Vacuum Interrupter Test
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Product
Configurable Functional Test System
ATS-5000
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Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
Test Management Software
ActivATE™
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Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
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Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Test Fixture, Axial And Radial
16047A
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The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
SoC Test Systems
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Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
SMD Array Type LCR Test Fixture
16034H
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The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Product
EMS Test System
TS9982
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The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Functional Test Fixtures
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Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
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The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Semiconductor Test Software
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Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
EVSE Test Platform
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To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Product
PCI Express 5.0 Test Platform
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Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
Scalable Tester System for Functional Testing
UTP6010
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The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Product
Environmental Control System Test Platform
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The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Product
In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
Modular Functional Testing Platform
OTP2
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Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
LTE RRM Test System
T4010S
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The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
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Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Test Fixture Kits
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More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
VXI Digital Test Instrument
T940 Series
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The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
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The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
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The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
