Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Gridded DC Ion Sources
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Ion-assisted processes like sputtering, etching, and surface treatment depend on a beam that’s stable, uniform, and tightly controlled. Gridded DC ion sources make that happen, giving engineers the precision they need to fine-tune ion energy and current density for reliable results.
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Product
pH Ion Meter
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pH Ion Meters can be used in research institutions, and at a variety water quality related production sites in the mining, agriculture, forestry and fishery industries, for measuring the ionic concentration and various laboratories for the researches and drug manufacture processes. In addition, it is used in agriculture to measure the salinity levels of surface water and of soil samples and also measure the quality of water.
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Multiple Light Beam Safety Devices
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Leuze electronic GmbH + Co. KG
The multiple light beam safety devices of the MLD 300 (type 2) and MLD 500 (type 4) series are used for access guarding at machines and systems. The devices are available as 2-, 3- and 4-beam transmitter-receiver systems for large operating ranges up to 70 m and as cost-efficient 2- and 3-beam transceiver systems for operating ranges up to 8 m.
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Benchtop Ion Meters
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Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
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Product
Beam Bender BK7, Fixed Vertical-Bend Mount
E1834Z
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The E1834Z is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance vertical mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
Beam Bender BK7, Fixed Horizontal-Bend Mount
E1834M
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The E1834M is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance horizontal mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
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X-Ray Beam Monitors
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When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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Product
Single Beam Echosounder, Hydrographic Survey Boat
Z-Boat 1250
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Teledyne Oceanscience Z-Boats® are the number one choice for reliable, remotely controlled, hydrographic surveying in streams, rivers, lakes, and coastal waters around the world.Whether you need to reduce survey time, keep people safe during hazardous conditions, or access hard to reach locations, there is a Z-Boat to suit your survey and your budget. The Z-Boat 1250 is easy to operate. The integrated echosounder has an embedded transceiver with digital signal processing and outputs depth & temperature using NMEA 0183 data output.
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Product
67% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834J
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The E1834J is a 67% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
Ion Beam Milling Systems
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When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Product
Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Product
Economical Bending Beam Load Cells
EBB SERIES
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The EBB Series is a economical low capacity bending beam load cell suitable for use in a variety of industrial and OEM force measurement and weighing applications. It is made of an aluminum alloy and comes in 1, 2, 5 and 10 kilogram ranges.
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Product
Low Capacity Single Point Bending Beam Load Cells
LSP SERIES
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The LSP Series is a low capacity, low cost, high accurate single point bending beam load cell. It is ideal for OEM applications such as electronic scales and weighing machines. The single point design is highly resistant to eccentric loading allowing direct mounting to the scale base and weighing platform. The LSP Series features a moisture proof sealant.
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Product
Beam Directional Power Supply Mains 60 To 180 kV
SiteX D1802
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Our SITEX and SITEXS are capable of the direct and accurate measurement of high voltage. This essential information enables the control system to guarantee the stability and reproducibility of the radiological parameters based on true high voltage, ensuring extremely precise measurements-based utilization.
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Product
Ion Chromatography
Eco IC
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Discover Eco IC, an ion chromatography system that focuses on the essentials while not compromising on quality, robustness, and reliability. Eco IC has been developed to enable more users to benefit from this technique. Whether you need to perform routine water analysis or you’re looking for an instrument for higher education, Eco IC comes with all the components you need. In addition, you can also save time and reduce work by getting an automated system.
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Product
Spectro UV-Vis Dual Beam
UVS-2700
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Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
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Product
Chloride Ion Test Kit for Water
134W
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The Elcometer 134W is used to monitor recycled water (after it has been applied) to establish effectiveness of salt removal, this test is ideal for testing the salt contamination in wash water and blast water.
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Product
Bending Beam Load Cell
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Futek Advanced Sensor Technology, Inc.
Are the best fit for many measuring tasks. Here, the signal, on principle, depends on the bending moment.
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Product
Beam Bender
10726A
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The Keysight 10726A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This bare optic requires a user-supplied mount.
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Product
50% Beam Splitter
10701A
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The Keysight 10701A beam splitter is designed for beam diameters of 6 mm or less. It reflects one half of the total incoming laser beam, and transmits one half. The Keysight 10701A optic includes a housing for standard mounting.
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Product
Ultrasonic Angle Beam Probes For Weld Seam Testing
SONOSCAN W
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The ergonomic angle beam probes for Non-destructive Testing (NDT) from the SONOSCAN series inspect metals for cracks and inclusions. In the metal industry they are mainly used for weld seam testing. Our SONOSCAN probes are powerful, robust ultrasonic transducers which can be connected to all standard ultrasonic testing gauges.
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Beam and Singlepoint Load Cells
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We have trimmed all the non-essential fat off these load cells, however you can be sure that nothing has been trimmed from the actual load cells, they are precision tested and certified to meet all the exacting requirements on the downloadable technical specifications shown below.
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Product
33% Beam Splitter - BK7, fixed horizontal-bend mount
E1834E
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The E1834E is a 33% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
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The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
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Product
Ion Chromatography
Hyphenated Techniques
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Extend the scope of ion chromatography by interfacing your Metrohm IC with various sampling system and detection techniques
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Product
Beam Directional Power Supply Mains
SiteX CP200D
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Being just 20 mm longer than the CP160D, the CP200D represents the best compromise between high penetration (up to 42 mm for steel) and the capacity of the generator to fit with various NDT applications, such as inspections of more technical materials in the aeronautical or space industries. The CP200D is one of the most versatile generators on the market and thanks to its built-in multiple X-Ray output carrousel it will adapt to a very wide variety of NDT applications, without compromising in any manner its light weight (12 kg) and ease of use.
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Product
Beam Profiler
WinCamD series
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CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Product
50% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834G
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The E1834G is a 50% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
