Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1L-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Reflection Probes
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Reflection probes are used to obtain spectral information of diffuse or specular materials. The light from a light source is sent through six illumination fibers to the sample, and the reflection is measured by a 7th fiber in the center of the reflection probe tip. Discover our reflection probes below.
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Product
Design for Test
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Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Product
High Voltage Optically Isolated Probe, 350 MHz Bandwidth. Includes soft-carrying case.
DL03-ISO
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The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Product
Handheld Portable Multifunction Data Logger
HD31
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Three independent input channels Automatic recognition of the probes - Measurement of Temperature Relative Humidity Atmospheric and differential pressure Air Speed Illuminance (lux) and Irradiance Carbon dioxide (CO2) – Air Quality Direct voltage (VP473 module) and current (IP472 module).
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Product
Adapter/Stainless Steel
WADP-QSMSF
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25I15-16
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72H-8
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Power Integrity Analyzer Reference Solution
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The power integrity analyzer reference solution is a hardware-based solution with the Keysight Infiniium S-Series 10-Bit ADC oscilloscope and probes, including the N7020A power rail probe that lets you see the true AC power noise on your DC power line and supports up to +/- 24 V offset and the N2820A high-sensitivity current probe that can measure down to 50 uA.
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Product
The Nanoworkbench
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In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary.
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Product
Elevated 1.68 (4.00) - 7.00 (198.00) Bead Probe
BTP-1HC-7
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Nemo Active Probe
NTP10010A
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Keysight’s Nemo Active Probe is an ideal solution for performing automated, unattended large-scale measurements in key locations where people are using their smartphones and where it is critical to ensure excellent network service. Nemo Active Probes can be deployed discreetly in hotspots, vehicles, and fixed locations, such as airports, offices, campuses, and shopping malls as well as in moving vehicles, such as trains, taxis, delivery trucks, and ships.
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Product
Three-axis Fluxgate Magnetometer
TFM1186
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The Three-axis Fluxgate Magnetometer TFM1186 is a member of Metrolab's THM1176 family of 3-axis handheld magnetometers. It is a lightweight, low-power, go-anywhere fluxgate magnetometer. Outstanding noise characteristics make fluxgate magnetometers the instrument of choice for measuring minute disturbances in the local magnetic field, for example due to an iron mass or AC power-line noise. The TFM1186 has a range of ±100 µT and a resolution of 4 nT. The TFM1186 simultaneously measures all three axes of the magnetic field, so you get a true field strength reading no matter how you hold the probe. The entire instrument has been reduced to a cable with a few fat spots, which can plug directly into your PC or into a battery-powered handheld computer. 3-axis Teslameter Gaussmeter
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Product
Meter With pH Electrode, ATC Probe
ION 2700
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Intuitive, self-diagnostic and flexible with advanced set-up options for user-customization, the Eutech ION 2700 series comes with a large, one-glance-sees-all screen. View pH, ION or Redox reading together with temperature, electrode status, calibration points, date and time all at once!
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Product
MPI SiPH Probe Systems
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MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2H-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Screwdriver Probe Voltage Tester
SD-328H
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Easy and safeTests AC/DC voltage from 110-250VHandy pocket screwdriver is a fully functional voltage testerInsulated screwdriver shaftConvenient screwdriver tip and pocket clip
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Product
Vibration
VEGASWING, VEGAVIB, VEGAWAVE
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In point level measurement with vibrating level switches, a rod or a fork is set vibrating. When the vibrating probe comes into contact with the medium, the vibration changes and the vibrating level switch outputs a switching command. Vibrating level switches are used as overfill protection devices or low-level indicators in liquids as well as in granular and powdery bulk solids.
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Product
Test Thorn Probe
CX-41
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Thorn Probe For testing accessibility in appliances with visibly glowing heating elements.
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Product
MANIA TEST PROBE
SERIES 76
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ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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Product
Test Service Offerings
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ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Product
Manual Fixture Kit
230351 – CMK-02
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Coordinate Measuring Machines
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Novacam's 3D Non-Contact Coordinate Measuring Machines are designed with versatility and superior performance in mind: Precision (better than 1um) Speed (1-30 thousand measurements per second) Simultaneous dimensional and surface inspection Smallest probes measuring 0.9mm in diameter Automation by teaching with joystick Portability
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Product
Probe Card
VC43™/VC43EAF™
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VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Product
Magnetic Flaw Detector
CDX-Ⅲ
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magnetic particle flaw detector is the self-designed magnetic participle flaw detector of MITECH CO.,LTD. With small size, light weight, easy operation, multifunction in one unit. The detector can equip A, D, E O four types of probes to realize the functions of magnetic clamp detection, electromagnetic yoke detection, cross magnetic yoke detection, ring detection. It is the necessary detector to do quality control, safety check, life evaluation in the fields of petrol, chemicals, metallurgy, shipbuilding, aviation, railway etc
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Product
NI-9231 and cDAQ-9171 USB Sound and Vibration Measurement Bundle
865665-01
Sound and Vibration
NI-9231 and cDAQ-9171 USB Sound and Vibration Measurement Bundle - The USB Sound and Vibration Measurement Bundle with NI-9231 and cDAQ-9171 includes the NI-9231 C Series Sound and Vibration Input Module and the cDAQ-9171 CompactDAQ Chassis for sound and vibrations measurements. This bundle provides a portable, USB-based sensor measurement system that helps you measure signals from integrated electronic piezoelectric (IEPE) and non IEPE sensors such as accelerometers, tachometers, and proximity probes. The included NI-9234 features 8 channels with built-in anti-aliasing filters that automatically adjust to your sample rate. Additionally, the bundle supports simultaneous sampling and high dynamic range measurements necessary for modern measurement microphones and accelerometers.
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Product
Advanced Probe Card / V type
VC Series
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Japan Electronic Materials Corp.
*Vertical contact Probe Card*No limitation by Pad layout*Large probe area (Suitable for 200mm wafer 1-shot)*Small scrub mark*Suitable for High/Low Temperature Test
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Product
Temperature and Humidity Regulator
H3061-2
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Relative humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Product
DDR3 MSO Probes
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The DDR3 DIMM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR3 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR3signals for convenient analog probing.





























