Wafer Level Reliability
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Enabling Low Power, High Reliability, And High Performance Design
Lattice Nexus Platform
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The Lattice Nexus FPGA platform combines Lattice’s long-standing low power FPGA expertise with leading 28nm FD-SOI semiconductor manufacturing technology. With this platform, Lattice enables the rapid development of multiple device families that deliver low power, high performance, high reliability and small form factor.
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Product
Sound Level Meter
SoundExpert LxT
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The Larson Davis SoundExpert LxT Sound Level Meter is a full-featured meter designed for general product evaluation and noise monitoring applications. SoundExpert LxT comes with a graphic display and a fixed set of firmware options applicable for these applications. It is available as a general hand-held meter or data acquisition tool and also in a short-term noise monitoring kit. The meter expands upon the Larson Davis tradition of delivering value, innovation and function in a rugged, single-handed package, and is backed by our 2-year factory warranty, 24-hour application support, and accredited factory service/calibration.
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Product
Shield Level / Pathloss Equipment
PAMS & PAMS-C
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PAMS is a user-friendly, transmitter and receiver system that measures shielding effectiveness in RF shielded enclosures. Lightweight and compact, each PAMS unit measures approximately 12” x 5” x 5” and weighs 5.5 lbs., making PAMS ideally suited to field measurement tasks. Rugged construction insures instrument survivability in a field test environment. PAMS-C is a simple and efficient solution for quickly identifying shielding faults in an RF shielded enclosure. Cousin to the original PAMS used extensively by customers operating RF Shielded Enclosures, PAMS-C gives commercial end-users everything needed to measure shielding effectiveness levels of critical infrastructure - all with minimal or no interruption to normal operations.
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Product
Combinated Sound Level Meters
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PeakTech Prüf- und Messtechnik GmbH
Combines a sound level, lux, air humidity and a temperature measuring device. It is therefore ideally suited for professional and private use. The sound level meter enables dB measurements and the determination of sound level ratios.
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Product
Sound Level Meters
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Larson Davis manufactures a wide range of Advanced Sound Level Meters to meet all your environmental noise monitoring application needs.
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Product
Universal II Level System
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The Universal II is a two wire level transmitter that eliminates the need for line power in the field and saves costs for additional hardware. It provides reliable level measurements in all kinds of process liquids, slurries, granulars and interfaces.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Signal Level Meter
SLM-5870
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Compact, light-weight, easy to carry With dual-channel measurement display Channel and single frequency mode
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Product
Radar Level Transmitter
DR6400
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The DR6400, FMCW 24-26 GHz open air radar is a market entry level transmitter for solids from granulates to rocks. This model has proven PP Drop antenna design which is insensitive to product build-up.
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Product
Data Collector for Water Levels
DCX-22 AA
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KELLER AG für Druckmesstechnik
The data collector DCX-22 AA measures and records ground water levels using KELLER's two sensor AA-technology (absolute-absolute). The submersible depth sensor measures the water level. Barometric pressure variations are measured and compensated with the built-in waterproof air pressure sensor which is mounted in the electronics housing at the top of the borehole.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Fault Level Monitoring
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The fault level or fault current is the maximum current to flow on a network in the event of a fault.
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Product
Class 1 Sound Level Meter
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Dewesoft class 1 sound level meter is the golden standard for sound and noise measurement. They are extremely easy to set up and friendly to use. Maximum accuracy is assured with certified compliance with international standards. The Dewesoft sound level meters are always at the heart of sound analysis and are suitable for any sort of acoustic measurement.
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Product
Ultrasonic Level Sensor
2270
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The type 2270 is a rugged, high performance ultrasonic level measurement sensor, having transducer and processing electronics incorporated in one single housing. It provides all the sophisticated echo detection features of the well accepted 2260 Ultrasonic Level Transmitters.
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Product
800MM 31.5In Digital Level Bevel Gauge w/ LCD Backlight Screen, Level Bubbles IP54 Standards
DL411
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Advance Plus Trading Co., Ltd.
Model Number: DL411 Key Specifications/Special Features: 800MM 31.5INCH Digital Level with level bubbles, 2 hand shanks, LCD bright backlight display, IP54 standards 1. 800mm 31.5inch level with 2 bubbles, 800*28*64mm（L*W*H）, net weight: 700g;2. Resolution: 0.05°;3. Horizontal level measuring range: 0 to 360°;4. Accuracy: ±0.3°;5. Measures angle in degrees, IN/FT, mm/m, % slope or pitch;6. Audible tone at level, plump and setting angle;7. Automatic shut-off after 3 minutes;8. Backlight LCD;9. Self checking accuracy;10. Self calibration;11. Hold-function to freeze the measurement;12. Memory recall (9 measurements);13. 2pcs Handshanks design, easy to take and use;14. 2pcs high accuracy horizontal & vertical bubbles, clearly to check;15. Operated by DC 3V (2*LR03 AAA 1.5V batteries, not included); 16. IP54 waterproof & dusyproof industrial standard.
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Product
Sound Level Meters
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Advanced technology ensures the accuracy and stability of the sound level meter.
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
Non-Contact Level Transmitters
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Three operate at 24 GHz and three more at 80 GHz which complement the existing 6 GHz and 10 GHz devices. They will appeal to a wide range of industries from chemical and petrochemical to mining, minerals and metals processing and cover liquid and solid applications.
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Product
Class 2 Sound Level Meter
SP79
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The SP79 is a Class 2 sound level meter for on-site measurements in accordance with Noise at Work legislation in industrial and office environments. Featuring A and C frequency weighting and fast and slow time weighting, the compact design can be handheld, or mounted on a tripod for longer term monitoring of Min / Max values. Detailed recording and analysis can be made using the AC and DC outputs. The SP79 complies with BS EN 61672-1:2003 and is supplied with a detachable windshield and hard carry case. The large high contrast display includes both digital reading and analogue bar graph. An optional Class 2 sound level calibrator is available to verify accuracy before and after readings in accordance with international standards. The SPC70 is simple to use and provides a 1kHz reference at 94dB and 114dB.
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Product
Level measurement with radar sensors
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Radar sensors have long been used in level control because they provide reliable measurements even in conditions of dust, steam, smoke, extreme temperatures and strong pressure fluctuations. With OndoSense's innovative radar technology, level measurement is now possible for the first time with a measurement accuracy in the micrometer range in harsh environments.
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Product
Sound Pressure Level Meter
Castle Sonus GA116E
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The Castle Sonus GA116E Sound Pressure Level Meter is the ideal handheld instrument for all your environmental noise measurements to BS 4142:2014 standard for Rating and Assessing Industrial and Commercial Sound.
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Product
Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
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*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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Product
Wafer Demounting And Cleaning Machines
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Demounting and cleaning to high throughput fully automatic ingot after cutting in the slicing machine and wire saw.
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Product
Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Product
Bare Wafer Inspection System
LS-6700
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Hitachi High-Technologies Corp.
High sensitivity (50nm:Bare). High accuracy for COP/CMP discrimination (85%). High throughput (80 wph @300mm).High positioning accuracy (+/-30m). Wafer Size 300mm / 200mm.
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