Near-Field
1) EMF closest to the antenna. 2) Near-field optics.
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Product
Near-field Goniophotometer
RiGO801
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TechnoTeam Bildverarbeitung GmbH
Correct determination of the luminous intensity distributions (lid) of lamps and luminaires far within their photometric near-field range. Capture of ray data.
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Product
Near-field Chambers
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Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.
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Product
Near Field Probes 1GHz - 10 GHz
SX set
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The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Product
RF Near Field Probe Set DC to 9GHz
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EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
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Product
Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Product
Near Field Probes
MFA Family
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The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Product
Near Field Moving Detector Goniophotometer
LSG-1900B
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LSG-1900B Goniophotometer is near field Type C automatic goniophotometric instrument for luminous intensity distribution measurement. The LSG-1900B uses a constant temperature detector. It is for industrial laboratory photometric data measurements of small luminaires, such as down light, bulb light, etc.
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Product
Near Field Micro Probe Sets
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The near field probe is designed for a high-resolution measurement of electrical near fields.
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Product
Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
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The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Product
Near Field Micro Probe ICR HV H Field
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The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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Product
Near-Field Probes 100 kHz up to 50 MHz
LF1 set
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The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Product
Near Field Micro Probes ICR HH H Field
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The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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Product
Near Field Probes 30 MHz - 6 GHz
XF Family
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The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF2 set
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The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Near Field Strength Monitor / Bug Detector
NFSM-2000
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Locate and Identify Hidden Radio Transmitters with an all Digital Display, earphone and accompanied tool for finding hidden RF Wireless Cameras.
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Product
Near-Field Scanning Optical Microscope Platform
MoScan-F
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MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Product
Near Field Probes
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Anteral has extensive background in the design of Near Field Probes (open ended waveguides probes). Our Near Field Probes are currently being used in several laboratories around the world including the ESA's anechoic chamber. Anteral designs Near Field Probes from 10 GHz to 750 GHz covering the sectors requirements. Moreover, our Near Field Probes have a sharped design minimize reflections.
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Product
RF Near Field Scanner
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The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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Product
Antenna Test Chamber
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Comtest provides Antenna test ranges fully covered with microwave absorbers for both near-field and far-field measurements. Because we always strive for new solutions, our R&D department developed our ‘Javelin Tip’ polystyrene absorbers. The enhanced material composition and altered shape, lead to improved performance and cleaner working space, enabling you to make high precision antenna testing fast, reliable, and worry-free.
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Product
1050MHz Spectrum Analyzer
SM-5010
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Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Product
Scanner Probe
RFS set
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The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly.
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Product
1050 MHz Tracing Signal Generator
SM-5011
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is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Product
500Mz Tracing Signal Genrator
SM-5006
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is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
USB Magnetometer
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MultiDimension Technology Co.,Ltd.
A three-axis digital magnetometer that is intended for the measurement of magnetic fields near the probe tip at frequencies less than 250 Hz.
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Product
AMIDA VCSEL Tester
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AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Product
Testing Services
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Howland & Lawrence Chamber Services
RF shield testing: IEEE-299, MIL-STD-285, NSA 65-6CTIA CATL certification testing: Probe symmetry and amplitude ripple measurements following Test Plan for Wireless Device Over-the-Air PerformanceAnechoic material test, inspection, remediation: VSWR, inverse spherical nearfield testing of installed material and NRL arch screening tests of individual absorber pieces We can also provide in-process testing of welded steel shielded enclosures with a test technique based on ASME BPVC vacuum box testing—confirm quality of RF welds before the shield envelope is complete. We developed this method for testing the Navy’s Advanced System Integration Lab (ASIL) chamber at Patuxent River, shaving weeks off the construction/testing schedule.
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Product
Plane Wave Converter
PWC200
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The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
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Interference & Compatibility Evaluation System
ICEy
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Schmid & Partner Engineering AG
ICEy is the most advanced reactive near-field E/H-field scanning system for the analysis of EM interference and compatibility (EMI/EMC) in highly integrated electronics. ICEy is the only system that provides accurate EM measurements traceable to international calibration standards and also allows independent interlaboratory comparability of EMI/EMC measurement results.
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Product
Seismic Sensor
SmartPhone D
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Teledyne Marine Real Time Systems
The highly rugged encapsulated SmartPhone D was designed for use with the SmartSource controller, or SmartPhone D system, for real-time monitoring of near-field signatures.
