X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
-
Product
X-Ray Seamless Pixel Array Detector
XSPA-400 ER
-
In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
-
Product
High Resolution Inline AXI Platform
AXI XS Series
-
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
-
Product
Industrial Computed Tomography
TomoScope® XL
-
Micro focus X-ray source up to 225 kV (option: 300 kV micro focus tube) Grater range of x-ray detectors Grater range of x-ray detectors
-
Product
HPGe Detectors & Spectrometers
-
Baltic Scientific Instruments, Ltd
Baltic Scientific Instruments produces gamma- and X-ray spectrometers based on HPGe coaxial or planar detectors with liquid nitrogen and electric machine cooling. The spectrometers are used for radionuclide analysis and for monitoring of activity in the nuclear industry and related environment monitoring. HPGe detectors have additional applications in scientific research and technology development as well as in various spheres of industry including security and border control.
-
Product
X-Ray Detector
Cmosaix CMX4343
-
The technology used for the Cmosaix CMX4343 x-ray detector is based on a large array of CMOS cameras and sophisticated mathematical algorithms that produce superior X-ray imaging and enable new applications that were not possible before, at a fraction of the cost of existing technologies.
-
Product
X-ray Fluorescence Spectroscopy (XRF) Services
-
Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
-
Product
EDXIR-Analysis Contaminant Finder/Material Inspector
-
EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
-
Product
XRD Diffractometers
Empyrean Range
-
With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
-
Product
Microscopy
-
Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
-
Product
Beam Directional Power Supply Battery 40 to 120 kV
CP120B
-
This ultra-light, compact and battery operated constant potential portable X-Ray generator is the perfect tool for specific NDT applications that require repetitive short exposures. Its versatility also makes it the ideal piece of equipment for security applications. In fact, in combination with the FLATSCAN15, the FLATSCAN30 and other digital X-Ray detectors, the CP120B will – thanks to its small focal spot and constant potential X-Ray output – enhance image quality and definitely contribute to a reduced exposure time.
-
Product
Metrology Solutions for Semiconductors
-
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
-
Product
MultiBeam System
FIB
-
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
-
Product
Analysis System
Neptune (EDS-WDS)
-
By integrating Energy Dispersive Spectroscopy (EDS) and Wavelength Dispersive Spectrometry (WDS) analytical techniques on a single platform, Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS. Together the two techniques extend X-ray microanalysis capabilities and provide solutions to the most challenging analysis problems. Each technique can be used independently or the data can be integrated to provide results which were previously unachievable.
-
Product
Micro-XRF Spectrometers
-
Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
-
Product
GO-SCAN
15 10 HR
-
For the first time ever, Teledyne ICM and Teledyne DALSA, two of the most advanced x-ray solution providers in the world, unite forces and reveal the first Integrated Digital Portable X-Ray Solution for Non-Destructive Testing… ever!
-
Product
X-ray Diffraction and Elemental Analysis
D8 ADVANCE
-
The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
-
Product
Medical Imaging
-
Teledyne e2v has over 35 years of experience in the medical field and offers medical devices companies a range of CCD and CMOS image sensor solutions and services. We understand the challenges facing the healthcare landscape (including ageing populations and the management of healthcare spending), and through close partnerships with our suppliers, are able to offer customers agility and flexibility over our entire supply chain. This enables us to provide our customers with a fully comprehensive digital imaging solution. We also produce and sell an X-ray intra-oral dental product named Demoniac, which is compliant with ISO 13485.
-
Product
WDXRF Wafer Analyzer
2830 ZT
-
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
-
Product
Sindie Online
-
Sindie Online is an industrial-grade process analyzer delivering continuous sulfur detection to monitor fuel streams and help to prevent tank contamination. It has many advantages over competing technologies: Powered by MWDXRF, Sindie Online has an exceptional signal-to-noise ratio using monochromatic excitation of the X-ray source characteristic line – a technique that is faster, safer and cleaner than UVF.
-
Product
Diffractometers & Scattering Systems
-
Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
-
Product
Reject Station for X-Ray Image Analyser
IV-110I
-
IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
-
Product
Silicon Drift Detector
Octane Elite (SDD) Series
-
The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
-
Product
Beam Geometry & Alignment Testing
-
Perform quality control testing of your Digital Radiography (DR), Computed Radiography (CR) and Fluoroscopy X-ray systems with ease. Comply with local, state, federal, and governing bodies for digital and traditional analog radiographic imaging technologies.
-
Product
16-element Si photodiode array
S12362-321
-
The S12362/S12363 series is a back-illuminated type 16-element photodiode array specifi cally designed for non-destructive X-ray inspection. These are modified versions of our previous products (S11212 series: 1.575 mm pitch). The pitch has been changed to 2.5 mm. The back-illuminated photodiode array is also simple to handle and easily couples to scintillators without having to worry about wire damage because there are no bonding wires and photosensitive areas on the back side.
-
Product
Micro-CT for Life Science
-
Micro computed tomography is X-ray imaging in 3D, by the same method used in hospital CT scans, but on a small scale with massively increased resolution. It really represents 3D microscopy, where very fine scale internal structure of objects is imaged non-destructively. Bruker microtomography is available in a range of easy-to-use desktop instruments, which generate 3D images of your sample’s morphology and internal microstructure with resolution down to the micron level.
-
Product
Bulkflow X-Ray Inspection System
-
Designed to be integrated into line with optional reject stations, the Bulkflow X-ray System is perfect for loose and free flowing products. Offering a good detection levels on a wide range of contaminants including all metal, bone, glass and dense plastics.
-
-
Product
elemental analyzer
SPECTRO XEPOS
-
SPECTRO Analytical Instruments GmbH
An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance
-
Product
Analytical Services
-
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
-
Product
Omniblock Integrated X-Ray Systems
-
Omniblock® X-ray generators from Excelitas Technologies integrate the high-voltage source and X-ray tube into one consolidated housing. This design configuration eliminates the high-voltage cables and connectors reducing cost while improving system design flexibility and streamlining integration. They are specifically designed for generating X-rays in static or rotating applications using proven designs of up to 180 kV and 2.4 kW. Typical applications for Omniblock X-ray generators include baggage screening, medical imaging, food inspection, industrial analysis and many other cost-sensitive and space-constrained X-ray applications.
