Gigabit Ethernet Test
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Product
8GE PoE And 2G Unmanaged Ethernet Switch
EKI-5729PI
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Full Gigabit Ethernet ports and comply with IEEE, 802.3af/at PoE standard, Communicates with SCADA software via Modbus/TCP. Communicates with NMS (Networking management system) via SNMP, Port-based QoS for deterministic data transmission.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Physical Layer Test System
N19301B
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The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
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The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
IoT Ethernet I/O Modules
ADAM-6000/6200
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Supporting Modbus & IoT protocols, Ethernet remote data acquisition modules offer analog, RTD, thermocouple, digital, relay and counter I/O.
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Product
8FE + 2FE/GE SFP Port Managed Industrial Ethernet Switch
EKI-5710E-2FI
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Redundancy: X-Ring Pro (ultra-high-speed recovery time, <20 ms), RSTP/STP (802.1w/1D), IXM function for fast deployment, Security Pack with 802.1X, ACL, RADIUS, TACACS+, MAB Authentication, SNMPv3, HTTPS, SSH, and SFTP. Management: SNMP v1/v2c/v3, WEB, Telnet, standard MIB, private MIB, Supports NMS for easy and visualized to monitor and manage network remotely.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Ethernet Connectivity for Controlling ARINC-429 Channels and Auto RX Bridging
ENET-A429
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eNet-A429™ is an innovative product that provides “remoting” of ARINC operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). eNet-429 is a small, low-power, rugged device that provides connectivity for 1-8 ARINC 429/575/573/717 Channels – Ideal for remoting ARINC connections for in-field applications or point-point lab usage.
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Product
HV Test System for Patient Monitors
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HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Test System
UltraFLEX
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The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
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Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
EN50155 Managed PoE Ethernet Switch
EKI-9516E-4GMPW
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12 x M12 D-Coded 10/100 Mbps PoE ports + 4 x M12 X-Coded 10/100/1000 Mbps Byapss ports, Complies with EN50155 & EN50121-3-2. Operating temperature: -40 ~ 75°C, Operating power input range: 16.8~137.5VDC. Supports X-Ring Pro for rapid and predictable convergence, Supports IXM for fast and easy maintenance.
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Product
Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
6FE+2x100M Multi-Mode SC Fiber Port Industrial Managed Ethernet Switch
EKI-7708E-2MI
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Provides 6*FE ports with auto MDI/MDIX, Provide 2x100M SC Multimode 2km ports, Support 10/100Mbps auto negotiation. Support jumbo frame transmission up to 10k, Provide slim size, DIN-rail with IP30 metal mechanism, Support redundant 12V~48V DC power input and P-fail relay.
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Product
Automotive Electronics Functional Test System
TS-5020
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The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
EN 50155 M12 8FE PoE + 2GE Managed Switch
EKI-9510E-2GMPW
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M12 connector with IP67 rugged housing, Complies with EN50155 & EN50121-3-2, Complies with EN45545-2 & EN61373, Supports PoE IEEE802.3af/at. Wide nominal power input range: 24~110VDC; Operating power input range: 16.8~137.5VDC. Compact size to fit in different narrow spaces, Operating temperature: -40 ~ 70°C.
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
EN50155 Managed PoE Ethernet Switch
EKI-9528E-8GMPX
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M12 connector with ruggedized IP54 certified housing, Complies with EN50155 and EN50121-3-2 standards, 24 x PoE IEEE802.3af/at ports, Wide nominal power input range: 24 ~ 110VDC. Operating power input range: 16.8 ~ 137.5VDC, X-Ring Pro delivers rapid and predictable convergence.
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Product
Unmanaged Ethernet Switch
EKI-2712X-SPE
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Provides 2 x 10G, 2 x 2.5G, 2 x SFP+, and 6 x SPE ports, SFP+ socket for easy flexible fiber expansion, Offers DIN Rail and wall mounting options. Supports wide-range 9–36VDC power input, Compliant with IEEE 1588 E2E TC standard, Supports gPTP IEEE 802.1AS-2020 Time-aware bridging.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
8FE Unmanaged Ethernet Switch, -40~75℃
EKI-2528I
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Provides 5/8 Fast Ethernet ports with Auto MDI/MDI-X, Supports 10/100 Mbps Auto-Negotiation, Provides compact size with DIN-rail/Wall mount, and IP30 metal mechanism. Supports redundant 12 ~ 48 VDC power input and P-Fail relay, Supports wide operating temperatures from -40 to 75°C.
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Product
Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
