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Product
Metrology
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KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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Product
Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
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The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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Product
Jerking Tester
JLD-10
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Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.3-2008/IEC60851-3; Inspection standard:JB/T4279.5-2008Used to measure the film adhesion property of enameled round wires with nominal conductor diameter of 1.000mm and below;Built-in small ultra-quiet air compressor would provide power supply and automatic constant pressure;Samples, while being jerked, would not move and slip out;
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Product
Protective Inspection Kit for Hazardous Areas
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The kit provides all the tools required for the on-site inspection of a coating, including surface profile, dewpoint, relative humidity, both wet and dry film thickness and also adhesive testing.Measurement parameters include:Surface inspectionSurface profileSurface contaminationClimatic conditionsCoating thicknessAdhesion
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Product
Water Vapor Transmission Rate WVTR Tester
WPT Series
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Water Vapor Permeability Tester is based on the Gravimetric method and is applicable to the water vapour transmission rate (WVTR) test of plastic films, composite films, sheets and other materials.
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Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
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The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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Product
Variable Attenuator
VAXE
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The VAXE Variable Attenuators are waveguide components for tunable signal leveling or reflection compensation in waveguide networks. The Attenuators consist of waveguide section with a resistive film evaporated on the mica surface. The Attenuators has 0 ÷30 dB minimum attenuation range. The VAXE Attenuators are available in four waveguide bands between 33 GHz and 170 GHz.
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Product
Falling Dart Impact Tester
FDI-01
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Jinan Leading Instruments Co., Ltd.
FDI-01 Falling Dart Impact Testeris applicable in the impact result and energy measurement of the falling dartfrom a certain height against plastic films and sheets with a thickness less than1mm, whichwould result in 50% tested specimen failure.
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Product
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
UVISEL
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The UVISEL Spectroscopic Phase Modulated Ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties. It features rapid measurement capability with data acquired every 50 ms for powerful control of thin film uniformity across the entire web.The design of the UVISEL ellipsometric heads allows simple integration into roll-to-roll systems, while the software provides advanced communication capabilities suited to roll-to-roll production.
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Water Vapor Permeability Tester
WPT-304
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WPT-304 Water Vapor Permeability Tester is manufactured based on the gravimetric method and is applicable to test the water vapor transmission rate of plastic films, composite films, sheets, and other materials used in packaging, medical and constructive industry.
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Product
Coating Thickness Meters
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PCE Instruments' accurate, affordable coating thickness gauge, thickness meter, surface testing and film gauge devices are used for material testing, manufacturing quality control and automotive paint inspection applications. Choose from a variety of coating thickness gauge, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum.
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Product
1550/1310~1490nm Wavelength Division Multiplexer
PON-WDM-1543
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Hangzhou Huatai Optic Tech. Co., Ltd.
PON-WDM-1543 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
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Product
Reticle Manufacturing
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An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Product
ADT-01 Primary Adhesive Tester
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Jinan Leading Instruments Co., Ltd.
ADT-01 Primary Adhesive Tester is applicable in primary adhesive tests of pressure sensitive adhesive tapes, adhesive bandage (plaster), label, protective films and other products.
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Product
Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
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Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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XPS/ESCA Service
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X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Product
Fixed Attenuator Pads
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SemiGen RF/microwave fixed attenuator pads feature precise resistor films and superior metalization resulting in superior performance and consistency. Our advanced thin-film technology allows our parts to have full side wraps for SMT installation and a complete grounding backside for ease in attachment, as no ground bonding is requried. Top side contacts for the input and output make these ideal for standard RF/microwave assembly techniques. They are available as MIL PRF 38534 “H” & “K” space screened units. Custom values are easy to fabricate and design allowing users to design in a specific value of choice.
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Piezo Sensors
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TE Connectivity (TE) piezoelectric sensors provide durable vibration, accelerometer, or dynamic switch elements for a wide range of markets and applications. Piezo sensors and transducers are available in various forms including film, cable, and miniature elements in standard and customized packages.
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Product
Low Voltage Holiday Detector
M1-AC
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For use such as: Coatings, in-plant environments, rebar, pipelines, sheet materials coated with thin film under 20milsa,
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Thin Film Composition and Thickness Monitor
P-1000
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The Precision P-1000 readily analyzes compound thin films utilized in semiconductor, superconductor, magnetic and applications.
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Product
Custom Sensing And Imaging Solutions
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Micro Magnetics has a proven track record of excellence in designing and developing new products and solutions based on our knowledge of magnetic devices and materials. We offer specialized solutions to meet our customers? unique needs. These solutions include single magnetic sensors, sensor arrays, custom electronics and packaging solutions, sensor processing (polishing, dicing, and lapping), and custom film and device deposition.
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Product
Novo-Haze TX Transmission Hazemeter
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Fast and accurate measurement of the optical quality of plastic films and other transparent materials.This instrument measures total transmission and haze according to ASTM D1003 (CIE C), the most important standard used in most QA applications.Manufactured in direct response to industry requirements, the Novo-Haze TX is offered at huge savings compared to other instruments which contain additional superfluous test methods.The instrument features an intuitive user friendly interface which minimises the test time and makes it an ideal choice for both QC and R&D.Uncompromising design, high quality materials and European manufacture make the Novo-Haze TX the ideal choice for any laboratory or QA environment.
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Product
Programmable Step Attenuator, DC to 26.5 GHz, 90 dB, 10 dB steps
84906K
Attenuator
The Keysight 84906K programmable step attenuator offers coaxial measurements to 26.5 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life (greater than 5 million switching cycles per section) and an attenuation range of 0 to 90 dB in 10-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with less than 2 dB of loss at 26.5 GHz. The compact size of the unit, 35 percent smaller than the Keysight 8495/7 (26.5 GHz) family, allows for easy integration into instruments and ATE systems.
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Product
Spectroradiometer
SpectraScan® PR-745
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The SpectraScan® Spectroradiometer PR-745 is JADAK’s enhanced sensitivity portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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Product
Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
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*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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Product
Resistors
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SemiGen builds high power tantalum nitride resistor chips to customer specifications. We can manufacture chip resistors using a variety of substrates in various thicknesses to meet your specific needs. Resistors can be produced with element features under 0.002 inch for high density or high value resistor applications. Low noise stable TCR and chip sizes under 0.010 inch x 0.020 inch are routinely processed in production quantities. SemiGen’s series of Thin Film Resistors offer proven stability, low noise, and excellent TCR of both Tantalum Nitride (TaN) and Nichrome (NiC) resistive films. From our standard product offering, to custom requirements, this series of resistors is offered in a large selection of chip size, resistance values, and tolerances.
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Customized Ellipsometers
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~0.1 nm thickness difference can be seen by IE-1000.Thickness distribution of thin film can be imaged.Thickness and optical images of semiconductor device, display, and bio samples.IE-1000 can show the images which can not be seen by conventional microscope.Defect of semiconductor and display can be seen directly.Easy and fast operation.
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Product
In Situ Diagnostics
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For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
