X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Industrial X-Ray
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Teledyne DALSA offers powerful, innovative CCD and CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for industrial and scientific applications such as NDT (non destructive testing) in evaluation, troubleshooting, research, and quality control.
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Conveyor X-ray Scanners
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Innovative baggage X-ray screening units for quick and easy identification of the material composition of scanned objects.
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X-Ray Flaw Detectors
XXQ/XXG/XXGH Series
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XXQ series are suitable for the material directional of thin iron plate, aluminum, rubber and so on, may get very good picture quality and clarity.
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X-ray Fluorescence Spectrometer
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X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
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Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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X-Ray Preamplifier Power Supply
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The X-ray Preamplifier Power Supply (XPPS) provides power for 50 or more preamplifiers. The 19-inch rack-mount or benchtop unit contains linear power supplies that generate +/-12V @ 5.1 Amperes and +/-24V @ 3.6 Amperes, with very little noise.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
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Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
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SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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X-Ray Inspection System
MXI Quadra 5
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Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
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TEL-X-Ometer X-ray System
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X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
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Compact Photon Counting X-Ray Detector
HyPix-3000
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Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.
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(X-ray and XUV) Streak Cameras
AXIS-PX
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We build streak camera systems that can achieve time resolution on the femtosecond time scale while conserving and ultra-fine spatial resolution on a very long slit length.
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Energy Dispersive X-Ray Spectroscopy (EDS)
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Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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X-Ray Fluorescence Analyzer
MESA-50
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HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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Digital Cabinet X-ray System
XPERT 80
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Kubtec's XPERT 80 brings high quality imaging and ease of use to science and research. The XPERT 80's compact self-contained cabinet, with a high resolution x-ray source, provides the sharpest images for every application. Optional sources are also available for micro-focus and soft x-ray applications.
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X-ray Fluorescence
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XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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X-Ray Inspection System
MX1
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Manncorp’s new MX1 is a high-performance x-ray inspection system designed for real time imaging of multilayer PCBs and dense metal BGAs, μBGAs, and chip scale packages. Its high voltage (80kV), computer-controlled x-ray tube and 35 μm focal spot provide the power necessary for detection of a variety of defects including bridging, voids, and missing balls. The MX1’s standard camera features continuous zoom magnification from 4X to 50X and variable angle viewing up to 45°, and an upgrade to the x-ray tube can boost magnification to 225X.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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X-Ray Inspection System
MXI Ruby XL
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Designed for the largest PCBs, Ruby XL allows 96 x 67 cm (37.9” x 26.4”) areas to be inspected non-destructively, with feature resolution up to 0.5 µm.
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Scanning X-Ray Detectors
Shad-o-Scan
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Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
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Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
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As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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Energy Dispersive X-ray Spectroscopy
EDS
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Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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Benchtop X-ray Crystallography System
XtaLAB mini II
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The Rigaku XtaLAB mini II, benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II will enhance research productivity by offering affordable structure analysis capability without the necessity of relying on a departmental facility. With the XtaLAB mini II, you no longer have to wait in line to determine your structures. Instead your research group can rapidly analyze new compounds as they are synthesized in the lab.
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Digital X-ray Detector
Aurora
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Aurora is a product family of digital X-ray detector solutions powering all security and a variety of industrial line-scanners. The product family consists of a wide range of stand-alone detectors, and all needed building blocks, like ready-made detector boards, modules and readout electronics, for end-to-end systems. Aurora provides superior image quality and a fully digitalized data path in the most robust, modular and easily scalable platform. It is a plug-and-play type solution speeding up time-to-market and delivering total cost savings.
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Multipurpose X-Ray Diffractometer with Built-In Intelligent Guidance
SmartLab SE
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The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
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X-ray Microscopy
ZEISS Xradia Versa
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Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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