X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Network Surveillance System
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The network backbone contains a wealth of information that can be monitored and collected to support diagnostic, troubleshooting, and fraud prevention activities. Surveillance of network characteristics is becoming more important than ever before. Few important aspects of network surveillance include, Performance Monitoring, Security, Fraud Prevention, Physical Layer monitoring, Billing Verification, Remote Protocol Analysis, Failure Prediction, Traffic Engineering, Call Quality Monitoring and Troubleshooting.
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Batteryless System Logger
SKU-004-01
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The Batteryless System Logger is a unique device that was designed to log system data from any serial port, and store the data in the Logger’s non-volatile memory; this is done in the event of a system crash or power outage. The Logger is ideal for companies in the embedded appliance market.The System Logger connects to the embedded system via the serial RS-232 port. It continuously receives log info from the system, and stores this log info on an internal cycle buffer. This info can be retrieved via the serial interface at any time.
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Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Streaming System
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When intermittent errors need to be captured with high speed camera and streaming systems we offer mobile and fix installed systems combined with a powerful software. Slow down your fast processes and gain insight into what happens."
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Imaging Systems & Components
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Thorlabs offers a wide selection of laser scanning, widefield imaging, and OCT imaging systems, including multiphoton microscopes, confocal microscopes, electrophysiology rigs, swept-source OCT systems, and spectral-radar OCT systems.
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FPGA Systems
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Leverage our development platforms and rugged FPGA based systems that provide a rapid migration path from the lab to the field - without having to re-architect an entire system.
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Modular Breakout System 50-Pin D-type Plugin Module for 40-196
95-196-001
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The 95-196-001 Plugin Breakout Module is designed to be fitted to a PXI 40-196 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Emission Monitoring Systems
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Gasmet’s emission monitoring systems set the standard for accurate, reliable, and cost-effective gas analysis. Our state-of-the-art solutions are designed to provide precise measurements of gaseous emissions, making compliance with environmental regulations seamless. With a focus on continuous emission monitoring systems (CEMS), we deliver innovative technology that balances sensitivity, durability, and affordability. Our products are fully TÜV and MCERTS-certified, ensuring world-class quality and performance. Trusted globally, our emission monitoring solutions are the future of gas analysis, empowering industries to meet stricter environmental requirements effortlessly.
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System Amplifiers
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The perfect combination of high performance, wide bandwidth and low noise
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Dust Monitoring System
CDMS-1000
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CDMS-1000 is designed with light scattering technology for continuous real-time measurement of particulate concentration along with noise and meteorological parameters. This combination consists of a particle analyzer, camera, sound level meter, and GPRS module.
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Power-Switching Test System
High Voltage Switching Test System
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The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Field Inspections
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MISTRAS Group has evolved into an asset protection industry leader on the backbone of our expansive non-destructive testing (NDT) and field-testing portfolio.
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Multiparameter Measuring Systems
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With the Modulyzer measuring systems you can obtain multiple parameters from one sample in only one measuring cycle. Combined with Anton Paar sample changers you can even analyze a multitude of samples in fully-automatic, single-run mode. Select from pre-configured but modular options for your specific industry and application. Anton Paar’s Modulyzer measuring system setups are as individual as your requirements. No matter how many instruments you integrate in your individual configuration, Modulyzer is operated via only one screen and delivers all the results you need at the push of a button.
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Handheld Systems
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Ofil’s handheld systems aim at providing hi-end professional testing tools with distinctive features. Geared to simplicity and precision Ofil handheld corona detection systems are easy and intuitive to use, just as video cameras.
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Probe Based Systems
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The integration of additional measurement technology in probers enables you to flexibly expand the analysis options in the ongoing production process. With the introduction of our Automation Assistant software platform, we have therefore equipped a large number of probers with a wide variety of analysis tools.
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Functional Test Systems
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Acculogic offers commercial functional test systems for a broad range of manufacturing test applications, including automotive and military-aerospace.Designed for production testing, our solutions are optimized for throughput, reliability, repeatability, and cost
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Portable Test System
MT781
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Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Compact Baking System
LSC series
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HORIBA's best-selling baking system has been developed to meet the requirements of today’s high technology industries. Without the need of a carrier gas, the system can provide stable vaporization of materials such as TEOS (at a rate of 600 SCCM) and H2O (at a rate of 2 SLM). For ease of access all device maintenance can be performed from the front of the unit.
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Smart Aircraft System
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The Astronics Smart Aircraft System makes that possible. Our patented system enables the immediate, cabin-wide gathering of thousands of data points using sensors & IoT (Internet of Things) technology. The result? You get the insightyou need—when you need it. Insight that helps you on every flight. Insight that allows you to improve your operational efficiency, your cabin safety, and your overall passenger experience.
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X-Ray Systems
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X-ray and radioactive devices developed by AET, are widely utilized for medical, industrial and research use. The Compact Pulse X-ray Source can accelerate electron beams in a high-gradient electric field, to produce X-rays. Dose Calibrators are utilized for radioactive examinations and treatments in the medical industry.
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Non-Destructive Resonant Inspection Drop Test Fixture
RAM-DROP
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The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).
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3D Automated Optical Inspection Systems (3D-AOI)
3Di Series
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Saki’s 3Di Series applies cutting edge technologies to improve production efficiency and enhance production quality across the entire assembly line.
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Complete GPR System for Road Inspection
RoadScan
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Geophysical Survey Systems, Inc.
The RoadScan™ 30 system provides users with an effective tool for quickly determining pavement layers at high speeds. RoadScan is able to collect data densities not obtainable using other labor-intensive methods commonly used for pavement testing.
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Metrology Systems
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Metrology is essential to control, optimize and ensure the highest yield in semiconductor manufacturing processes. By implementing feedback loops, both process control and process parameter correction are enabled, which allow compliance to tighter process requirements. EVG's metrology solutions are optimized for lithography and all types of bonding applications, and use non-destructive measurement methods. Customers can choose between integration of the metrology technology within fully automated process equipment, or stand-alone metrology systems serving multiple process steps.
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Systems
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Our systems use an open and flexible architecture to create a platform allowing integration of technology and modules with short system set-up times which result in a reduction of costs.
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Vibrator Control System
FORCE-III
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The Force 3 Vibrator Control System is the newest generation of vibrator control system. It is designed to control individual vibes, or synchronize entire fleets of trucks. Using GPS, or VHF/UHF radio, for its time base the Force 3 both starts the Vibrator and controls its sweep with unparalleled precision and accuracy.The Force 3 is equipped with the latest ADC chips for better sweep resolution, increased computing power for faster response, GPS for precise source location, 8 Gbytes of internal memory for integrated VSS and PSS data storage, and integrated Wi-Fi for easy data offloading.
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Product
330 System
NSX
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With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
