Test Management Tools
See Also: Test Management, Test Management Software, Test Management Applications, Test Management Solution, Test Management Suite
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Test Management Tools
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Manage, Execute & conclude from your tests with speed! Host on cloud or host yourself. A web-based, fastest & simplest test case management system.
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Test Management Software
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Test case management and QA is about Coordination and Visibility. PractiTest allows you to Manage all the Requirements, Tests, Issues and Reporting in one simple software testing solution. Get all the information you need in one integrated test case management software solution. Real value from all the information. A Test Case Management tool to help you manage your work and your team.
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Test management software
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Online test case management tool allowing you to manage your test plans, test cases & test runs with ease
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IFEC Modem Managers
ADMM
Modem Manager
The Astronics CSC Dual-Modem Modem Manager (ADMM) provides high-flying, high-performance IP SATCOM broadband satellite connectivity. ADMM supports two different aeronautical satellite modems thereby eliminating the need for a second Modem Manager (ModMan) and allowing service providers to select the most appropriate modem and satellite network during flight. ADMM supports different modem configurations as ordering options.
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Tool, Extraction, TriPaddle and Thermocouple, Receiver and ITA
910110102
Extraction Tool
Tool, Extraction, TriPaddle and Thermocouple, Receiver and ITA
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Hand Crimp Tool For Scorpion Connector Pins
C020AFR-2CP-2A-O
Crimp Tool
Hand operated crimp tool for pins fitted into a Scorpion connector housing.
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Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Research & Electronic Test Products
test
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Tool, Kit, 75 Ohm Coax, ITA, Cable Install
910102107
Tool Kit
Consists of 2 tools for installing cabling into the contact. Crimp Tool and Locator for center contact and Hex Crimp Tool for outer shield (p/n# 910104139).
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Phi6 Drivers
Digital Management Software
Phi6 is the software environment to manage, control and program 6TL modules and systems.
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Tool, Insertion, Right Angle, VTAC
910112132
Insert Tool
Used to install VTAC Right Angle inserts (p/n 610151104) onto a PCB.
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Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Tool, Extraction, Micro Coax / Micro Power
910112123
Extraction Tool
Tool, Extraction, Micro Power and Micro Coaxial.
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Tool, Extraction, QuadraPaddle, ITA
910110111
Extraction Tool
Tool, Extraction, QuadraPaddle, ITA - used to remove the ITA QuadraPaddle contacts from the module.
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Pin Extractor Tool for Scorpion Connector
40-960-020-10A-E
Extraction Tool
Extractor tool for pins fitted into a Scorpion connector housing.
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Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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ARINC-708 Module
M4K708
Test Module
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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SMD Array Type LCR Test Fixture
16034H
Test Fixture
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Bottom Electrode SMD Test Fixture
16197A
Test Fixture
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
