Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
-
Product
ESI(Electronics Systems Integration Unit)
MS 2004
-
The ESI subsystem provides platform interfaces like Gyro and on board Radar Blanking. This unit receives Analog and Digital GYRO inputs from ship and pre- trigger pulses from on board radars of the ship. This unit measures and provides the ship heading data to VARUNA ESM system. It also provides Heading, Roll and Pitch data to the ECM system. This unit also generates band wise composite ESM Rx. Blanking gates and provides all the required interfaces to ESM receiver, ECM System and System Controller units.
-
Product
High Current Electronic Load (600W-1200W)
ELCH600 & ELCH1200
-
- Low lead resistance <5m Ohm for Fuel-cell- Battery Testing- VFD display- High resolution 0.1mA/1mV- Voltage range 0V to 500V- Working mode CV/CC/CW/CR- OV/OC/OP/OT protection- Communication: USB/RS232/GPIB
-
Product
Measuring Microscopes, Image Processing
COMEF
-
Optik Elektronik Gerätetechnik GmbH
Image processing system.
-
Product
Electronic Equipment Testing System
-
The task set forth the need to create a special universal software core, the main tasks of which are the provision of measurement and control processes, as well as the interaction of software components intended for collection, visualization, mathematical processing and documenting of data. For each stand, specific program modules were additionally developed according to test methods specific products. The overall modular architecture of the system makes it easy to supplement and correct test algorithms.
-
Product
Programmable AC Electronic Load
63800
-
Chroma Systems Solutions, Inc.
The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing resulting in reliable and unbiased test results.
-
Product
Hi-Res Radar Scan Converter PMC
Eagle-2
-
Curtiss-Wright Defense Solutions
Eagle-2 is a high-performance radar scan converter from Curtiss-Wright Defense Solutions. Eagle-2 provides improved performance and support for high-resolution screen displays up to 2560 x 1600, including 2048 x 2048, making it the perfect choice for high-end radar display applications such as air traffic control (ATC) displays, VTS display command and control consoles, and radar head monitors.
-
Product
DC Electronic Load
63600 series
-
Chroma's 63600 series DC electronic loads are designed for testing multi-output AC/DC power supplies, DC/DC converters, chargers, batteries, server power supplies, and power electronic components. They are excellent for research, development, produc t ion, and incoming inspection applications. The 63600's state of the art design uses DSP technology to simulate non-linear loads using a unique CZ operation mode allowing realistic loading behavior. The 63600 series can draw its rated current under very low voltage (0.4V typical). This unique feature guarantees the best loading performance for modern Point-of-Load conditions and fuel cells.
-
Product
High Soeed CMOS System on Chip (SoC) Line Scan Image Sensor
LS4k
-
The LS4k is a high speed CMOS System on Chip (SoC) line scan image sensor optimized for applications requiring short exposure times and high accuracy line rates. It incorporates on chip two pixel arrays consisting of 2 rows with 4,096 7µm pitch pixels and 4 rows with 2,048 14µm pitch pixels respectively, a high accuracy (12-bit) high speed (84MHz) analog-to-digital conversion (ADC), and sophisticated on chip optical calibration for PRNU, DSNU, and lens shading correction.
-
Product
Rapid Automated Modular Microscope
RAMM
-
Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
-
Product
Boundary Scan Test
-
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
-
Product
Boundary Scan / JTAG Test Development System
onTAP Development
-
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
-
