LED Test
See Also: Flicker Analyzers
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Product
Vertically Falling Water Drops Device IPX1/2
IEC60529
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Shenzhen Chuangxin Instruments Co., Ltd.
This device is designed according to terms and conditions of IEC60529,GB4208-2008,GB7000.1-2007,GB4706.1-2005.Satisfying requirements of level IPX1/2. Applide to test LED lamps and house hold appliances, and other electric and electronic products waterproof test of IP code level IPX 1/2.
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Product
Infrared LED Analyser
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The IR LED Analyser has a unique fiber which has been specially selected and prepared and must be used in conjunction with the Feasa Optical Head that was specifically designed for Infrared LED Testing.
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Product
S2 Penta High-Sensitivity Sensors
ULP S2 PCI/V HS
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The Universal LightProbe S2 Penta High Sensitivity Sensor features the same popular built-in color binning as the regular S2 Penta Sensor, and is designed test extremely dim LEDs, providing an analog output for intensity, ranging from 0 to 4 volts, corresponding to the LED’s luminous intensity in millicandelas. Implemented in a unique and customizable 2-Part solution, the S2 Penta High Sensitivity Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longTypical response times: <1.2s color & intensity outputs simultaneously (the brighter the LED, the shorter theresponse time)Fiber-Optic Probes: Wide Aperture Fiber-Optic Probe recommended
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Product
S2 Spectra Sensors
ULP-S2 WBI/V
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The ULP S2 Spectra Sensor tests for LED intensity, and for any color in the visual spectrum, plus white. The S2 Spectra Sensor is well-suited for the test of “boundary” color LEDs, as it can unambiguously and repeatedly distinguish between not only adjacent visual colors such as green and yellow, but it can determine different hues of the same color such as yellow and amber, regardless of LED intensity. Implemented in a unique and customizable 2-Part solution, the S2 Spectra Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Output Loads: ‘Int.’& ‘Color’- 2Kohms min., 100pF max.Sensor Size: 0.560 in. dia x 1.38 in. long.Typical response time: Typical response time: <10mS capture time; <100mS overall response timefor color and intensity simultaneouslyFiber-Optic Probes: Can be paired with any Universal LightProbe Fiber-Optic Probe
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Product
S2 Unicolor Sensors
ULP-S2 SCI/V
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The Universal LightProbe S2 Unicolor Sensor is designed for the intensity test of any single one of the five main LED colors (blue, green, yellow, orange, and red) plus white and Infrared (700nm to 1,000nm). Implemented in a unique and customizable 2-Part solution, the S2 Unicolor Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsSignal Output Loads: 20 mA max. Non-inductive.Output Pins: 3 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longOperating Temperature Range: 0hC to 70hCTypical response times:<10mS capture time; 65mS overall response time; intensity output of correct color only.Fiber-Optic Probes: Can utilize any Universal LightProbe Fiber-Optic Probe
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Product
S2 Spectra USB Sensors
ULP S2 SPECTRA USB
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Universal LightProbe S2 Spectra USB Sensors test a wide range of LED intensities and any color in the visual spectrum, plus white, providing a linear response with a serial digital output via a PC. A standard USB Cable is provided to connect to a mini-type B five-pin USB connector, which is integrated into the S2 Spectra USB Sensor.Operating temperature range: 0oC to 70oCOutput Port: A standard mini-type B five-pin USB connector is integrated into the S2 Spectra USB Sensor,and a standard USB Cable is provided to connect to a USB portSensor Size: 0.560 in. dia x 1.38 in. long.Typical response time: < 10mS for color and intensity as a serial bit- stream (19200 baud rate)Fiber-Optic Probes: Can be paired with any of a wide range Universal LightProbe Fiber-Optic Probes
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Product
Universal LightProbe S2 Sensors
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Optomistic Products’ Universal LightProbe S2 Sensors are designed for the In-circuit, Functional or Finished Product test of an LED’s color and/or intensity. Implemented in a unique and customizable 2-Part solution, the S2 Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.
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Prototyping & Test Consulting Services Solutions
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Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
S2 Penta Sensors
ULP-S2 PCI/V
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Optomistic Products’ best-selling Sensor, the ULP S2 Penta Sensor, is relied upon for its versatility in accommodating most LED color and intensity test applications. Implemented in a unique and customizable 2-Part solution, the S2 Penta Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption:Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Loads: ‘Int.’& ‘Color’- 2Kohms min., 100pF max.Output Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longTypical response times: Typical response time: <10mS capture time; <100mS overall responsetime for color and intensity simultaneouslyFiber-Optic Probes: Can be paired with any Universal LightProbe Fiber-Optic Probe
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Product
TestStand
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TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
Wireless Test Standards Software
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Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Sealed Beam Bulb Testing System
H710019SSL
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EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Functional Test System
TS-5040
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The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Functional Test for Engineering Lab
Spectrum BT
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Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
EMI Test System
TS9975
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The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Electronics Functional Test
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Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
EV Power Components End of Line Test Platform
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Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
Disk Drive Test System
Saturn
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The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Parallel Electrode SMD Test Fixture
16192A
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The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
Hybrid Single Site Test Handler
3110
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Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
H(3)TRB & HTGB Test Systems
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SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Single Site Test Handler
3210
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Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Automotive Ethernet Test Fixture
AE6941A
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The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Digital Test Instruments
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Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
