Correlators
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Product
Custom Bench Test
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TestEdge provides customized bench test. If your device has specialized test requirements, it may be necessary to test your device using specialized bench equipment rather than traditional ATE. In other situations, both ATE and a custom bench setup may be required to fully characterize the device and provide necessary correlation. Finally, it may be useful to create a custom bench setup to facilitate device debug.
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Product
Dual Port Simulator Fiber Channel XMC Module
XMC-FC4 Simulyzer
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*Two independent fiber channel ports*The two SFPs accept electrical as well as optical transceivers*Each port supports 1, 2, or 4 Gbps*Supports customer-specific defined transmission speed*Comprehensive decoding of FC-1, FC-2 and Upper Layer Protocol (ULP) frames*Triggering and filtering*Supports DMA for high-speed streaming*IRIG-B time code encoder / decoder for data correlation*Supports ULPs such as FC-AE-ASM, FC-AE-RDMA, FC-AE-1553 and FC-AV*Supports HS-1760E applications such as AS5653, AS5652 and AS5627*Optional fcXplorer, Windows-based FC simulation and analysis test software*FC SDK (Software Development Kit) provides drivers and APIs for Windows XP / 7,*Linux, VxWorks, QNX Neutrino RTOS and others on request
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
ARINC 429 PMC Interface Module
PMC-429
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Avionics Interface Technologies
4, 8, 16, or 32 Software Programmable Tx/Rx ChannelsProgrammable High/Low Speed Operation - Concurrent operation of all Tx/Rx Channels at high data rates - Conduction-cooling and/or conformal coating available - Designed for extended temperature operations - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - IRIG-B Time Code Encoder/Decoder for Data Correlation - ANSI Application Interface supporting C++, C#, and .net DevelopmentDevice Driver Support: Windows, Linux, VxWorks, and other operating system - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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Product
Correlation Analysis
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EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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Product
PXI-6281, 16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Hybrid, Multifunction I/O Module
779121-01
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16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXI‑6281 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
PXI-6280, 16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Hybrid, Multifunction I/O Module
779120-01
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16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Multifunction I/O Module—The PXI‑6280 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Phase Noise Analyzers
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The phase noise analyzer portfolio from Rohde & Schwarz offers an affordable, mid-range solution with high sensitivity and fast measurements as well as high-end ultra-high-sensitivity solutions with advanced measurements modes. Ideal for phase noise analysis and VCO tests, the industry-leading solutions enable two-path phase noise analysis with real-time cross correlation and fast VCO characterization with built-in low-noise DC sources. Additionally, high-end signal and spectrum analysis can be added into a single box.
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Product
Digital Image Correlation (DIC) Measurement System
EduDIC
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EduDIC is a complete Digital Image Correlation (DIC) measurement system, designed as a simple and convenient educational training tool for academic courses in experimental solid mechanics. This easy-to-use system allows academic instructors to effectively present the optical measurement technique of DIC for materials testing to the engineers and scientists of tomorrow.
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Product
Soil Mechanics
INSITU
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The INSITU program interprets statical and dynamical geotechnical in situ tests. In order to interpret the SPT tests, the program utilises the main correlations that are normally used to determine the geotechnical parameters of a soil. One should enter the geometrical and geotechnical parameters pertaining to the stratigraphy surveyed trough drilling and the number of blows relative to each test; some corrective parameters can be entered that enable one to limit the perturbations in the interpretation of the data caused by the way the test is performed and the type of instrument that is used.
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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Fibre Channel Test & Simulation Interface for PCI Express
PCIe-FC4
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Avionics Interface Technologies
Half-size four lane PCIe board - Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speedsComprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent Analyzer - Supports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
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Product
Analysis System
Pegasus (EDS-EBSD)
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The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Product
Fibre Channel XMC Interface Module
XMC-FC4
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Avionics Interface Technologies
Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Supports DMA for high speed streaming of data to/from the board - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent AnalyzerSupports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
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Product
PCI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device
779068-01
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32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device - The PCI-6229 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
TCSPC Lifetime Fluorometer
DeltaFlex
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The DeltaFlex time correlated single photon counting (TCSPC) system is one of our Delta series of next generation time correlated single photon counting lifetime instrumentation. The DeltaFlex offers the ultimate in flexibility.
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Product
PXIe-6259, PXIe, 32 AI (16-Bit, 1.25 MS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module
779778-01
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The PXIe-6259 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
ARINC 429 Test And Simulation PXI Module
PXI-C429
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*4, 8, 16 or 32 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Product
Smart Factory Solutions
Smart4Metrics Factory 4.0
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Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.
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Product
NI-9423, 24 V, 8 Channel (Sinking Input), 1 µs C Series Digital Module
783735-01
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24 V, 8 Channel (Sinking Input), 1 µs C Series Digital Module - The NI‑9423 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel is compatible with 24 V logic levels, can accept up to … 30 V discrete logic levels, and has an LED that indicates the status. The NI‑9423 offers isolation between the input and output banks from channel to earth ground. The NI‑9423 is a correlated digital module, so it can perform correlated measurements, triggering, and sychronization when installed in a CompactDAQ chassis.
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Product
PCI-6225, 80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device
779295-01
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80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device - The PCI‑6225 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Ultra-Low Range Gas Filter Correlation Carbon Monoxide Analyzer
Model T300U
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The Model T300U Trace-level CO analyzer has been developed specifically to address the challenges of low level monitoring as required, for example, in the US NCore network. Using IR absorption with a Gas Filter Correlation Wheel, the T300U is designed to allow ultra-sensitive CO measurements while still meeting the requirements for use as a US EPA compliance analyzer.The optical bench is enclosed in a temperature controlled oven, dramatically decreasing instrument noise and drift. The objective and field mirrors in the sample cell are gold plated to maximize signal to noise performance, while a temperature-controlled Nafion dryer on the inlet minimizes water interference caused by ambient humidity changes. Periodically, the T300U seamlessly corrects its baseline by routing the sample through a heated catalytic CO scrubber. This Auto Reference function corrects zero drift and reduces the effect of interferences.All T Series instruments offer an advanced color display, capacitive touch screen, intuitive user interface, flexible I/O, and built-in data acquisition capability. All instrument set up, control and access to stored data and diagnostic information is available through the front panel, or via RS232, Ethernet, or USB com ports, either locally or by remote connection.The Model T300U comes with NumaView™ Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView™ Software.
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Product
ARINC 429 XMC Interface Module
XMC-429
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Avionics Interface Technologies
16, 32, or 64 ARINC 429 channels (up to 32 Tx & 32 Rx) - Programmable Tx channel output amplitude - Programmable high/low speed operation - Eight (8) Discrete I/O (Four (4) inputs, and four (4) outputs) - Concurrent operation of all Tx/Rx Channels at high data rates - Full error injection and detection - Data capture filtering, 100% bus recording, and physical bus replay - IRIG‐B time code encoder/decoder for data correlation - Conduction-cooling and/or conformal coating available - Designed for extended temperature operations - ANSI Application interfaces supporting C, C++, C#, and .net development - Device driver support: Windows, Linux, and VxWorks (others provided upon request)
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Product
PCIe Gen3 Full HD, High Speed, Compact Camera for Testing
CB019CG-LX-X8G3
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Full HD, High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
Spectral Domain Signal Analyzer
Baudline
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Baudline is a time-frequency browser designed for scientific visualization of the spectral domain. Signal analysis is performed by Fourier, correlation, and raster transforms that create colorful spectrograms with vibrant detail. Conduct test and measurement experiments with the built in function generator, or play back audio files with a multitude of effects and filters. The baudline signal analyzer combines fast digital signal processing, versatile high speed displays, and continuous capture tools for hunting down and studying elusive signal characteristics.
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Product
FLIM Upgrade Kits for LSMs
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As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers a wide range of high-grade Fluorescence Lifetime Imaging (FLIM) systems for laser scanning microscopes since 1998. Our techniques have found broad application within the scope of Life Sciences, Clinical FLIM, Diffuse Optical Tomography (DOT), Fluorescence Correlation (FCS, FCCS), Förster Resonance Energy Transfer (FRET) and more.
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Product
Partial Discharge Detection and Localization System for Power Transformers
AE-150™
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The AE-150™ is designed to detect and localize Partial Discharge activity by correlating acoustic and electric sensors’ data. The AE-150™ has many acquisition modes, each used for detecting and locating Partial Discharge activity in a transformer. The AE-150™ unit is mounted on the transformer tank using its powerful magnets that also hold four acoustic sensors. Acquired data is sent to Mirador-Tx software where all advanced positioning functions are implemented. This cutting-edge software allows easy data interpretation, reporting and monitoring.
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Product
NI-9474, 30 V, 8-Channel (Sourcing Output), 1 µs C Series Digital Module
779003-01
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30 V, 8-Channel (Sourcing Output), 1 µs C Series Digital Module - The NI‑9474 works with industrial logic levels and signals to directly connect to a wide array of industrial switches, transducers, and devices. Each channel is compatible with signals from 5 V to 30 V, features transient overvoltage protection between the output channels and earth ground, and has a LED that indicates the status. The NI‑9474 is a correlated digital module, so it can perform correlated operations, triggering, and synchronization when installed in a CompactDAQ chassis.
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Product
Mixed Signal Oscilloscopes
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The design, validation, and manufacturing of modern electronics necessitate the measurement of both analog and digital signals. Mixed signal oscilloscopes enable the simultaneous, time correlated observations and analysis of analog with digital (logic) signals, to establish causal relationships between the various areas of a device's electronics. They are purpose built tools for troubleshooting electrical anomalies, measuring parametric values, and monitoring cause and effect relationships between signals.
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Product
Sonin Moisture Test Meter
50211
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The Sonin Moisture Test Meter offers additional features & performance beyond those of the Moisture Test Tool. The meter’s contact probes are at the end of 3 foot coiled cable for detecting moisture in difficult to reach locations. Scale & reference chart correlate relative and moisture percentage readings
