Source Debugers
See Also: Debuggers, In-Circuit Debuggers, Code Debuggers, JTAG Debuggers, Debugging
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Product
Debug Hardware
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To record your digital and analog signals, just press start. You can fill your entire computer’s memory with data so it is easy to capture lengthy or rare events.
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Product
Precision Source / Measure Unit, 1 CH, 1 PA Resolution, 21 V, 1.5 A
B2901BL
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The Keysight B2901BL precision source / measure unit (SMU) is a 1-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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Product
Precision Source / Measure Unit, 1-Channel, 10 FA Resolution, 210 V, 3 A DC / 10.5 A Pulse
B2911B
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The Keysight B2911B precision source / measure unit (SMU) is a 1-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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Product
Precision Source / Measure Unit (2 Ch, 100 FA)
B2902B
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The Keysight B2902B precision source / measure unit (SMU) is a 2-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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Product
High-Density Precision SMU (100 PA, 30 V)
PZ2130A
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The Keysight PZ2130A is a high-channel density precision source / measure unit (SMU) with 5 channels per module that saves space at a low cost per channel for a wide range of applications requiring numerous precision power supplies. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2130A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2130A suitable for noise sensitive applications such as quantum computing as well.
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Product
4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A Or ±6 V, ±3 A, 20 W
N6784A
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The Keysight N6784A is a source/measure unit (SMU) designed for general-purpose precision sourcing and measurement. General-purpose applications can span many different industries and many different devices under test (DUTs). The N6784A SMU is a versatile tool designed to tackle many of these general-purpose applications. Its glitch-free operation ensures safe usage with the DUT during output and measurement range changes, even with capacitances of up to 150 µF. Its 4-quadrant operation enables it to act as a bipolar power supply or a bipolar electronic load, for added versatility. When using the N6784A SMU, engineers can be confident that they have an all-around general-purpose tool for their test systems or lab bench.
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Product
Debugging Environment
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Only designers who make no mistakes can avoid debugging. The question is, how fast can you debug? That depends largely on how clearly the issues identified by your tools are presented. A good debugging environment can save hours of frustration and tedium.
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Product
Debug Probes
J-Link and J-Trace
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SEGGER Microcontroller GmbH & Co. KG
SEGGER J-Links are the most widely used line of debug probes available today. They've been proven for more than 10 years with over 250,000 units sold, including OEM versions and on-board solutions. This popularity stems from the unparalleled performance, extensive feature set, large number of supported CPUs, and compatibility with all popular development environments.
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Product
PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-01
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PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
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PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Tunable Laser Source, High Power And Lowest SSE, Top Line
N7776C
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The new Keysight N7776C top line tunable laser source is designed to reach best-in-class accuracy in static and swept operation for outstanding test efficiency. Two-way sweeps up to 200 nm/s speed with sub-picometer repeatability and without impacting the specified dynamic accuracy accelerate wavelength-dependent alignment processes and the automated calibration of wavelength-selective devices. Shorter time to testing and faster swept-wavelength tests help reduce test cost per device, improve test margins and lower the cost of ownership.
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Product
JTAG Debug Probe for Cortex-M
J-Trace PRO
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SEGGER Microcontroller GmbH & Co. KG
J-Trace PRO for Cortex-M is setting a new standard for trace probes. It enables continuous streaming trace via its Gigabit Ethernet interface, lifting the limitations by internal buffers and slow data transmission.J-Trace PRO can capture omplete traces over long periods - thereby enabling the recording of infrequent, hard-to-reproduce bugs. This is particularly helpful when the program flow 'runs off the rails' and stops in a fault state. It also supports extended trace features, such as code coverage (so engineers have visibility of which parts of the application code have been executed) and execution profiling (providing visibility as to which instructions have been executed and how often - so hotspots can be addressed and optimization opportunities identified).
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Product
In-Line Debug Press
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Use for DEBUG without having an In-Line TesterUse Standard 3070 Test System for DebugSupport In-Line Tester on current 3070Verify Form and FitSlides in and Out like on an actual In-Line System
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Product
Source Measure Units
NGU
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Thanks to their extremely high accuracy and fast load recovery time, the R&S®NGU source measure units (SMU) are perfect for challenging applications. A special ammeter design is used to precisely measure current drains from nA to A in one pass – no need to make multiple measurement sweeps. The instruments’ short recovery times enable them to handle fast load changes that occur, for example, when mobile communications devices switch from sleep mode to transmit mode. With high speed data acquisition, every detail is detected down to 2 μs resolution.
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Product
Multipurpose Debug Board
DB40 Debug Module
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The DB40 Debug Card is designed for debugging of COM Express and PC/104 boards. It includes the following features: - Port 80/81 decoding for Power On Self Test (POST) via LPC - Interface to SPI Flash for BIOS update - Interface to Board Management Controller (BMC) for update - Power and Reset buttons and status LEDs The DB40 Debug card can only be used on products that have the appropriate FFC debug connector designed for this purpose. (Includes DB40 Debug Module, two 40-pin FFC cables, and 14-pin cable for SP100 DediProg USB to SPI programmer.)
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Product
Multipurpose Debug Board
DB40-HPC Debug Module
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The DB40-HPC Debug Card is designed for debugging of COM-HPC modules with FFC (FlexFoil Cable) debug connector. It includes an 80 port for Power on and Self-test (POST) via I2C interface, interface to SPI Flash for BIOS update, interface to EC for Embedded Controller (EC) update, Power and Reset buttons, and Status LEDs and Test Point for various debug tests.
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Product
DDR5 Protocol Debug And Analysis Solution
U4970A
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The DDR5 solution bundle provides a systemized hardware, probing, and software solution for DDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Product
Hardware Debug Interface & Stand Alone Programmer
Cyclone PRO
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P&E Microcomputer Systems' Cyclone PRO is an extremely flexible tool designed for in-circuit flash programming, debugging, and testing of Freescale HC08, HCS08, HC12, HC(S)12(X), and RS08 microcontrollers. Now featuring support for Freescale's ColdFire V1.
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Product
Light Source
LS-HA
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provides the stable and smooth wide-band spectral output. It’s proper for most visible to near infrared range measurement. This light source is also designed to be used in the standard measurement package. It ‘s a simple and quick measurement platform.
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Product
Point Source
JF Series
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The JF Series contains EAW’s high-output, two-way systems intended for mobile production or permanent installation.
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Product
PXI Source Measure Unit
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PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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Product
Light Source
UVM-SP-JW
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Readouts of UV intensity and cumulative luminescence count are prompted either on the front panel or via the externally connected remote signal control. The UV intensity detection segment is intended to measure a specific intensity of light signals, while the cumulative luminescence count is designed to tally a cumulative count on all UV intensities measured, in conjunction with real-time calibration.
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Product
Mainframe Debugging and Analysis
Xpediter
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Xpediter is Compuware's mainframe application interactive debugging and code coverage solution. When an application experiences a problem, developers need to get into an interactive test session to solve the issue. However, complex setup procedures make this a time-consuming step and delay the resolution process.Compuware's mainframe debugging and analysis tool Xpediter enables developers to get into an interactive test session with minimal effort and quickly move applications into production with greater confidence.
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Product
Electron Sources
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SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Product
Light Source
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A light source essentially is an optical transmitter that is paired with an optical receiver, both of which are connected to electrically based devices or systems. So, the source converts electrons to photons and the detector converts photons to electrons.
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Product
Noise Sources
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The Keysight 346, 347 and SNS Series of noise sources work in conjunction with the NFA Series noise-figure analyzers to make noise-figure measurements from 10 MHz to 50 GHz.
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Product
Laser Source
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Is an Amplified Spontaneous Emission (ASE) based broadband light source, designed for general laboratory applications. It is a reliable and cost-effective unit that can be ordered with multi channel options. The LD operating temperature and drive current are precisely monitored by a micro-controller to ensure constant output power and emission wavelength stability. With compact size configuration, it’s also suitable for OEM integration, User can control the ASE source output power level by adjusting the drive current along with remote status monitoring, contact Optilab for more information.
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Product
On-Chip Debugging Emulator
E2 Emulator
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The new E2 emulator is an advanced on-chip debugging emulator and flash programmer developed based on a concept of "improvement of development efficiency". The download speed is up to twice as fast as the E1 emulator. Moreover, new solutions contributing to reduction in development time will be available.
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