Test Connectors
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Product
78-Pin D-Type Female Without Backshell
92-960-078-F
D-Sub Female Connector
This connector is designed to allow users to directly terminate cables with soldered connections. 78-Pin Female connectors can be directly mated to a corresponding Pickering Switching Module.
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Product
EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
68-Pin Micro-D Male Solder Bucket With Backshell
40-962B-068-SB-M
SCSI Male Connector
This connector is designed to allow users to directly terminate with soldered connections to the 68-Pin SCSI Style Micro D connector. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Product
96-Pin SCSI Micro-D Discrete Wire
40-962-096-F
SCSI Female Connector
This connector is designed to allow users to terminate discrete wires with IDC connections to the 96-Pin SCSI Style Micro-D connector. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
3-Pin Power D-Type Connector, 40A, Female PCB Mount
40-963-003-RF
D-Sub PCB-Mount Connector
This connector is suitable for Pickering Interface's modules that use the 3-Pin Power D-Type connector. It is designed to allow users to make a termination via a PCB.
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Product
In-Circuit Tester
Sparrow MTS 30
In-Circuit Test System
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
PXI Functional Test System
U8989A
Functional Test
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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Product
25-Pin D-Type Female Connector Block
40-965-025-F
Connector Block
This connector block provides a simple method of connecting to 25-Pin D-Type connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. PTFE cables are recommended for use with this connector block to maximize copper cross-sectional area and insulation properties. Connector blocks have higher losses than a cable connection and the breakdown voltage is controlled by clearances to the metal shell. The metal shell includes an internal insulation barrier under the carrier board.
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Product
USB to VGA Adapter with Retention, USB Type-C Male to VGA Female, 0.5m
143557-0R5
USB Connector
24-Pin USB-C 3.1 Male to 15-Pin VGA Female, 0.5 m Display Cable - The VGA15F-USB24M Cable for CompactDAQ and CompactRIO controllers and chassis features a male USB-C connector and a female VGA connector.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
Product Support Equipment
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The TTU/515E or O/I Level Test Set was developed to provide a full end-to-end test of the NACES and FAST electronic sequencers used on the NACES ejection seat. The O/ITS provides simulated inputs and measures the timing of initiator firing sequencer outputs. The O/ITS, via a serial channel in the test connector, performs discrete element diagnostics on all the sequencer's redundant electronics and verifies its full functionality.
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Product
37-Pin D-Type Male Solder Pin HV
92-960-037-MHV
D-Sub Male Connector
This accessory is designed to allow users to directly terminate a cable with soldered connections. When the product is used without a backshell users should make their own cable strain relief arrangements and ensure appropriate electrical safety precautions are observed.
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Product
26-Pin D-Type Female Straight PCB Mount
40-963-026-SF
D-Sub PCB-Mount Connector
Accessory allows a user to create their own PCB based termination solution mounted directly on the front of the product or on the end of a cable. Interfacing PCBs should be designed with suitable clearances for the voltage the application requires.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
200-Pin LFH Connector, Female, UNC Male Screwlocks, With Backshell
C200LFR-2SP-5A
LFH Female Connector
This connector is designed to allow users to directly terminate with soldered connections to the 200 pin LFH connector.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Test Fixture
Stopper kit includedYAVCANCON2 for fixture identification not included
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
96-Pin Micro-D Connector Block, Female With Backshell
44-965-096-F
Connector Block
This connector block provides a simple method of connecting to high density 96-Pin SCSI Style Micro-D BRIC connectors. The screw terminals accept wires up to 20 AWG and use a rising cage screw clamp mechanism to minimize risk of copper strand breakage. The metal shell includes an internal insulation barrier under the carrier board.
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Product
Automotive Ethernet Test Fixture
AE6941A
Test Fixture
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
37-Pin D-Type Female Connector Block
40-965-037-F
Connector Block
Suitable for use on the front of modules this connector block provides a simple method of connecting to 37-Pin D-Type connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. When the product is used without a backshell users should make their own cable strain relief arrangements and ensure appropriate electrical safety precautions are observed.
