Compact X-ray Inspection System, The MedaScope™ Desktop
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A compact X-ray machine weighing only 55 pounds, the MedaScope Desktop is easy to carry and can be set up rapidly. Glenbrook’s MedaScope Desktop is a portable, compact manual system for real-time, magnified x-ray screening of packaged devices including medical devices, electronics, and cables.
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Product
3D Scanners
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The process of analyzing a real-world object or environment to collect three dimensional data of its shape and possibly its appearance (e.g. color).
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Product
contact/non-contact portable 3D measurement system
ScanArm
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The FARO ScanArm combines all of the advantages of the FaroArm with a hand held laser scanner and is the perfect contact/non-contact measurement system. Unlike other scanning systems, the ScanArm’s hard probe and the Laser Line Probe can digitize interchangeably without having to remove either component. Users can accurately measure prismatic features with the hard probe, then laser scan sections requiring larger volumes of data — all in one simple tool.
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Product
Ultra High Performance 3D CT System
UltraTom
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3D micro-tomography (CT Scan) and nano-tomography. Modular system with multiple imagers and x-ray generators. Experimentations possible in-situ. Large volume Inspection and manipulation volume.
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Product
X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-60
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HORIBA introduces the new standard of transportable sulfur-in-oil analyzers, the SLFA-60. This instrument introduces new software and hardware features to meet the growing changes in the petroleum industry. The instrument has expanded storage of calibration curves and data can be exported using USB output. The measurement range has increased to 0-9.9999 wt% to cover high sulfur crudes and shale oil markets.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
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Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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Product
3D Inspection Service
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The reference data may come in the form of a table, with values at specific points or features, a cad model, or 3d scan. 3D inspection services may require datum measurements, where the part to be inspected is located in a fixture that is specifically designed to orient the part by an ordered method. In some cases, the part may have features that are designed specifically to be referenced by datums, if no functional feature of the part provides a clear reference.
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Simple 3D Measurement & Inspection
XG-X Series Vision System
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Abundant processing power is available even with multiple camera connections, including the 21 megapixel color camera, line scan cameras, or 3D cameras. XG-X Series offers high-speed, high-resolution cameras for high-accuracy inspection, providing powerful solutions for a variety of problems that arise in manufacturing.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
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Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
