Code Analysis
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Product
Image Quality Analysis
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Quality Engineering Associates Inc.
Historically, print and image quality evaluation has been hampered by reliance on subjective judgment and guesswork. But not any more. QEA has developed a full line of quantitative, reliable image analysis tools, encompassing sophisticated, fully-automated camera-based systems, automated scanner-based systems, portable hand-helds for distinctness of image (DOI) measurements, and a portable color measurement toolkit.
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Product
Spectrum Analysis
S96090B
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The spectrum analyzer (SA) application adds high-performance microwave spectrum analysis to the analyzer. With fast stepped-FFT sweeps, the SA application provides quick spurious searches over broad frequency ranges.
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Product
NRZ Analysis for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-NRZ
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Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Product
Testing and Analysis Equipment
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Parker's testing and analysis equipment provides a quick, easy and accurate means of monitoring conditions in critical applications such as compressed air, water intrusion, and water treatment systems.
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Product
DCA-M High-Accuracy, Low-Cost Solution for Optical Waveform Analysis
N1090A
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The N1090A DCA-M builds on that legacy by using the high-performance elements of 86100 and 86105C. It can be configured to perform thorough optical transmitter compliance tests at a variety of standard data rates from 1.244 to 11.3 Gb/s and come with 20 GHz electrical channel in option.
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Product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
Real-time 1/1, 1/3 Octave Analysis Software
DS-0323
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This software analyzes the 1/1 and 1/3 octave bands for 2 - 32 channels (2 - 64 channels when two units are connected ) in real-time from 0.5 to 20 kHz. The filter is compatible with the IEC, JIS, and ANSI standards. The equivalent continuous A-weighted sound pressure level (Laeq) and the single-shot sound exposure level (Lae) are calculated simultaneously by setting measurement time. Variations in level (time series) for each band can be saved for up to 2,000 points.
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Product
XRF Analysis
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Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.
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Product
Signal Integrity Studio, Analysis & Simulation SW for WAVEPULSER High-Speed Interconnect Analyzer
WavePulser-Signal Integrity (SI) Studio
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WavePulser Signal Integrity (SI) Studio is included as a single license in the WavePulser 40iX-BUNDLE or can be purchased as an additional license for offline access to additional users. WavePulser Signal Integrity (SI) Studio combines S-parameter, Impedance profiling and de-embedding measurements, channel and equalizer modeling, eye diagrams and jitter analysis in a single affordable software package for emulating the complete serial data channel.
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Product
The Leading Measurement System for the Analysis of Porous Materials
ELWIS
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ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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Product
Sound Analysis Software NoiseImage
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Our sound analysis software NoiseImage is a general-purpose platform software providing all tools required for the whole measurement and analysis process. You can use the core package on its own or expand its functionality with any combination of add-on modules for different acoustic measurement types or analysis methods. The add-on modules connect seamlessly via one integrated software environment. You can combine as many expansion modules as you need.
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Product
STDF Test Data Analysis Tool
DataView
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DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Product
Complete Power Quality Analysis System
PK4564-PRO+
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This system contains the essentials for almost any power quality study in the world. Other tiers in the PK4564 class include the standard PK4564 and PK4564-PRO systems.
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Product
IC Side Channel Analysis
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These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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Product
Partial Discharge Measurement and Analysis System
UHF 800
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Our UHF 800 is a system for measuring and analyzing partial discharges in the ultra-high frequency (UHF) range in testing environments with high levels of external noise.
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Product
Failure Analysis – Materials
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Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Product
Portable Data Acquisition & Analysis System
LapCAT III
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# 4, 8, or 16 channels# 1 MHz aggregate 12 bit sampling. Resolution is 0.024% of full scale# 13 recording durations, user selected: 132 msec to 1320 sec# Digital Triggering from any channel, with +/- slope or window# 6 full scale gain ranges, user selected: 0.4, 1, 2, 4, 10, and 20 volts full scale - with a 10mV/g accelerometer these equal 40g, 100g, 200g, 400g 1000g and 2000g full scale - higher or lower ranges by different sensor selection
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In Vivo Signal Detection & Intelligent Image Analysis Software
VISQUE®
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Patented algorithms for kinetic analysis of molecular diffusion phenomenon- Tmax, Tarrival, Imax, Iarrival, Trising, 1st Peak, FluAngio, DyAngio, etc.Kinetics visualization with feature mapsTime-series kinetics graphs
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PathWave BenchVue Advanced Power Control And Analysis For Multiple Instrument Connections
BV9200B
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Control and analyze voltage and current measurements from multiple N6705C, N7900 or RP7900 Series
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Product
Failure Analysis
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Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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Product
Acoustics Analysis
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The sounds a product makes directly impact on user experiences. Sounds create strong emotions — positively or negatively — that reinforce brand identity. The difficulty of predicting acoustic results means that a single engineering mistake can prove costly to the final product, making Ansys Acoustics Analysis a powerful solution to ensure optimal acoustics and a successful end product.
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Product
PCI POST Code Display
post4d
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During power on self-test (POST), most PC BIOSes will write diagnostic codes to port 80h or port 84h (jumper selection). Use post4d to display these codes on a dual digit LED display. Additional LEDs indicate the status of the power supply rails. Convenient business card size.
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Product
OC-3/STM-1 And OC-12/STM-4 Analysis And Emulation Card(w/ GigE And USB 2.0)
LightSpeed1000™
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Voice, data, and video traffic is exploding as smartphones, IP TV, video streaming, and "cloud" based services takeoff. A majority of the backbone transport for these applications continues to be SONET and SDH optical transmission networks. A dominant protocol for IP transport is PoS (Packet over SONET) and another is ATM (Asynchronous Transfer Mode). Both schemes are packet based, with ATM using fixed size packets of 53 bytes called "cells", and PoS using variable packet sizes closely matching to Ethernet frames. GL's LightSpeed1000™ hardware platform (PCIe Card and USB Pod) is capable of OC-3/12 and STM-1/4 wire-speed processing on quad optical ports for functions such as wire-speed recording and wire-speed playback of Unchannelized and Channelized ATM, PoS, and RAW Traffic.
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Real-Time Analysis, 160 MHz, Basic Detection, Multi-touch
N9030B-RT1
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See, capture, and understand elusive signals as short as 17.23 s with 100% POI and a complete set of advanced triggers View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Image Analysis & Stage Micrometers
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The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Liquid Analysis
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Sensors for conductivity measurements and detection of air and gas bubbles.
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Real-Time Analysis, 255 MHz, Basic Detection, Multi-touch
N9040B-RT1
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See, capture, and understand elusive signals as short as 17.17 s with 100% POI and a complete set of advanced triggers View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Structural Analysis
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With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
