MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
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Product
Cleanliness Test Systems
CM Series
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The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.
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Product
Shock Test System, Battery Test
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's shock test system used to measure and determine the impact resistance of a product or package. It is mainly used to evaluate the reliability of the function and the integrity of the structure of the test product under impact environment. Suitable for impact testing of aerospace, aerospace, marine, military, consumer electronics, automotive, household appliances and display equipment.
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
Partial Discharge Test System
TPP
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The Partial Discharge Test System type TPP is used for non-destructive insulation and quality testing of electrical components (for example according VDE 0110-1, EN 50178, IEC 60270 and IEC 60060).
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Product
VLF Testing and Diagnostics System
PHG 70 TD/PD
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Cable testing and diagnostics with the BAUR PHG 70 TD/PD. With the PHG TD/PD, you get a multifunctional cable testing and diagnostics system that was specially designed and developed for medium-voltage networks. The PHG TD/PD system is also the only cable testing and diagnostics system that gives a comprehensive overview of the quality and ageing condition of the test sample. The diagnostic methods TD and PD are mutually complementary, because on one hand you can detect the complete condition and on the other hand locate * individual faults in the operating resources.* High performance VLF truesinus testing device (3 kW) with regulated output voltageCompact, enclosed design in 19" format* Variable installation option with separate control and voltage unit* Variable connection options to cable stations of different models
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Automated Robot Test System
ATS-8000A
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High Power Pulse Instruments GmbH
The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.Future extension for CDM is optional.
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Product
Fuel Cell Test Systems
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Fuel Cell Test System is a complete test station for operation and measurement of PEM/DMFC fuel cells.
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Product
Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
26.5 GHz Or 54 GHz, Up To 4 GHz BW, RF PXI Vector Signal Transceiver
789601-26211
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The PXIe-5842 is a vector signal transceiver (VST), which combines a vector signal generator and vector signal analyzer into a single four-slot PXI Express instrument. This VST provides the fast measurement speed and small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments. The PXIe-5842 benefits from PXI modularity and scalability, as up to four PXIe-5842 VSTs can fit into one 18-slot PXI Chassis. Additionally, the VST provides the error vector magnitude (EVM) performance required to test a variety of cellular and wireless standards such as Wi-Fi 7 and 5G NR. The PXIe-5842 supports frequency coverage and bandwidth availability for a wide range of semiconductor, aerospace, and defense applications.
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Product
20GHz Four Channel MW Benchtop Signal Generator
LSX2094B
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The LSX2094B is a 20GHz Four Channel Microwave Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
VME Test System
VMETS
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Measurements of system performance include Bus Utilization, Transfer Rates and Statistics. As data is acquired the Min, Max and Average values are updated and displayed in graphical form.
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Product
SSD Test System
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The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI.
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Product
Signal, Contact, Receiver, QuadraPaddle, 5 Amp, 22-28 AWG, 50µ” Au, Crimp
610138116
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*Please note: The difference between this p/n and 610138216 is the amount of gold plating. See below.P/n 610138116- 50µ" AuP/n 610138216- 30µ" AuPrimary mating contact 610138112. (May mate with other ITA contacts, as well.)
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Product
Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Product
Automatic Test System
Star-Rec
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Test entire HDI panel at once, or step & repeat in the "feed" direction. Fastest BGA Strip test system available. Star-Rec comes standard with: * loader * board cleaner * CCD Camera Alignment * electrical test section * fail and pass re-stackers * Board Marker
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Product
Low Frequency Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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Product
Wireless Connectivity and IoT Test System
IQxel-M4W
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Suitable for the lab or manufacturing environment, the IQxel-M4W 6G is ideal for RF testing of wireless connectivity and IoT products. The platform’s flexible software supports the most prevalent wireless connectivity standards: WLAN 802.11ax (Wi-Fi 6) and legacy (802.11a/b/g/n/ac), Bluetooth® Classic and Low Energy (Bluetooth® LE) as well as Zigbee/Thread, Z-Wave, LPWAN technologies (Sigfox, LoRa) and cellular IoT technologies (NB-IoT, LTE-M, 5G) as well as navigational technologies.
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Product
DynoLAB Test Cell Supervisory System
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SAKOR Technologies’ DynoLAB™ data acquisition and control systems offer reliable, cost effective automation of all types of dynamometer test systems. As with all SAKOR products, the DynoLAB system undergoes a continuous program of upgrade and improvement, regularly expanding and enhancing DynoLAB’s capabilities.
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Product
Standalone with Drop-In Test Systems
800 Series ATE
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The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
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Product
Meter Test Systems
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We offer a huge variety of products for meter testing. From the smallest device with the size of a single-phase meter up to customized semi-automatic systems with more than 40 test positions.
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Product
Test Automation Platform Developer's System
KS8400A
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The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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Product
Flexible Test System Automation Platform
RF2000A
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The Ranatec RF2000A is a flexible test system automation platform that helps you to integrate your complete test system into a single box. No more cables and discrete parts on your desktop!
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Product
Camera Test System
FS 8681 / SR
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FS8681/SR is software for evaluating images* and making pass/fail judgments in camera mass production inspections. It consists of the "Editor FS8681" application that sets the inspection content and the "Sequence Runner FS8681SR" application that executes the set inspection.
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Product
Mixed Signal Oscilloscope 200 MHz, 2 Analog Plus 16 Digital Channels
MSOX3022G
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The MSOX3022G 200 MHz oscilloscope provides 2 analog plus 16 digital channels, 4 Mpts memory, 1,000,000 waveforms/sec update rate, zone touch trigger with an 8.5-in capacitive touch screen, and standard embedded software with waveform and measurement histograms.
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MEMS Testing System
BK3010V2
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The BaKo BK3010V2 is our updated MEMS Tester, based on our C-Mic tester, the best selling BK3010. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is very easy and can be done in a few minutes. In addition, the new BK3010V2 can be connected to a computer so you can keep and view compiled data and track trends in variations in your C-Mics.
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Product
Typical Advanced Mixed Signal Driver Card
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A wide range of Driver card are available suitable for HTOL, THB, LTOL, and HAST test applications. All device technologies are catered for whether it be Digital , Analogue, Mixed Signal, low voltage <0.5v, high voltage >>3KV.
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Integrated 5G mmWave Test System
IQgig-5G
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The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
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Product
PXI-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
778572-15
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35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Product
Phase Noise Test System
N5511A
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The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
