Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Signal Analysis
Synchronous Accumulation (Order Analysis)
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Order analysis is one of the most convenient and efficient methods for diagnostics and balancing of rotating mechanisms and transmission gears. With an RPM sensor and a vibration sensor, it is possible to study the time characteristics of gear vibration signals. It is a well-known fact that a signal from a vibration sensor is affected by signals from other sources. To tune out from the disturbing signals, the synchronous signal accumulation method is used. For each shaft rotation, the RPM sensor provides a rotation mark. This signal serves as a triggering strobe for the vibration sensor signal sweeping. The obtained signal sweeps are combined. All the sources of the signals related to the shaft frequency (frequency of rotation) are accumulated and increased in the accumulator linearly proportionally to the N number of rotations. All other signals that are not correlated with the shaft frequency are accumulated proportionally to N1/2 and in case of a greater number of averagings, the useful signal exceeds the interference level.
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Product
Jitter And Eye Diagram Analysis Tools
DPOJET
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DPOJET is the premiere eye diagram, jitter and timing analysis package available for real-time oscilloscopes.Operating in the Tektronix DPO7000, DPO70000 and DSA70000 Series oscilloscopes. Jitter and Timing Analysis for Clocks and Data Signals. Real-Time Eye Diagram (RT-Eye™) Analysis*1. TekWizard™ Interface for One-Button and Guided Jitter Summaries.
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Power System Analysis Software
DSATools
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DSATools™ is a suite of leading-edge power system analysis tools that provides the capabilities for a complete assessment of system security, including all forms of stability. DSATools™ offers a complete toolset for power system planning and operational studies. In addition to rich modeling capabilities and advanced computational methods, the software is packed with useful study tools that enable significant productivity improvements.
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Ambient Temperature Vacuum Wafer Chucks
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6" (152mm) Vacuum Wafer Chuck for General Purpose Ambient Temperature testing with a Stainless Steel vacuum wafer surface
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Product
Sensor Placement & FEA Analysis
GageMap - GM
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APEX Turbine Testing Technologies
Apply strain gages and accelerometers to your finite elementmodel independent of the mesh anywhere you want, or letGagemap do it for you.
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Acoustics Analysis
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The sounds a product makes directly impact on user experiences. Sounds create strong emotions — positively or negatively — that reinforce brand identity. The difficulty of predicting acoustic results means that a single engineering mistake can prove costly to the final product, making Ansys Acoustics Analysis a powerful solution to ensure optimal acoustics and a successful end product.
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Trace Sulfur Analysis
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Some sulfur compounds are known to be not only hazardous but also catalytic poisons. ppb sulfur analysis is conducted by gas chromatography. The Nexis SCD-2030 is a next-generation sulfur chemiluminescence detection system. The dramatically enhanced sensitivity and reliability, the excellent maintainability, and the automation functions, a first for the industry, will improve laboratory productivity.
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
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Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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PathWave BenchVue Advanced Power Control And Analysis
BV9201B
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The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Complete Power Analysis System
PK3564
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PK3564 complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, and 1-year deluxe warranty.
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Product
Time Frequency Analysis Function
OS-0527
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This function can evaluate transient phenomena that were difficult to capture by FFT analysis, and display clearly time change of the frequency component while maintaining its frequency resolution . The OS-0527 is equipped with STFT (Short Time Fourier Transform) and Wavelet transform.
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Room Acoustics Analysis on iOS
RoomScope
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RoomScope turns your iPad, iPhone, or iPod touch into a room acoustics measurement and analysis tool. With RoomScope, you can measure a room impulse response and then calculate reverberation time, early decay time, clarity, and definition, as defined in the ISO 3382 standard. RoomScope also allows you to adjust the Schroeder decay curve integration limits with the touch of your finger and plot the calculated room parameters versus whole or 1/3-octave band center frequency.
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Product
Flexoplate Analysis
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Quality Engineering Associates Inc.
QEA has the most comprehensive and sophisticated lineup of evaluation tools for flexography, one of the fastest-growing sectors in commercial printing. Our test tools quantify flexo plates, film, masks, photopolymer- and metal-backed plates and sleeves, letterpress, newsprint and direct-engraved plates, as well as the final print.
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Product
Leak Analysis
Hiden LAS
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The Hiden LAS system is designed to analyze the leak rate from sealed packages, from a quality control or research and development perspective.
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Nucleic Acid Analysis And Protein Characterization
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Utilizing automated microfluidic capillary electrophoresis (micro-CE) technology, our instruments enable the user to simplify the process of traditional gel separations, resulting in even more accurate and reproducible data in a fraction of the time. Separate, identify and analyze genomic and protein samples in seconds and visualize your data as an electropherogram, virtual gel, or tabular report.
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Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
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The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Finite Element Analysis
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Response Dynamics Vibration Engineering, Inc.
An understanding of structural dynamics is very important to sound Finite Element Analysis (FEA). We have been performing FEA analysis for over 30 years and in most cases we have used experimental data to guide our modeling. While our engineers have had undergraduate and graduate courses in FEA, it is the years of modeling and analysis of existing structures that has taught us the most by forcing a thoughtful analysis of the key structural dynamics and then going though the process of making adjustments to boundary conditions, expanding the dynamics of the model in places, and making simplifications and approximations where possible.
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Surface Analysis and Materials Characterization Services
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The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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In-situ Wafer Temperature Monitoring
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CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
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Spectrum Analysis, Up To 43.5 GHz
S930904B
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The S930904B spectrum analysis adds high-performance microwave spectrum analysis to the N522xB/N523xB/N524xB PNA network analyzer family up to 43.5 GHz.
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Portable 4-channel Noise & Vibration Analysis System
WCAmini AD-3661
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* USB bus power unit * 24 bit, 4-channel measurement * A channel exclusively for tacho pulse measurements * WCAPRO (multi analysis software) * FFT analysis and real-time octave analysis * Tracking analysis and throughput recording/playback * Equipped with WCA Lite (easy-to-use analysis software)
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FTIR Analysis
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Anton Paar offers state-of-the-art Fourier-transform infrared (FTIR) instrumentation with the possibility to automate and connect to other Anton Paar benchmark instruments. It combines FTIR spectroscopy with comprehensive data analysis to provide rapid results and increase efficiency in the laboratory. A high-resolution touchscreen with a user interface inspired by modern smartphones enables operators to conduct the most intuitive FTIR analysis available on the market. Anton Paar’s FTIR specialists and a worldwide service network are ready to support you with your spectroscopy applications.
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Cloud-Based RF Signal Analysis Software
Cloud4Testing
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Our next-generation software as a service (SaaS) platform is an ideal choice for your test and measurement needs. With the R&S®Cloud4Testing, you can enjoy a quick and easy access to Rohde & Schwarz testing essentials without having to make a big investment. Simply measure, analyze and process your individual RF data, on demand and on the go.
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Wafer Inspection Products
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Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
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Telecommunication Analysis
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Software-Defined WAN for the Enterprise Securely connect users and applications while radically reducing hardware.
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Sensor Scene Modeling and Analysis Software
INSSITE
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INSSITE is a sensor scene modeling and analysis environment. Different sensor types and modalities, spanning radar (synthetic aperture radar [SAR], ground moving target indicator [GMTI], detection and ranging, radio frequency [RF] communications), visible/infrared (passive electro-optical/infrared [EO/IR], laser radar [ladar], thermal IR), can be evaluated against high fidelity scenarios constructed by the user.
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SampleStation And AuraSolution: Automated Analysis Software For MALDI-8020
SampleStation and AuraSolution
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The SampleStation and AuraSolution software link to the MALDI Solutions MALDI-8020 control and analysis software to analyze samples automatically based on a worklist.
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Single Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Single Wafer Transfer Tools
