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Product
Add Dsc To Your Thermal Analysis Toolkit
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The analysis of polymers is one of the main applications of differential scanning calorimetry (DSC) solutions. DSC provides complementary data to DEA, but many DSC solutions are prohibitively expensive. Lambient Technologies has partnered with LINSEIS Corp. to offer the industry’s first low-cost DSC/DEA package.
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Product
Silicon Nails Feature, GTE 10.00p
K8214B
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Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
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Product
JTAG based Test & Flash Programming Services
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We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Product
16-bit, 100KHz, 8SE/4DIFF A/D Inputs; 8 14-bit, 30KHz D/A Outputs, 4 24V Digital I/O, All Isolated
CPCI-3120-8-8
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Input range:?± 10 V, 0-10 V software programmable0-5 V, ± 5 V, 0-2 V, ± 2 V, 0-1 V, ± 1 V (gain)0-20 mA (option) ? software-programmable amplifier:PGA x1, x2, x5, x10 ? Conversion triggered through software,scan, timer, external event ? Onboard FIFO buffering for 256 analog values ? Data exchange through 16-bit I/Oor 32-bit memory (PCI DMA) ? Sequence RAM ? Overvoltage protection ? input filter: 160 kHz
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Product
Create Topographic Profiles from SPM Images
TopoStitch
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topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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Product
Sensors
NanoFocus Probe
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Scan of 3D topography of high accurate featuresVery high point densitySuitable to perform non-contact roughness measurementsHigh flexibility using a range of different front lenses
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Product
NanoLattice Pitch Standard for Mask Handling Tools (NLSM)
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Product
Revolution CMMs
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Advanced Industrial Measurement Systems
A coordinate measuring machine (CMM) measures the geometry of certain physical objects along their X, Y, and Z axes. The CMM’s probing system scans objects at precise points to determine dimensions, angularity, size, profile, and angularity. These capabilities have many applications across different industries. In this blog post, we’ll explain the benefits of CMM technology and the types of machines we offer.
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Product
Scanning Electro-chemical Microscope
920D
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The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Product
Analog Input Module, 16-bit A/D
IP330A
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The IP330A has many features to improve your overall system throughput rate. You can scan all channels or define a subset for more frequent sampling. Burst mode scans selected channels at the maximum conversion rate. Uniform mode performs conversions at user-defined intervals. Both modes can scan continuously, or execute a single cycle upon receiving a trigger.
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Product
Flying Probe Electrical Testers
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Gardien has been present in the PCB industry since the advent of the personal computer. In our beginning Mania, the company that pioneered some of the first electrical grid testers used by PCB fabricators. We still produce class leading equipment to this day, such as our line of Gardien Flying Probe Testers and our Acceler8 Scanning System.
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Product
Brinell Optical Systems
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Newage Testing Instruments, Inc.
Newage offers optical solutions for your hardness testing include the popular B.O.S.S. Brinell Optical Scanning System, HiLight optical scope and pocket optical scope.
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Product
QT Enterprise Software
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Procedures stored via QT Enterprise can be recalled via a barcoded scan to enable fast and accurate setup. In situations where multiple test points are involved, the software can interface with Vitrek’s 964i High Voltage Switching Systems, operating in conjunction with V7X & 95X Hipot Testers to further automate the process. For complex setups, QT Enterprise can display detailed instructions and images to the operator to ensure proper connections prior to testing.
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Product
RF Near Field Scanner
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The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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Product
4-Wire Universal Cable Tester
LX-860
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Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface·Starting up conducts self-diagnosis and self-correction·The system can scan and direct automatically.·The system provides advanced instant open-circuit, short-circuit, continuity test, can test the wire break·It can function as unilateral, standard, multi-segment and spot test of wire·The maximum test voltage is AC1000V / DC1500V
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Product
Software For Visualizing Surface Quality
STATOVISION
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Foerster Instruments, Incorporated
In combination with a STATOGRAPH module, the STATOVISION software enables the visualization of eddy current signals in a clearly arranged C-Scan. This results in an image of the surface quality of the components, allowing surface defects to be precisely localized. A major advantage of the STATOVISION software is the pattern recognition, which can be used for surpressing drill holes on brake discs, for example. The documentation of the entire scan is used for continuous quality assurance.
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Product
Line Scan Camera
Piranha4
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The Piranha4 cameras offer advanced features such as sub-pixel spatial correction, areas of interest (up to 4 at a time) to reduce data processing and simplify cabling, as well as dual-line area mode to double line rate, HDR mode, shading and lens correction. The Piranha4 is built for the real world with features to ease system integration. The advanced GenICam compliant user interface makes it easy to set up and control camera parameters such as exposure control, FFC, white balance, gain, test patterns, diagnostics and more.
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Product
Automated Optical Inspection System
AOI Series
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Perform visual inspections of printed circuit boards (PCB) during manufacturing in which a camera is used to scan the board in extremely fine detail to check for any defects or failures.
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Product
Short-Range Perimeter Surveillance Radar
Ranger® R1
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The Ranger® R1 is a ground-based perimeter surveillance and tracking radar that accurately detects personnel and vehicles at a range of up to 700 m. It scans a full 360° every second, covering up to 1.5 square km (0.6 square miles). Additional units — such as a mid-range Ranger® R2 — can be networked in an overlapping array to protect larger areas, stitching together an impassable radar area outside and inside your perimeter.
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Product
Talon 26.5 GHz Sentinel Intelligent Signal Scanning Rackmount Recorder
Talon RTR 2654
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- Search and capture system using Pentek's Sentinel™ Intelligent Signal Scanner- Captures RF signals from 800 MHz to 26.5 GHz- Capture and scan bandwidths up to 500 MHz- Selectable threshold triggered or manual record modes- 12-bit A/Ds with 57.5 dB SNR & 72 dB SFDR- Built-in DDC with selectable decimations of 4, 8 and 16- 4U chassis with front panel removable SSDs- Storage capabilities to 245 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Product
Phantom Lumber Metal Detector
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Ideally suited for scanning whole logs and for chipper protection, the Phantom Lumber Metal Detector is a large scale metal detection solution built rugged for the lumber industry. Lumber systems provide an effective means of detecting metal objects typically found in the application, such as fencing wire and nails.
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Product
Double Monochromator
Gemini 180
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The Gemini 180 is a fully automated, double additive grating scanning monochromator. The incorporation of toroidal optics provides for optimum throughput and spectral resolution. The Gemini 180 functions as a high power, high purity light source for Fluorescence, detector characterization, and microscope illumination when coupled with one of our Xe Light Sources.
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Product
64-CH, 12/16-Bit, Up to 3 MS/s Multi-Function DAQ Cards
DAQ-2200 Series
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ADLINIK DAQ-2204, DAQ-2205, and DAQ-2206 are high-density and high-performance multifunction DAQ cards. The devices can sample up to 64 AI channels with different gain settings and scan sequences. It makes them ideal for dealing with high-density analog signals with various input ranges and sampling speeds. These devices also offer differential mode for 32 AI channels in order to achieve maximum noise elimination The DAQ-2200 series also feature analog and digital triggering, 2-CH 12-bit analog outputs with waveform generation capability, 24-CH programmable digital I/O lines, and 2-CH 16-bit general-purpose timer/counters.
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Ultra High Performance 3D CT System
UltraTom
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3D micro-tomography (CT Scan) and nano-tomography. Modular system with multiple imagers and x-ray generators. Experimentations possible in-situ. Large volume Inspection and manipulation volume.
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Product
EMI Test Receiver
ESRP
Receiver
The R&S®ESRP EMI test receiver has been designed for diagnostic measurements during development and for precompliance measurements to prepare products for final certification testing. It measures electromagnetic disturbances in the 10 Hz to 7 GHz frequency range, using either conventional stepped frequency scans or FFT based time domain scans to significantly speed up measurements.
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Product
Micro-CT for material science
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Micro computed tomography is X-ray imaging in 3D, by the same method used in hospital CT scans, but on a small scale with massively increased resolution. It really represents 3D microscopy, where very fine scale internal structure of objects is imaged non-destructively. Bruker microtomography is available in a range of easy-to-use desktop instruments, which generate 3D images of your sample’s morphology and internal microstructure with resolution down to the sub-micron level.
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Product
16 Channel ADC for PCI
PCI392
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The PCI392 16-Channel Common-Mode Input ADC for PCI is very well suited to be used in applications in which autonomous signal conversion is an issue, as well as in standard mid-range applications. Enabled channels are scanned at maximum rate and conversion results are stored in shared memory. A local DSP performs all functionality like calibration. User-specific functions can be added for customized operation.
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Product
Gate Scanner
SR200`
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Stanford Research Systems, Inc.
The SR200 Gate Scanner module is designed to automate waveform recovery with the SR250 and SR255 Gated Integrator modules. Waveform recovery is done by slowly scanning the gate of the integrator over the waveform of interest.
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Product
Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
