Test Management Solution
See Also: Test Management, Test Management Software, Test Management Applications, Test Management Suite, Test Management Tools
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Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Test Management and Bug Tracking Tools
SpiraTest
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SpiraTest provides a complete Quality Assurance solution that manages requirements, tests, bugs and issues in one environment, with complete traceability from inception to completion.
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Protocol Test Solutions
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Reducing engineering development time, issue resolution cycles, and overall costs; increasing product quality, system reliability, and customer satisfaction.
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Hand-Held Test Solutions
RXT Series
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With extreme modularity and an open platform concept, the RXT defines the test set of the future. The RXT''s capability to combine multiple technologies into a rugged modular platform increases the productivity of technicians who are responsible for the installation, verification, and maintenance of today''s complex services.
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Automated Data Testing Solution
QuerySurge
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Real-Time Technology Solutions, Inc.
QuerySurge is RTTS’ smart Data Testing solution for Big Data that finds bad data & provides a holistic view of your data’s health. QuerySurge helps your team coordinate your data testing initiatives while speeding up your development & testing cycles and finding your bad data.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Glyphosate Testing Solutions
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Glyphosate is a chemical herbicide used during cultivation of cereal grains, pulses, oilseeds, sugar beets and more.The International Agency for Research on Cancer (IARC) classified glyphosate as a Group 2B probable carcinogen in 2016. Since that time, at least 35 countries, regions and municipalities have moved to restrict or ban the use of glyphosate for commercial and noncommercial use.
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Semiconductor Test Hardware Solutions
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A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Simulation and Testing Solutions
LMS
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Siemens Digital Industries Software
LMS simulation and testing solutions help manufacturing companies manage the complexities of tomorrow’s product development by incorporating model-based mechatronic simulation and advanced testing solutions in the product development process. Our products and services tune into mission-critical engineering attributes – ranging from system dynamics, structural integrity and sound quality to durability, safety and power consumption.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
PCIe 5.0 Test Platform
PXP-500A
Test Platform
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Polarization Management
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Control and manage polarization in your optical system with our lossless, fiber-squeezer-based, multifunctional polarization controllers to achieve the highest performance. Emulate all polarization impairment parameters including SOP, PMD, and PDL, with our complete industry-standard line of emulation products for network and system characterization.
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Pump Management
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Schweitzer Engineering Laboratories, Inc.
SEL hardened pump management solutions provide advanced automation and control capabilities that help improve the reliability, security, and efficiency of pump applications.
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Battery Management
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Renesas' automotive-grade (AEC-Q100) Li-ion battery management solutions (BMS) are specifically designed to meet the stringent safety, reliability and performance requirements of next generation electric vehicle applications.
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Automated Inline In-Circuit Test Solutions
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Automated versions of Teradyne’s TestStation systems are designed for short takt time automated lines. The TestStation Automated Inline Handler, coupled with a TestStation Test Insert forms a combined integrated solution for any mix, any volume PCBA manufacturing.
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Control & Management
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Simple and co.mprehensive user control of room AV and automation systems with site and enterprise AV management
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Battery Test & Automation Solutions
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Chroma specifically developed battery cell test solution which is an integrated solution for battery cell formation & grading processes. From battery cell formation procedure to grouping process, Chroma 17900 series are customized with professional planning service which includes manufacturing flow path planning, test station/ equipment planning, test data management and so on to create high performance manufacturing capability.
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Asset Management
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Schweitzer Engineering Laboratories, Inc.
Asset management includes centralized management of network communications devices and IED passwords.
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Parametric Test Solutions
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Reduce your cost-of-test up to 20% with our ultra-fast CPU Overcome your process test challenges Boost measurement throughput and lower costs with our synchronous/asynchronous parallel test capability Better low-level measurement performance Create customized waveforms Reduce transition costs
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Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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RF Test and Measurement Solutions
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Signal GeneratorsSwitch MatricesProgrammable AttenuatorsControl ProductsSignal MeasurementModular Test SystemsCustom Test SystemsUser-Friendly Control Software
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RF & Wireless Test Solutions
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Adivic/Chroma Group has been in the development of RF & WIreless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Toyota, Mitsubishi, Honda, Hyundai, Daewoo...etc., most of the global IC design houses with DTV chips such as Broadcom, Marvell, MTK...etc., and also defense entities around the world.
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Silicon Test & Yield Analysis Solutions
Tessent®
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The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Testing Solutions
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Within the test strategy the final functional test complements the quality strategy. Therefore meaningful results of functional tests shouldn't be focused only on good/bad selection. Goal is to get correct data for statitistics and trend analysis.Under economical point of view you should consider following points as very important in test conceptions:Stability of measurementsAccuracyand the throughput
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Bus Management Test System
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Solution to test redundant Architecture of BMUComprehensive test system performing tests of > 3000 I/O's Special test circuits using hybrid / ceramic components to operate in Thermovac chamber Tests various subsystem functionalities like, AOCS, Sensor Electronics, Telemetry, Tele-command with Self test and application test software
