Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
-
Product
Real-Time Analysis, 85 MHz, Basic Detection, Multi-touch
N9020B-RT1
Signal Analyzer
See, capture, and understand elusive signals as short as 17.3 s with 100% POI and a complete set of advanced triggers View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
-
Product
Electron Probe Microanalyzer
JXA-8530FPlus
-
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
-
Product
Complete Power Quality Analysis System
PK4564
-
PK4564 complete Power Quality Analysis System includes PS4550 Power Quality Analyzer with extended memory, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, and 1-year deluxe warranty.
-
Product
IC Product Testing & Analysis Services
Integrated Service Technology
-
Integrated Service Technology Inc.
iST (Integrated Service Technology Inc.) is a leading lab-service company, specializing in the development of IC product testing & analysis, failure analysis, debugging, reliability test, material analysis. Apart from developing testing technologies for the upstream IC design and semiconductor industries, iST also expanded to provide a full-spectrum of services for the mid and downstream companies in the electronics industry.
-
-
Product
Gas Analysis
-
Accurate measurement of gases and their concentrations is critical in many applications, and often poses a major challenge. Sensors' experience with different measurement principles, including NDIR, NDUV, and thermal conductivity, along with the ability to provide special combinations of these techniques within our products, enables us to tackle these challenges. In addition, our experience goes into every detail of our gas analyzers, ensuring reliable results, even under harsh conditions. Our skilled team of experts is happy to assist you in finding the optimized solution for your measurement requirements, with either off-the-shelf components or a customized solution.
-
Product
Gas Analysis
HPR-20 EPIC
-
The Hiden HPR-20 EPIC gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
-
Product
Surface Analysis
Dimension FastScan Bio
-
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
-
Product
Tool for the Automated Analysis of Measured Data
TRACE-CHECK
-
Day-to-day testing of newly developed features produces large amounts of data that are never analyzed or used. Sporadic errors often remain undetected and problems relating to complex real-time behaviour are generally hard to identify. To resolve such issues, TraceTronic has designed the tool TRACE-CHECK. This software has been successfully applied in test automation environments,
-
Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
-
Product
Signal Analysis
STA/LTA Detector
-
The STA/LTA Detector program is a representation of a detector of various events in triaxial or single-component time signals. The software is based on one of the STA/LTA detector types.
-
Product
Battery Electronics
-
CAES Battery Electronics provide autonomous, dissipative, and continuous cell balancing to maximize available battery capacity, and therefore battery cycle life, throughout a mission.
-
Product
600 Watt DC Electronic Load Mainframe
N3301A
Mainframe
The Keysight N3301A is a half-rack width mainframe with 2-slots that accepts combinations of N330x user-installable load modules (150 W to 600 W) for easy system configuration and future reconfiguration. The N3301A holds up to two N3302A, N3303A, N3304A, and N3307A load modules, or one N3305A and N3306A load modules, allowing up to 600 watts of total maximum power.
-
-
Product
Advanced Trace Analysis System
VQcapture
-
VQcapture™ is a streamlined packet capture import and analysis utility incorporating Telchemy's VQmon® performance monitoring technology. It offers a simple yet sophisticated CLI-based tool for analyzing the performance of VoIP calls and IP video sessions, and can provide comprehensive Layer 2/3/4 packet metrics and traffic/usage statistics for a range of network applications and services
-
Product
Precision Electronic Test Leads
34133A
Accessory Kit
The Keysight 34133A precision electronic test leads are designed specifically for working with small components and dense circuit boards. Each kit includes two test leads (one red and one black).
-
Product
Satellite Carrier Reconnaissance and Analysis System
SCL-SACRAS
-
Shoghi’s Satellite Carrier Reconnaissance and Analysis System (SCL-SACRAS) is capable of detecting Point-to-Point satellite links, which work for international Voice networks, GSM Abis backhaul links, IP links and VSAT networks of major VSAT manufacturers including iDirect, Hughes, Gilat, Eastar Romantis, Comtech; including the various types of proprietary protocols and services running on them.SCL-SACRAS can be utilized for the carrying out the detailed reconnaissance of satellite carrier frequencies running on various target satellites, for identification of target carriers for regular monitoring which are of the customer’s interest. Military or intelligence agency customers can utilize this system to identify the target links on respective satellites for continuous monitoring, using the Shoghi VSAT Monitoring System.
-
Product
ELECTRONIC MEGOHMMETER
MI-2550e
-
The MI-2550e general purposes megohmmeter is a truly portable equipment suitable to measure insulation resistances using test voltages up to 2,5 kV. It employs high-reliable, state-of-the-art technology for accurate measurements of ultra high insulation resistances up to 5.000.000 MΩ with four test voltages: 0,5 kV - 1 kV - 1,5 kV - 2,5 kV.
-
Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
-
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
-
Product
Scanning Electron Microscopes
-
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
-
Product
Harmonic Analysis Software
HI_WAVE
-
HI_WAVE simulates resonance and harmonic distortion in industrial, commercial, and utility power systems.
-
Product
High Performance High Power DC Electronic Load
IT8900A/E Series
-
IT8900A/E series high performance high power DC electronic load provides three voltage ranges 150V/600V/1200V, stand-alone power from 2kW to 54kW. IT8900A/E series, with ultra-wide voltage and current range, controlled by an independent master unit.
-
Product
Scanning Electron Microscopy
SEM
-
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
-
Product
RF Electronic Calibration Module (ECal), DC/300 KHz To 26.5 GHz, 4-ports
N4433D
-
The Keysight N4433D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4433D is a precision 4-ports ECal module that supports selection of 3.5 mm connector and can be mixed up to 26.5 GHz. Select either female-female, male-male, or female-male connectors.
-
Product
Surface Analysis
Innova-IRIS
-
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
-
Product
Mainframe Performance Monitoring & Analysis
Strobe
-
Compuware Strobe is the industry-leading application performance monitoring and analysis solution for mainframe applications. With Strobe, IT departments can pinpoint application inefficiencies that cause excessive CPU consumption and reduce hardware and software costs while increasing customer satisfaction.
-
Product
Testing & Analysis Food Services
-
Intertek is a leading provider of testing and analysis services to the global food industry. We can help you implement comprehensive food safety and quality strategies, and achieve compliance with local, national and international regulations. Food testing is integral to the efficient production of safe, quality products. With the food industry increasingly subject to scrutiny, testing to ensure compliance with food safety regulations and to protect public health, is a must.
-
Product
Offline Viewing and Analysis: Data Import Tool
B4610A
-
The B4610A data import tool allows you to import external data into the logic analyzer application for analysis just like data acquired by logic analyzer acquisition hardware. The application runs on a logic analyzer or an external PC. Virtual import modules read data from a module CSV or module binary (ALB) file and make it available to a wide variety of display windows and analysis tools. Module CSV files can be created by external tools or saved from any logic analyzer module. Module binary (ALB) files are created by Keysight InfiniiVision 7000 Series, 6000 Series, or 5000 Series oscilloscopes. Data import modules are a licensed feature. You can evaluate the data import capability on up to 16 rows (states) of imported data without a license.
-
Product
CD Measurement and Advanced Film Analysis
FilmTek CD
-
Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
-
Product
Terahertz Coating Thickness Analysis
TeraCota
-
TeraView presents a film thickness gauge designed for the automotive industry. The sensor can determine the individual thickness of multiple paint layers on both metallic and non-metallic substrates and offers significant benefits over existing techniques.
