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Product
IEC60884 Plug Temperature Rise Test Apparatus
CX-WS06
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 plug temperature rise test apparatus This temperature rise measuring instrument is designed according to the requirements of IEC60884.1and other standards and the technical requirements provided by customers. It is specially used to detect the temperature rise of some point in various parts or products. The measuring instrument is beautiful in appearance and small in size Reasonable lay
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Product
Test Sockets
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Yamaichi Electronics Co., Ltd.
A test socket is the ideal point to test your home’s internal phone wiring for faults. You can also use it to identify any potential faults with the phone line outside. Your test socket is located in your master socket. It is the point between the internal phone wiring in your house and the phone line outside. That means by plugging into your test socket you can bypass all the internal wiring and test your device directly on the phone line.
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Product
Wafer Test
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Automatic KLA wafer probers with tray-to-tray-wafer-handling are operated 24h a day and 7 days a week. Data retention bake/tests are done at wafer level
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Product
Ozone Test Chamber
EKT-2001OZ-HCSSX
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Designed and manufactured in accordance with ASTM D1149, ISO1431 & JIS K6259 standards. Providing precise and accurate ozone (OZ) concentration environment for rubber and polymer test. Widely applied to (1) Accelerated ageing research (2) Quality control and assurance tests and (3) R&D laboratory formula experiments for cracking resistance.
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Product
PC Based High Current Test Set for Circuit Breakers and Temperature Rise Test Equipment
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This equipment comprises of high current source for testing of circuit breakers with additional facility for temperature rise testing (thus incorporating testing for moulded case, vacuum & air circuit breakers as per IEC 60947-2). The system integrates a servo controlled source with closed loop current feedback to maintain the current constant. It has the necessary instrumentation for maintaining current at full load & other conditions arising in testing at high current. The bench has a PC based control system with temperature data logger (24 channel with ch-ch isolation amplifiers). The data logger displays as well as stores a set of temperature values with time.
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Product
Compact Temperature Test Chambers
TJR
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Specifically designed these benchtop and floor chambers to have a compact exterior yet an ample interior workspace to maximize valuable floor space. Temperature Range: -73C - 200 °C. Internal Dimensions: WxDxH (inches) 16 x 11 x 11.75.
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Product
Ionization Test Set
PFK-105
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- Ionization Test Kit for Measuring Offset Voltage and Discharge Times- Includes a Field Meter, Charge Plate Monitor, ±1000 Volt Charger and Decay Timer- Balance Ionizers per ANSI/ESD SP3.3 Periodic Verification- Measure Ionizer Decay time as per ANSI/ESD S3.1 and ANSI/ESD SP3.3.- Measure Body Voltage Generation and Decay- Evaluate Ionizers and Packaging Materials- Includes a fixture to hold the PFM-711B, CPM-720B and PDT-740B as one- Molded Carrying Case with Foam Insert Included
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Product
Lifecycle Test System
Model 933
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The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
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Product
EMC Test Equipment
TDEMI Mobile+ series
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The new benchmark for your fastest product pre-certifications on the planet. The new TDEMI Mobile+ (TDEMI M+) receiver series of GAUSS INSTRUMENTS is a very compact and robust designed instrument for optimum mobility and outdoor use as well as on developers workbench in your lab. It provides a vast variety of functionalities. The TDEMI M+ receiver series is equipped with a +12V supply - so it can be easily used for on-board testing, e. g. in vehicles or aircrafts and so on. By its integrated touch-sensitive and high resolution screen and the embedded PC the TDEMI M+ is a fully stand-alone instrument independent from any control or host or display unit e. g. as a PC or laptop. Thus it provides even more flexibility for your emission measurements. Furthermore the instrument can be powered by a battery pack (Option BAT-UG) making it even more flexible and easy to carry it around without any need of an external power supply. Especially designed for your todays challenging pre-certification tasks the TDEMI M+ provides the absolutely unrivaled advantages in speed and performance of the well known and market approved GAUSS INSTRUMENTS time-domain and RF technology. Thus, your pre-certification measurements and investigations can be performed up to 16000 times faster than by conventional receivers. The instruments of the TDEMI M+ receiver series are available for the frequency ranges up to 1 GHz, 3 GHz, 6 GHz or 7 GHz starting from 9 kHz each. Additionally these blazing fast measurements can be carried out even starting from 10 Hz optionally (Option MIL/DO-UG).
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Product
Transformer Test Equipment
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DV Power test instruments perform various diagnostic tests on power and instrument transformers. Even more, a unique feature is a condition assessment of on-load tap changers. Performing a transformer test before their breakage can be crucial.Test instruments are portable and enclosed in durable metal cases. Also, the 19” rack-mounted version suitable for factories is available as well.Applications supported by DV Power transformer test equipment include:Winding resistance measurement (IEC 60076-1)Analysis of on-load tap changers (IEC 60214-1)Heat run test (IEC 60076-2)Automatic transformer demagnetizationTurns ratio measurement of power and instrument transformers (IEC 60076-1)Excitation current measurementPhase angle measurementTransformer vector group detectionDemagnetization status verificationAll of the above-mentioned measurements are performed with the highest accuracy.The advanced DV-Win PC software collects both numerical and graphical results. As a result of that, these features provide an easier and more efficient analysis. After the test, DV-Win software generates a test report with a single click. Furthermore, a user can easily customize the test report and save it in different formats, such as XLS or PDF.Finally, the analysis of on-load tap changers is performed by the new method called dynamic resistance measurement (DRM). This is a non-intrusive method. Therefore, it allows detecting problems in on-load tap changers without disassembling them.
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Product
PV Test Solutions
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High-speed and high-accuracy measurement of solar cell I-V characteristics in three modes
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Three Phase Phantom Load Test Bench
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Supreme Instrument Laboratories
Supreme make Phantom Load Test Set is a portable testing accessory designed for field service. It simulates various load conditions usually prevailing in power supply system. The unit offers a practical solution by providing artificial load unaltered by the variation in the power supply mains and adjustable to the complete meter testing requirements.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Circuit Break Timer Test Set
PME-700-TR
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The PME 700 TR combines portability, ease of operation and remarkable accuracy for the task of evaluating the condition and performance of medium and high voltage three phase circuit breakers of any kind.
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Product
802.11be Test System
IQxel-MX
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Next generation wireless devices Access Points, CPEs and client devices like smartphones or tablets based on the IEEE 802.11be EHT (Extremely High Throughput) standard require stringent RF performance to meet the latest standard requirements.
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Product
Battery Test Systems
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
RF Functional Test Fixtures
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EMC Technologies’ design team has developed a variety of test adaptors and test stations for testing RF circuit assemblies and microwave sub-assemblies.
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Product
Burn-in Environmental Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's High Temperature Aging Chamber is widely applied for automotive parts ,electronic and electric products ,components and materials by constant high temperature reliability test.
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Product
Latch-on Test Fixtures
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Latch-on Test Fixtures provide a convenient way for production personnel to quickly and reliably make electrical connections to a product for programming or final test. These custom fixtures eliminate the need to hand-wire products in order to power them up and communicate with them. Typical applications for latch-on test fixtures are metering devices, control panels, and any type of controls that connect via terminal strips.
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
Airborne Network Flight Test Recorder
TTC nREC-7000
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Curtiss-Wright Defense Solutions
The nREC-7000 is a high speed network recorder for use with Flight Test Data Acquisition and Multiplexing units. The nREC-7000 accepts data for recording on two 10GBASE-SR ports and two 1000BASE-T ports that can store data at sustained speeds of up to 1,000 MBps per 10GbE port. The recorder is also capable of acquiring, formatting (using PCAP, DARv3 or IRIG-106 Chapter 10/11), and recording 10GBASE-SR Ethernet at line rate.
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Product
Immunoassay Test Kits
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Immunoassay test kits can detect PCBs in soil, water, and wipe samples. Quantitative test kits have been developed for specific Aroclors, and several kits can measure the overall concentration of a mixture of Aroclors, i.e., total PCBs.
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Product
Test Leads and Probes
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Test leads and probes are an intergral part of a complete measurement system and extend the capabilities of your digital multimeter.
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Product
Functional Test Fixtures
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RNS can build almost any test equipment and automated test machinery. We have delivered soltions for HiPot, LED Test, Leak Test and RF shielded applications for years. We can provide Complete Test Systems, including Test Fixtures, Rack System and even Programming. Our team is committed and has a proven track record of delivering exceptional products independent of scope, so simple- and high-complexity projects are handled with equal care.
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Product
Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
