Olympus Corp.
Manufacture and sales of precision machineries and instruments.
- 484-896-5000
- 2951 Ishikawa-machi
Hachioji-shi, Tokyo 192-8507
Japan
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Product
Consumer/ Rohs Benchtop XRF Analyzers
Xpert
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The Xpert for Consumer/RoHS, a convenient, compact & lightweight XRF analyzer for regulatory compliance programs, provides accurate Pass/Fail results within seconds. It is completely independent of an external PC and can be powered by battery for ease of transport to wherever testing is needed.
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Product
Process XRF Analyzer
X-STREAM
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The X-STREAM and X-STREAM: Glass are high-speed, automated sorting systems for automatic identification and sorting of material by chemical composition. Take metal, glass and mineral recycling to a new level of high speed, accuracy and profitability.
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Product
XRF and XRD Analyzers
Vanta
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The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership. With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high throughput and a fast return on investment. Featuring innovative and proprietary Axon technology, Vanta analyzers give you accurate results and help boost productivity no matter the environment or working conditions.
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Product
Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Product
Micro Spectrophotometer
USPM-RU III
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The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
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Product
Inspection System
CIX100
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The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.
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Product
Benchtop XRD System
BTX
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The BTX Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca – U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
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Product
Hall Effect Thickness Gage
Magna-Mike 8600
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The Magna-Mike® 8600 is a portable thickness gage that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball (or disk or wire) is placed on the opposite side or dropped inside a container.
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Product
Consumer Safety and RoHS Handheld XRF Analyzer
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DELTA Consumer Safety & RoHS Handheld XRF Analyzers allow for testing large quantities of consumer & electronic products anywhere, anytime. Get simple, fast, nondestructive regulatory compliance screening for Pb, Cd, Hg, Br & more. Use for ASTM Method F2617-08, HR4040, CPSC, CPSIA & more.
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Product
Advanced Ultrasonic Thickness Gage
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The 45MG is an advanced ultrasonic thickness gage packed with standard measurement features and software options. This unique instrument is compatible with the complete range of Olympus dual element and single element thickness gage transducers.
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Product
Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Product
Laser Scanning Microscope
OLS4100
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The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Product
Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Product
Mining and Geochemistry Handheld XRF Analyzer
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DELTA Mining & Geochemistry Handheld XRF Analyzers provide immediate results to help determine the next course of action for the entire process - exploration, ore grade/process control, environmental sustainability. On-site detection of metals, minerals & contaminants. GPS-GIS-XRF for instant metal mapping, time, cost savings
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Product
Microscopy Image Analysis Software
analySIS FIVE
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The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
















