Measuring Microscopes
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Product
Test & Measurement
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NIF (Dutch Instrument Factory, later Nieaf-Smitt) started in 1900 as one of the first organizations in the world with the design and production of instruments for electrical values. The portfolio of test tools, digital multimeters, current clamps, device testers, installation testers and power analyzers is characterized by quality and reliability.
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Personal Safety EMF Measuring Equipment
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EME (electromagnetic energy) RF Exposimeter / Personal monitors, worn on the person. The devices monitor the electromagnetic fields and warn of excessive field strengths, e.g. when working on industrial equipment, broadcasting or mobile phone stations, radar installations or other sources of electromagnetic radiation.
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Product
Filaments for Measures
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Japan Electronic Materials Corp.
The field of filaments for measuring instruments is where our boasting processing technology of tungsten and other thin wires powerfully plays a major role.
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Product
Current To Pressure Measurement Trainer
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Unitech Scales And Measurements Pvt. Ltd
Current to Pressure Trainer. This setup comprises of a I to P converter fitted on a base. Two pressure gauges are fitted one at the input side and the other at the output of the I to P converter. A current source with digital display is provided to excite the I to P converter. A constant air supply should be provided to the system at 20 PsI Pressure from a standard compressor.
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Distance Measurements
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Sensors for detecting distances and distance information from the µm range to 60 m.
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Product
Measuring Light Curtains
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Leuze electronic GmbH + Co. KG
These devices are perfect for measuring moving objects as they pass by. The measurement results can be output via the fully integrated interface. At the same time, the programmable switching outputs allow downstream elements to be manipulated. Likewise, multiple light curtains can be cascaded. The nearly unlimited possibilities for configuring multiple measurement areas and evaluation functions make the devices problem solvers for a variety of measurement tasks. The range of available resolutions and measurement field lengths ensures optimum adaptation to your application.
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On-board Emissions Measurement System
OBS-ONE PN Unit
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The OBS-ONE PN unit is an on-board emissions measurement system for analyzing the solid particle number concentration within the specified particle size range under real-world driving conditions. The unit uses a condensation particle counter which is recommended principle by the Particle Measurement Programme (PMP), one of working groups affiliated with UNECE.The PN unit combines with the GAS unit to measure the specified exhaust gas components, along with the exhaust gas flow rate, the GPS position, and the atmospheric conditions (temperature, humidity, pressure).
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Microwave Measurements & VNA Calibrations
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Rosenberger Hochfrequenztechnik GmbH & Co. KG
For microwave measurements and VNA calibrations, Rosenberger develops, manufactures, and provides test & measurement products which meet the highest demands of industrial test applications. These include high-performance VNA test cableswith outstanding phase and amplitude stability, a variety of test port adaptors for VNA applications up to 110 GHz, very robust interchangeable high mating cycle port connector systems, and test devices – from low-frequency devices for simple measurements to components permitting high-precision broadband measurements.
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Total Flux Measurement Systems
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LED’s and Luminaires must be characterized and tested for brightness and color, for production quality control and also for R&D. The Gamma Scientific Total Flux Measurement System combines our accurate Radoma Spectrometer and an integrating sphere for total flux (total power) and color measurements of LED, micro LED and Luminaires. Measurement parameters include spectrum, lumens, total power, peak and dominant wavelength, CRI, CCT, FWHM and other optical properties.
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Product
Metallurgical Microscope
BXJ900 Series
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Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
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Product
Stress Hysteresis Measurement
500 Series
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Stress Hysteresis Measurement up to 500C for thermal property and stability tests of thin films in air.Non-Contact Laser Scanning Technology.
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Product
Coordinate Measuring Machines
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Galaxy series of single and duplex horizontal arm coordinate measuring machines offered as manual or CNC models. Automotive styling studio 5 axis clay model milling machines.
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Product
Combo Measuring Receiver/ TV Analyzer
VAROS 106
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High accuracy, an easy handling as well as the modularand rugged construction will support the technician onsite in his tasks: perfect troubleshooting in all distribution networks with FM, return channel, DAB/DAB +, DVB-T2, cable TV, WiFi or SAT – the VAROS 106 covers all ranages reliably. By any means a real allrounder.
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Product
Infrasound Measurements
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Is sound that is lower in frequency than 20 Hz (hertz) or cycles per second, the "normal" limit of human hearing. Hearing becomes gradually less sensitive as frequency decreases, so for humans to perceive infrasound, the sound pressure must be sufficiently high. The ear is the primary organ for sensing infrasound, but at higher intensities it is possible to feel infrasound vibrations in various parts of the body.
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Product
MTF Measurement Station
ImageMaster PRO 10
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As a result of various improvements the ImageMaster® PRO 10 enables customers to significantally increase their yield. It is the fastest and most accurate MTF measurement system on the market for qualifying mobile phone lenses and other miniature lenses. Besides the new software architecture and functions, the more precise mechanical components lead to best performance in accuracy, reliability and measurement speed. Faster MTF algorithms reduce the test cycle time so that an outstanding throughput is achieved. The ImageMaster® PRO 10 features a 15% increased productivity compared to the ImageMaster® PRO 9.The new ImageMaster® PRO 10 also provides additional measurement functions. For example, measurements at different frequencies and RGB measurements can be performed to determine chromatic aberration. An upgrade of four additional cameras allows the measurement of relative illumination for testing the homogeneous illumination of lenses in the field.
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Product
Image Resolved Luminance Measuring Camera
LMK 6
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TechnoTeam Bildverarbeitung GmbH
The LMK 6 is TechnoTeam's luminance measurement camera and used in many ways as a standalone measuring device. It is designed to be compact and lightweight and can be used in almost any light measurement application. As it is one of TechnoTeam's core products it is also used in our other camera based measurement systems.
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Ultrafast Laser Pulse Measurement System
FROG Scan Ultra
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With a slightly larger format than our high value FROG Scan system, our FROG Scan Ultra platform allows any Ocean Optics spectrometer to be used (including the QE65000 and InGaAs models). This means higher resolution and the availability of InGaAs detectors for your ultrafast laser system. It can measure pulses from nearly 4 ms (custom systems only) to as short as 450 nm.
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Product
Real-time S-Parameter And Power Measurement Uncertainty
S93015B
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The S93015B provides real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on the same screen. It enables the users to estimate more reliable uncertainty and apply more realistic limit lines for pass/fail tests for better production yield rates.
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Product
Spectral Response (Spectral Sensitivity) Measurement
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It is used to measure the spectral response (spectral sensitivity) of photoelectric conversion devices (photodetectors / sensors) such as silicon photodiodes and CCD · CMOS image sensors . Measurement in the broadband wavelength region can be performed with low stray light.
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Product
PNA-X Measurement Receiver for Antenna Test
N5264B
Receiver
A new industry standard for antenna test with 400,000 point per second data acquisition on all five measurement channels Twice as many receivers available compared to any other antenna receiver on the market Replace existing 8530A and 8360 solutions for a system speed improvement that is 10 times faster Built-in 8510/8530A code emulation software provides a drop-in replacement for existing antenna ranges utilizing an 8530A
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Intrinsically Safe Measuring Tool
A2109/LSR
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The A2109/LSR is an ideal measurment tool for fast and accurate laser measuments at rotating parts. With the revolutionary form factor it increases your speed during measurements.
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Multi-functional High-speed I-V Measurement System
“Rakit”
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Rakit is a maintenance device to measure current and voltage characteristics string by string, to grasp solar system characteristics, abnormal data, etc. The device comprising of I-V tracer, pyranometer, thermocouple, data logger, and "I-V data analyzer," the multi-functional analyzing software, provides accurate analysis report quickly. The I-V data analyzer is compatible with the following I-V tracers:
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Soil Respiration Measurement
SRS-SD 1000
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Truly portable soil respiration system that offers researchers superior performance for a variety of applications including spatial distribution studies.
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Product
Ultraviolet Microscope
UVM-1
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The UVM-1™ is a UV microscope that also can image in the visible and NIR. This UV-visible-NIR microscope embodies both advanced optics for cutting edge UV, color and NIR imaging and visualization. The system is a flexible design, very easy to use and very durable. It is designed with cutting edge CRAIC optics for the highest image quality and to give years of service.
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Product
Microscope Platforms
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Tactile Measuring Devices
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You want precise results easily, quickly and flexibly? We have the right tool for you with our tactile measuring devices. Benefit from the broadest probe portfolio on the market and get efficient software solutions for data transmission, data evaluation and data export with the Tactile Suite® and the Fischer DataCenter. Whether coating thickness measurement or materials testing: Discover the right solution for your application and your industry.
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Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Vibration Measuring System
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here are several parameters to express about vibration.For conventional vibrometers, repetitive measurements at each point switching parameters is necessary.However,for CardVibro Air2 equipped with a simultaneous measurement function, measurements of Displacement, Velocity, Acceleration and furthermore Envelope for bearing condition diagnosis is possible by just pressing a start key at the same time.
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Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Product
OPV/DSC/Perovskite IV measurement System
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King Design Industrial Co., Ltd.
The system can measurement the 3rd generation of solar cell IV performance. The system patent with eliminate capacity effect that can ensure the test repeatability coincidence.
