X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Crash Simulation Systems
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The crash simulators are capable of reproducing a wide range of standardized and user-defined crash tests including advanced applications such as side impact and vehicle pitch simulation. Instron’s acceleration sled systems are used for the development and approval of vehicle safety systems, vehicle parts and also for the investigation of solids and structures during crash events.
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Optics Test Systems
Electronic And Visual Autocollimators
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Optik Elektronik Gerätetechnik GmbH
OEG GmbH specializes in the use of autocollimators, collimators and telescopes for special applications in optical measurement technology in the wavelength range from 380nm to 1550nm (SWIR).
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Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
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Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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Sulfur Analysis System
Model 6400TSG
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Teledyne Analytical Instruments
The 6400TSG series utilizes our field-proven ultraviolet (UV) fluorescence technology to continuously monitor the total sulfur content found in process gas and liquid feeds. UV-Fluorescence is a non-consuming method of detection, eliminating the hassles associated with replacing tape cartridges, and enables detection as low as 10 ppb, depending on application, with stable, reproducible results.
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Four-Port Tunable Laser System Source
N7714A
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The Keysight N7711A and N7714A tunable lasers are single-port and four-port sources, available with C-band or L-band wavelength coverage. The narrow linewidth and offset grid fine-tuning capability make them ideal sources for realistic loading of the latest transmission systems. All models can reach any wavelength point within their specified wavelength range just like all other Keysight tunable lasers. In this mode, code compatibility with existing test setups based on Keysight's range of full-size and compact tunable lasers is a great asset. In system loading applications, it may be preferable to grid-tune the lasers like system transmitters, simply by changing the channel index. The channel grid is adjustable to standard ITU-T grid spacing like 50 GHz, and to arbitrary grids. Likewise, the zero frequency (base channel) of the chosen grid is adjustable. A 12 GHz fine-tuning range allows de-tuning the frequency.
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XRF Systems
OEM Solutions
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Amptek offers a complete line of OEM detectors, preamplifiers, digital processors, and power supplies, and can work with you to help develop custom solutions unique to your needs. We provide established and emerging OEM customers a fast track to the market with our modular systems that will meet current needs, while being flexible enough to adapt to your product roadmap. The below options are typical configurations. Please contact us for custom solutions.
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Inspection Instrument for Indicators
i-Checker
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The i-Checker is specially designed to calibrate measuring accuracy of dial indicators, dial test indicators, and other electronic comparison gage heads with a stroke of up to 100mm (4").±(0.2+L/100)µm indication accuracy. Directly inspects an indicator with a stroke of up to 100mm (4"). The dial test indicator, bore gage and lever-type inductive head can be inspected with optional accessories. Adjustment of the measurement position is very easily accomplished because of semi-automatic measurement and full automatic measurement functions. Creates and prints out the simple inspection certificate. Saves inspection result as CSV file for reusable inspection result by any kind of software.
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Product
TVM Cybercast System
2000ST
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This portable data receiver decodes all standard VBI data formats plus the super robust EnXpress format at data rates from 4800 Baud to 115,200 Baud. The TVModem is rack mountable or stand-alone and features a compact, rugged enclosure for portable environments.
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Product
Universal Illumination System
NEW pE-4000
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NEW GENERATION LEDs The pE-4000 sets the standard as the universal illumination system for fluorescence microscopy. The system has 16 selectable LED wavelengths across 4 channels that can be matched to the filters and fluorophores of almost any microscope, making it the broadest spectrum of illumination available. The CoolLED pE-4000 now benefits from our award winning sustainable Green technologyand delivers enhanced intensity at your microscope sample plane with a significant reduction in energy consumption, and is supplied with a 3 year warranty after registration.
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Product
Preparative HPLC System Configurations
LC-4000 Series
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Three Platform Options: Up to 20 mL/min for columns up to 21.2 mm ID, Up to 50 mL/min for columns up to 30 mm ID, Up to 120 mL/min for columns up to 50 mm ID.
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Complete Systems
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Your expert for measurement and automation tasks. For measurement and automation tasks that have special requirements, Delphin delivers complete systems with options and functions to enable optimal adaptation to any application.
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LCD Display Optical Measurement System
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RayClouds Photoelectric Technology Co.,Ltd.
LCD display optical characteristics automatic measurement system is mainly used in LCD, LED screen, OLED screen, FPD, Mini LED, Micro LED and various new luminous materials.LCD display optical characteristic automatic measurement system supports the test of optical performance parameters such as viewing angle, luminance, uniformity, contrast, chrominance, response time, flicker, and refresh rate, etc.
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Product
Split-type Cable Fault Location System
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Weshine Electric Manufacturing Co., Ltd
Electricity networks have had to become more flexible, reacting more quickly to the changes and needs of higher performance. This demand for flexibility is especially true where multiple generation sources occur, such as the intermittent power from renewables like solar and wind energy. While modern SMART grid technology can quickly identify faults in sub-station and generating units, cable faults can still occur anywhere on the network.
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Vacuum Leak Test Systems
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Vacuum leak testing is the principal leak test method for testing parts that could have leakage from an external source into their housings and casings. Parts like underwater sensors or housings, outdoor electrical housings, sealed components, and components associated with vacuum sources are all prime candidates for vacuum leak testing. Operation of instruments that supply vacuum to test parts instead of pressure works in a similar, yet essentially opposite, manner as pressure decay testing.
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Product
Meter Test System
MTS-50
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Kongter Test & Measurement Co., Limited
This meter test equipment features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 50A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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Data Acquisition Systems
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Includes measurement devices, sensors, a computer, and data acquisition software.
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Vibration Test Systems
G-5 Series
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Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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Inspection & Metrology Platform
Neon
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Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in automotive, consumer, industrial and medical, and mobility applications.
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Product
Oxygen Sampling System
OxyTrans-SS
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The Edgetech Instruments Model OxyTrans is an easy to use, accurate and economical way to measure Oxygen at trace and % levels. A simple display and one point calibration allows for a quick start of the instrument.
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Plug-in Test Systems
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FAME is the innovative, modular plug-in test system for measuring and testing tasks in protection technology for medium-voltage and high-voltage switchgear. The plug-in test system combines complex switching operations for testing the function of current transformers and voltage transducers, as well as tripping and signal contacts.
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Occupational Noise Measurement System
NK122
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This Occupational Noise Measurement System is designed to give Health and Safety Managers, or any other professional with responsibilities for managing noise in the workplace, everything they need to protect your workforce from over exposure to noise and to help you ensure your company is complying with The Control of Noise at Work Regulations 2005.
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Particulate & Source Analysis System
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Encompass the identification of microscopic particles.
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Product
Circuit Breaker Test System
AutoScan
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AutoScan Circuit Breaker Test System is used for performing routine tests on circuit breakers and various other types of switchgear. This test system is designed to test vacuum circuit breakers, high voltage circuit breakers, and extra high voltage circuit breakers as per suitable standards.
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Imaging Gauge Software Test System
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The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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Product
IndiRAM GEM Identification System
ndiRAMTM Portable Series
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IndiRAMTM Portable Series Raman Spectrometer system for Gemmological studies is a quick screening system of the samples with high throughput.
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Product
Compact Manual Laser Repair System
LRS-2400
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LRS-2400 reads the defect data and navigates to the exact location of the defect. With a high power microscope the user can perform tasks as described below.
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Product
Automated Potentiometer Systems
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Measurements International Ltd.
Intrinsically Accurate Self-Calibrating Ratio Divider, Best Accuracy < 0.05 ppm, Built-in 20-Channel Scanner, Arbitrary Voltages from 1 mV to 1200 V, Bipolar Voltage Measurements, Calibration of Fluke 5700A/5720A, Calibration of 3458A and 8508A, Calibration of Voltage Ratio Dividers (F752A, MI 1340A, G7520), Linearity Calibration of Digital Volt Meters (DVM), Traceability to 10 V Zener Reference.
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Line Scan Vision System
In-Sight 9902L
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The In-Sight 9902L 2K line scan smart camera is a high resolution self-contained vision system ideal for detailed inspections of large, cylindrical, or continuously moving objects. The 9902L acquires up to 16,000 lines of 2,000 pixels per line to produce a 32MP image that can used to detect even the smallest features and defects. Each pixel line is acquired at 67,000 lines per second to keep up with the fastest production lines. This standalone vision system only requires a small view of the target part, making it an ideal choice for installations with restrictive field of view or mounting space requirements.
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Conveyor Decontamination System
Z-2000
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Food-grade controller and lamp housings designed to meet IP67 and NEMA 4X standards.
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3D RF Noise Measurment System
EMI-360
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3D RF Noise Measurement System EMI-360 to realize the new EMC measurement.EMC measurement is possible to realize a low-cost and time reduction.
