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Product
Scanning Probes
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Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
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Product
Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Product
Universal Scanning Head
CF106
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Calmet Smart Calibration Devices
Universal miniature scanning head for detecting (counting) impulses from inductive, LED and LCD energy meters. Additionally it enables counting of manually triggered impulses (Start/Stop push button function). Sometimes (when access is difficult) it is the only way to count pulses from inductive, LED and LCD meters.
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Product
Scanning Droplet Cell
VS-SDC
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Scanning Droplet System (SDC) uses a compact peristaltic pump to force electrolyte through a small diameter tube and into a specifically designed head. This PTFE-based SDC head is machined to allow electrolyte to flow past an installed Reference Electrode and then to a port at the base of the head.
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Scanning Instruments
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X-Rite scanning solutions automate press-side color control and are ideal for printers and converters who want to benefit from fast, accurate color. These systems not only remove the possibility of human error, they speed up make-ready and generate predictable and repeatable color results.
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Product
Laser Scanning Microscopes
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A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .
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Product
Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Product
Scanning Mobility Particle Sizer Spectrometer
3938
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TSI''s newest Scanning Mobility Particle Sizer SMPS™ spectrometer is widely used as the standard for measuring airborne particle size distributions. This system is also routinely used to make accurate nanoparticle size measurements of particles suspended in liquids. The National Institute of Standards and Technology (NIST) uses a TSI DMA to size 60 nm and 100 nm standard size reference materials.
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Product
Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Product
Differential Scanning Calorimeters
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Differential Scanning Calorimeters (DSC) measure temperatures and heat flows associated with thermal transitions in a material. Common usage includes investigation, selection, comparison and end-use performance evaluation of materials in research, quality control and production applications. Properties measured by TA Instruments’ DSC techniques include glass transitions, “cold” crystallization, phase changes, melting, crystallization, product stability, cure / cure kinetics, and oxidative stability.
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Product
2D Scanning Unit
intelliSCAN FT
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The intelliSCAN FT is a 2D scanning unit for planar remote laser applications. Fix integrated in the welding machine or attached to a Gantry system, the scan unit ensures fast and precise positioning of the laser spot.
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Product
Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Product
Talon 26.5 GHz Sentinel Intelligent Signal Scanning Rackmount Recorder
Talon RTR 2654
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- Search and capture system using Pentek's Sentinel™ Intelligent Signal Scanner- Captures RF signals from 800 MHz to 26.5 GHz- Capture and scan bandwidths up to 500 MHz- Selectable threshold triggered or manual record modes- 12-bit A/Ds with 57.5 dB SNR & 72 dB SFDR- Built-in DDC with selectable decimations of 4, 8 and 16- 4U chassis with front panel removable SSDs- Storage capabilities to 245 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Product
3D Building Scanning Services For Existing Conditions
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Trusted by industries across USA, Tejjy 3D laser scanning company facilitates high-resolution reality capture of as-built data. Our on-site 3D scanning professionals gather accurate measurement with quality point clouds of as-built condition. We facilitate precision of 4-6 mm approx. in field measurement for renovation, surveying, facility management, digital twin, heritage preservation as per client requirements.
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Product
SPSR-2030 (200-3000nm) Super Pure Spectral Radiation Scanning Analyzer
SPSR-2030
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Hangzhou Everfine Photo-E-Info Co., LTD
SPSR-2030 adopts double-monochromator design, which can realize super-pure&fine full-spectrum scanning ( 200-3000nm), the test parameters including but not limited to spectral power distribution, peak wavelength, dominant wavelength, CCT (correlated colour temperature), CRI (color rendering index), SDCM (standard deviation of color matching), color purity, and etc.
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Product
Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Product
Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
Optical Scanning Systems
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that feature high scanning speed and accuracy. Our non-contact 3D scanners are ideal for 3D digitization of physical models, quality control and reverse engineering.
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Product
Scanning Electro-chemical Microscope
920D
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The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Product
Scanning XPS Microprobe
PHI VersaProbe III
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The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Product
Fabry-Perot Based Scanning Filter
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This new type Fabry-Perot Based Scanning Filter (FPSF) is based on Optoplex proprietary fiber optical Fabry-Perot Etalon technology. It offers F-P based scanning filter with central wavelength at 1060nm, 1310nm, 1550nm or other customized wavelength. It can be tuned manually or automatically by scanning over a wide spectral range from 10nm to 100nm with bandwidth from 0.05nm to 1.0nm. FPSF features less than 3dB insertion loss and as high as 1kHz scanning frequency. Its unique high reliability and low insertion loss design presents the most cost-effective solution for OEM application from telecommunication to fiber sensing interrogation.
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Product
Scanning Probe Workstations
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BioLogic has over 25 years of experience producing scanning probe electrochemistry instruments. Initially this included a number of single technique instruments, with the first modular scanning electrochemical workstation, the M370, introduced in 2006, under the Uniscan name.Scanning probe electrochemistry has found use in academic and commercial research settings. It is applicable in any field in which bulk electrochemical measurements have been used. Scanning probe electrochemistry has found widespread use in: Corrosion and coatings, Biology, including biosensors and biotechnology, Batteries, fuel cells and photovoltaics, Materials, Catalysis
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Product
Differential Scanning Calorimetry
Nano DSC
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The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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Product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
Scanning Probe Microscope
SPM-9700HT
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Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Product
Scanning & Inspection
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API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
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Product
Differential Scanning Calorimeter
DSC-60 Plus Series
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DSC (Differential Scanning Calorimeter) is an indispensable thermal analyzer for materials characterization in R&D and quality control applications in such areas as polymers, pharmaceuticals, electronic parts , foods , etc . It offers the sensitivity and easy operation required for the development of high-performance, highly functional new materials.
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Product
Scanning Vibrating Electrode Technique
VS-SVET
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The Scanning Vibrating Electrode Technique uses a single wire to measures voltage drop in solution. This voltage drop is a result of local current at the surface of a sample. Measuring this voltage in solution images the current at the sample surface. Current can be naturally occurring from a corrosion or biological process, or the current can be externally controlled using a galvanostat.
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Product
Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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Product
3D Scanning System
CyberGage360
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Unprecedented combination of speed, accuracy and one-button simplicity for non-contact automated 3D scanning inspection.CyberGage360 dramatically Speeds Up Quality Assurance of Incoming Parts Inspection & In-Process Inspection of components on the manufacturing floor; Lowers Cost of Quality & Speeds Up Product Time-to-Market. Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important.
