Surge Test
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Product
Battery Cell Surge Tester
19311
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The Chroma 19311 series battery cell surge tester is designed for testing the insulation quality between the positive and negative plates of the lead-acid battery cell. This is done by applying a high voltage surge/impulse before the electrolyte injection. Its output voltage can reach up to 6kV. It also has four terminal measurement and 200MHz sampling rate. The Chroma 19311 series has single channel (19311) and multi-channel (19311-10) tester.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Lightning Surge Generator
SKS-0510I
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Shanghai Sanki Electronic Industries Co., Ltd.
The lightning surge generator SKS-0510I fully complies with the new standards of IEC61000-4-5, EN61000-4-5 and GB/T17626.5; it provides pulse test voltages up to 10kV, which can meet the severity levels of various product standards; Covers the two surge waveforms specified in the standard 1.2/50ms (short-circuit current is 8/20μs) and 10/700ms (short-circuit current is 5/320μs), and a variety of internal resistances are built-in for customer use; Two kinds of surge waveforms, and built-in a variety of internal resistances for customers to use; AC and DC samples can be tested, the rated current can reach 32A.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Lightning Surge Simulators
LSS Series
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A simulator to reproduce “High energy induced lightning noise” which is induced by potential change on the ground, or done to power lines or telephone lines as result of lightning current.This immunity test is required by major standards including IEC61000-4-5 and JEC 210/212 and is widely used in many industries.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
Surge Testers
MTC 2
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Advanced automatic high precision electrical winding testers for testing products like alternators, stators, transformers, armatures and motors. Available as static or portable units from 6-50 kV.
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Product
C-Type Surge Generator
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Shanghai Guantu Technology Co., Ltd.
Surge generator is an electronic measuring instrument used in the fields of information science and system science, electronics and communication technology.
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Product
H-Type Surge Generator
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Shanghai Guantu Technology Co., Ltd.
Features of H-type surge generator1. LCD screen display, built-in computer control, man-machine dialogue, easy to operate.2. Program-controlled high-voltage power supply, high voltage stability and precision3. Imported non-inductive high-power resistors are used to ensure the consistency of surge waveforms4. The main switch adopts electronic switch discharge mode, and the output polarity is automatically switched
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Product
IMPULSE SURGE WINDING TESTER
VE2882A-5U
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Impulse Tester can detect turn & layer short ,the differences in the number of turns and the material of the core. If high impulse voltage is applied, the poor insulation will appear as a corona or layer discharge.
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Communications Test System for Frontline Diagnostics
ATS3000P
Test System
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Signature Surge Tester
TSM
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Compact cabinet that contains a multi-position carry/tilt handle and a rear plastic snap-on cover for cable storage and transportation in the shop or in the field. Tektronix TDS1002, 1 Billion Samples/sec, real time, programmable, storage oscilloscope and includes a built-in 3 phase test selector switch that facilitates 3 phase motor testing by mechanically re-positioning the ground terminal.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
Surge and Transient Protection
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Our surge and transient protectors are safety approved for instance for ATEx. The series cover both AC and DC instrumentation, and is retrofit, so already installed instrumentation can now use the extra high protection rate of up to 20 kA.
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Product
Compact Functional Test System
E2230C / TS-5040
Functional Test
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Surge Power (Joule Rating 342) (10) 5-20R 0U V/H
EPSS-1020-HV
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EPSU Power (Basic / Surge / Metered / Value) – rack mountable power distribution, 120V, optional surge suppression, and amp meter
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Surge Generator
CFL SG 0810
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SCOPE offers CFL SG 0810, Surge Generator with output of 8kV and 1000 Joules. It is ideal choice for fault location on all types of power cables from LV to MV. CFL SG series is equipped with different Protections, Interlocks and Auto-discharge facility to ensure user safety during operation. User friendly controls, adequate form factor, contact free HV terminations makes this CFL SG series most durable and best-designed sets in the segment
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
