Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Software Composition Analysis
SCA
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Black Duck® software composition analysis (SCA) helps teams manage the security, quality, and license compliance risks that come from the use of open source and third-party code in applications and containers.
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Product
Complete Power Quality Analysis System
PK4564-PRO+
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This system contains the essentials for almost any power quality study in the world. Other tiers in the PK4564 class include the standard PK4564 and PK4564-PRO systems.
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DSP System Design and Vibration Analysis
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Bridgenorth has experience in the design and implementation of a broad range of DSP systems. We offer consulting and design services in all aspects of DSP system design. Bridgenorth has worked on projects in the following areas
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XRF Analysis
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Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.
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Product
Satellite Carrier Reconnaissance and Analysis System
SCL-SACRAS
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Shoghi’s Satellite Carrier Reconnaissance and Analysis System (SCL-SACRAS) is capable of detecting Point-to-Point satellite links, which work for international Voice networks, GSM Abis backhaul links, IP links and VSAT networks of major VSAT manufacturers including iDirect, Hughes, Gilat, Eastar Romantis, Comtech; including the various types of proprietary protocols and services running on them.SCL-SACRAS can be utilized for the carrying out the detailed reconnaissance of satellite carrier frequencies running on various target satellites, for identification of target carriers for regular monitoring which are of the customer’s interest. Military or intelligence agency customers can utilize this system to identify the target links on respective satellites for continuous monitoring, using the Shoghi VSAT Monitoring System.
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Water Sodium Analysis
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The Navigator 500 Sodium analyzer provides a continuous measurement of the sodium ion concentration in demineralization plants and in the steam / water cycle of steam-raising plants.
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Rotating Machinery Analysis
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The Rotate software package is part of the m+p Analyzer Software for noise & vibration measurements and analysis. It provides a wide range of data acquisition and analysis tools for capturing and understanding noise and vibration induced in rotating and reciprocating machines by their motion. Fixed and variable speed machines are accommodated as are both structural vibration and condition monitoring diagnostics. Multiple tacho inputs can be processed for accurate speed tracking during analysis. Spectral mapping, order tracking, time history and orbit data analysis are all available.
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Audio Analysis
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The MCD AudioAnalyzer is used to test and calibrate analog and digital sound systems, or it can be used to convert analogue audio signals into digital form and vice versa. Also, the conversion of optical to electrical S / PDIF signals and vice versa can be done. The MCD AudioAnalyzer combines software (Toolmonitor MCD AudioAnalyzer) and hardware for the analysis and generation of analog and digital signals in the audio area.
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Advanced Data Collection, Display and Analysis Software for WIndows & Mac
PASCO Capstone
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PASCO is pushing the limits of technology, so you can push your students to their potential. Working closely with educators, we continuously develop Capstone™, making improvements and enhancing the teaching features. Capstone is designed to handle large data sets, high-speed sampling, and customized preferences to fit the needs of your lab. A straightforward user interface is approachable for beginners, yet Capstone offers all the capabilities needed for even the most advanced users. Our generous site license allows students to install PASCO Capstone on their own computers so they may perform data analysis off campus.
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Gas Analysis
Si-CA 030
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The Si-CA 030 offers everything heating engineers need to inspect and maintain residential and commercial boilers, with wireless connection to our smartphone app and automatic generation of servicing reports and certificates.
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Product
High Performance Isotope analysis of LC Separated Compounds
Iso CHROM® LC
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Elementar Analysensysteme GmbH
Unlike the existing LC-inlet solution via chemical oxidation, the iso CHROM LC works with high-temperature combustion. It quantitatively converts organic carbon to CO2.In addition, the easy-to-use iso CHROM LC shows outstanding precision, accuracy, and linearity without significant peak broadening that can diminish the chromatographic performance. In continuous operation, virtually all peaks in a chromatogram can be analyzed for the stable isotope ratios of carbon.
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Product
Liquid Analysis
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Comprehensive product range for all analytical parameters. Environmental protection, consistent product quality, process optimization and safety – just a few reasons why liquid analysis is becoming increasingly essential. Liquids such as water, beverages, dairy products, chemicals and pharmaceuticals have to be analyzed day in and day out.
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Low-overhead Coverage Analysis For Critical Software
RapiCover
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* Collect coverage for Ada, C & C++ (inc. MC/DC) on-host & target* Reduce test builds needed for analysis on constrained targets* Save time with efficient merge and mark verification workflow* Simplify verification by integrating with your CI tool* Produce evidence for DO-178 and ISO 26262 certification
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Spectrum Analysis For P50xxB Up To 32 GHz
S970906B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
Software For Data Analysis
Imc FAMOS
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Data source managementVisualization of measurement data at your fingertipsFull range of analysis functionsReport generation with direct PDF outputQuickly analyze large data sets with 64 bitMulti-layer macro creationProject managementLink data with dynamic maps or video
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Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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High Frequency Antenna Analysis Software
XGtd®
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XGtd is a general purpose ray-based electromagnetic analysis tool for assessing the effects of a vehicle or vessel on antenna radiation, predicting coupling between antennas, and predicting radar cross section (RCS). It is ideally suited for applications with higher frequencies or very large platforms where the requirements of a full physics method may exceed available computational resources.
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Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Analysis In Real Time
Live Analyzer
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Vibration Research Corporation
With Live Analyzer, you don’t have to wait until post-process to begin data analysis. View data in real-time and then pause the live stream to select, analyze, and export a section of the time waveform. Access the ObserVIEW graphing packages, employ averaging, analyze tachometer channels, and more.
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Real-Time Analysis up to 255 MHz, Basic Detection, Multi-touch
N9041B-RT1
Signal Analyzer
See, capture, and understand elusive signals as short as 17.17 s with 100% POI and a complete set of advanced triggers, up to 110 GHz View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 VSA software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Enterprise Class Network Analysis
Capsa
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Capsa network analyzer makes it easy to rapidly detect, isolate and resolve network problems. It captures all data transmitted over the network and provides a wide range of analysis statistics in an intuitive and graphic way. With Capsa's network traffic monitor feature, we can quickly identify network bottleneck and detect network abnormities.
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Occlusal Analysis with BiteForce DynamicsTM
T-Scan
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The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
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In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
DCA-M High-Accuracy, Low-Cost Solution for Optical Waveform Analysis
N1090A
Oscilloscope
The N1090A DCA-M builds on that legacy by using the high-performance elements of 86100 and 86105C. It can be configured to perform thorough optical transmitter compliance tests at a variety of standard data rates from 1.244 to 11.3 Gb/s and come with 20 GHz electrical channel in option.
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Tracking Analysis Software
DS-0322
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This software enables tracking analysis with high-speed (calculation speed: approx. at 20ms/4-ch), high-resolution (1000 blocks max.) and high-accuracy (more than 100dB dynamic range). It can plot rotation-tracking diagram during calculation, and also can set and plot the diagram of intended order or frequency after the calculation. *DS-0321 series FFT analysis software is required.
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Static Image Analysis System Particle Size
PSA300
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The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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CS/ONH-Analysis
G8 GALILEO
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All state-of-the-art detectors used in the G8 GALILEO are equipped with internal reference channels for utmost stability and allow detection limits in a sub-ppm range (based on 1g sample mass)
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Manual Contactless Wafer Detector
HS-NCS-300
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Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.





























