Test Management Suite
See Also: Test Management, Test Management Software, Test Management Applications, Test Management Solution, Test Management Tools
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
Crypto Libraries Test Suite open source
Project Wycheproof
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A set of security tests for identifying cryptographic vulnerabilities. Project Wycheproof tests crypto libraries against known attacks.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
LEAK TEST MANAGER SOFTWARE
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Leak Test Manager is a software application for PC compatible with Windows XP, 7, 8 and 10 that allows interfacing ForTest equipment to a computer via an RS232 connection (or Ethernet if optional is available on the instrument)
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Product
Explosive Test Site Range Instrumentation
test
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Power Manager Analyzer Suite for 802.3at, 802.3bt, & Hybrid PSE's
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Tests 802.3 at/bt PSE’s with Any Combination of 2-Pair and 4-Pair PSE ports up to 90W per port. Automatically assess PSE PM Stability and Capacity Management. Tests PSE’s that grant power with Multi-Event, LLDP, or Both Multi-Event and LLDP. Automatically Adapts to PSE maximum assigned class (MAC) and power demotions on 2-Pair and 4-Pair ports. Tests PSE’s with up to 96 PoE Ports. Emulated PD’s are 802.3 specification compliant including built-in support for multi-event classification, power demotion, and 802.3at/802.3bt LLDP. Highly Informative Reports cover dozens of parameters using Colorful Graphics.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
ISDD Tool Suite
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eXpress provides an environment for the design, input, integration, assessment and optimisation of system diagnostics as well as Prognostic Health Management (PHM), system testability studies, failure modes and effects analysis and analysis of system dependability.
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Product
Battery Management Systems Testing
System
A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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Product
Test Management App
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Test Management goes mobile with the new Kualitee App. Now, simply use your Kualitee mobile app to manage your testing activities by viewing multiple projects, creating defects, approve or reject test cases and view your Kualitee Dashboard to get the latest status reports on the defects being reported.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Test Management and Bug Tracking Tools
SpiraTest
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SpiraTest provides a complete Quality Assurance solution that manages requirements, tests, bugs and issues in one environment, with complete traceability from inception to completion.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Rapita Verification Suite
RVS
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*Run requirements-based tests on your code *Produce coverage evidence including MC/DC from tests *Analyze execution time including worst-case timing on-target *Understand program scheduling behavior *Produce evidence for DO-178 and ISO 26262 certification
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
PCIe 5.0 Test Platform
PXP-500A
Test Platform
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Polarization Management
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Control and manage polarization in your optical system with our lossless, fiber-squeezer-based, multifunctional polarization controllers to achieve the highest performance. Emulate all polarization impairment parameters including SOP, PMD, and PDL, with our complete industry-standard line of emulation products for network and system characterization.
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Product
Pump Management
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Schweitzer Engineering Laboratories, Inc.
SEL hardened pump management solutions provide advanced automation and control capabilities that help improve the reliability, security, and efficiency of pump applications.
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Product
Battery Management
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Renesas' automotive-grade (AEC-Q100) Li-ion battery management solutions (BMS) are specifically designed to meet the stringent safety, reliability and performance requirements of next generation electric vehicle applications.
