Gate
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Product
Small InGaAs Camera For Short Exposures
Bobcat Gated Series
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The Bobcat 320 Gated series is based on an in-house developed, temperature stabilised InGaAs detector with a 320 x 256 pixel resolution. The Bobcat 320 Gated cameras are able to provide maximum frame rates up to 400 Hz. The exposure time of the sensor is configurable from 100 ns up to 1 ms in steps of 100 ns, or from 1 ms to 40 ms.
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Product
Multi Functional VME Logic Module
MDGG-8
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The MDGG-8 is a single wide 6U VME multi functional FPGA based delay logic and timing module which provides often needed functions as gate, delay & pulse generator, logic fan in – fan out, coincidence register and scaler / pre-scaler.
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Product
FieldFox Handheld Microwave Spectrum Analyzer, 9 GHz
N9935A
Spectrum Analyzer
100 kHz to 9 GHz frequency range Expand capabilities with optional tracking generator, interference analyzer, built-in power meter, and more Make accurate spectrum analyzer measurements ( 0.5 dB) without needing warm-up Locate interfering signals using the intuitive spectrogram display and recording capability Easily measure average and pulse power with a USB power sensor, pulse measurements with time gating Lightest microwave handheld spectrum analyzer at only 6.6 lb. (3.0 kg)
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Product
Netlist Analyzer
GateVision
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GateVision PRO is the third generation of graphical netlist analyzers from Concept Engineering. Completely rewritten to run on modern 32/64bit platforms, GateVision PRO provides the designer of even the largest chips with intuitive design navigation, schematic viewing, logic cone extraction and interactive logic cone viewing for debug support and design documentation.
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Product
test measurement unit
ITC59100 Rg/Qg
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The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
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Product
Inductive Sensors
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Inductive sensor designed to detect shaft speed, shaft position, gate position, or object presenceTotally sealed constructionMulti-voltage 24 - 240 VAC/VDCDetects ferrous targets up to 5/16" (8 mm)IP 65 Protection
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Product
Precision Low Power FGA™ Voltage References
ISL60002
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The ISL60002 FGA™ voltage references are very high precision analog voltage references fabricated on Renesas' proprietary Floating Gate Analog technology and feature low supply voltage operation at ultra-low 350nA operating current. Additionally, the ISL60002 family features guaranteed initial accuracy as low as ±1.0mV and 20ppm/°C temperature coefficient. The initial accuracy and temperature stability performance of the ISL60002 family, plus the low supply voltage and 350nA power consumption, eliminates the need to compromise thermal stability for reduced power consumption making it an ideal companion to high resolution, low power data conversion systems.
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Product
Universal Test Fixture
CAM/GATE
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The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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Product
CAM/GATE Test Kits
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The Camgate ™ series test fixtures provide ‘Z’ axis motion and, with the optional floating top plate, makes this series ideal for top side probing. The floating push plate is accurately registered with two tooling/guide pins. The top plate mounting frame is adjustable in .500″ (12.7mm) increments to accommodate top side probing in the lower position, or clearance for PCA’s with tall components in the middle or top position, without the need for riser blocks. Camgate fixtures are available with the most widely used interfaces in the test industry.
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Product
Firmware
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Field-Programmable Gate Arrays (FPGAs) are an ideal fit for data acquisition systems as they offer unparalleled real-time signal processing power. Moving functionality from the host PC to the on-board FPGAs helps offload the PCs central processing unit (CPU) and relaxes data transfer rate requirements. This capability is key in achieving the performance levels needed in many of today's leading-edge applications.All our data acquisition and generation modules host Xilinx FPGAs and are delivered with pre-installed general data acquisition firmware (for ADQ7 and ADQ14 we refer to this firmware as "FWDAQ"). In addition to the standard/default firmware, we also offer optional firmware development kits (available for all models) and application-specific firmware packages (available for ADQ7 and ADQ14 only). More information about these below.
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Product
Isolated Gate Drivers
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Analog Devices’ isolated gate driver portfolio offers designers performance and reliability advantages over designs utilizing optocouplers or pulse transformers. Utilizing ADI’s proven iCoupler® technology, the isolated gate driver family offers the advantage of a maximum propagation delay of 50 ns, less than 5 ns channel-to-channel matching, a 50-year lifetime for 400 V rms working voltage and galvanic isolation in a single package.
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Product
HiCAM
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The HiCAM is a gated intensified high-speed high-sensitivity imaging camera. It has an integrated fiber-optically coupled image intensifier, which offers a unique combination of high speed and sensitivity down to single photon level. Because the HiCAM does not need high intensity light sources, it is suitable for use in low-light level conditions.
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Product
ESI(Electronics Systems Integration Unit)
MS 2004
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The ESI subsystem provides platform interfaces like Gyro and on board Radar Blanking. This unit receives Analog and Digital GYRO inputs from ship and pre- trigger pulses from on board radars of the ship. This unit measures and provides the ship heading data to VARUNA ESM system. It also provides Heading, Roll and Pitch data to the ECM system. This unit also generates band wise composite ESM Rx. Blanking gates and provides all the required interfaces to ESM receiver, ECM System and System Controller units.
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Product
ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
CoreCommander
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While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).
