Electron
-
Product
Electron Sources
-
SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
-
Product
Electron Probe Microanalyzer
EPMA
-
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
-
Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
-
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
-
Product
Ion & Electron Detection
-
Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
-
Product
Transmission Electron Microscope
TEM
-
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
-
Product
Electron Spectrometers
-
SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
-
Product
Electron Probe Microanalyzer
EPMA-1720
-
Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
-
Product
TERAHERTZ HOT ELECTRON BOLOMETER DETECTORS FROM 0.1 to 70 THz
-
Insight Product Company offers ultrafast superconducting hot-electron bolometers (HEBs) operating at terahertz frequency range. from 0.1 to 70 THz. Superconducting hot electron bolometers HEBs are designed to detect and register the electromagnetic radiation pulses in the frequency range from 0.1 THz to 70 THz.
-
Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
-
Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
-
Product
Electron Microscope Sample Preparation
-
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
-
Product
Scanning Electron Microscope (SEM)
Prisma E
-
Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
-
Product
Electron Microscope Analyzer
QUANTAX WDS
-
The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
-
Product
EQE/Photon-Electron Conversion Testing
-
Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
-
Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
-
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
-
Product
Linear Electron Accelerators Where Electrons Reach Energy Of Up To 10 MegaWatt
-
*Processing polymer materials and modifying their parameters*Processing semiconductor materials and devices*For treating food products for disinfection, eliminated bugs, pathogens, and micro-organisms, and increasing their shelf life*Processing diamonds, precious stones and semi-precious stones to change their color
-
Product
Scanning Electron Microscope
E5620
-
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
-
Product
Scanning Electron Microscope
Verios G4 XHR SEM
-
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
-
Product
Electron Microscope Analyzers
-
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
-
Product
Auger Electron Spectroscopy (AES)
-
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
-
Product
Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
-
HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
-
Product
Electron Probe Microanalyzer
EPMA-8050G
-
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
-
Product
Electronic Calibration Module (ECal), 67 GHz, 1.85 Mm, 2-Port
N4694D
-
The Keysight N4694D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4694D is a precision 2-port ECal module that supports 1.85 mm connectors up to 67 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4694D is included for securing your ECal module and accessories.
-
Product
4kW Electronic Load
PT04-48
-
For Telecom Rectifier and Power Supply testing. This model has been developed to accommodate testing of both 48V and 24V telecommunications power systems or Power Supplies. It is also useful as a general-purpose variable Load. Its founding principle is simplicity – ease of use, enhanced reliability, greater value for money and wider applicability.
-
Product
Electron Multipliers
-
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
-
Product
ELM Electronic Load Module
-
Circuit breakers are often overlooked during maintenance of electrical systems in aircraft, or often only verified for open and closed states. To test the true functional purpose of a circuit breaker it requires the application of current in excess of the rated trip value and then measure the time for the breaker to actually trip. This is the only way to verify that a circuit breaker will react as designed if an electrical failure occurs.
-
Product
Testing & Programming Solution - Electronic Assemblies
BARCUDA VP230
-
The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.
-
Product
I²C/SPI Interface Device
-
The I²C/SPI Interface Device is a master or slave interface for inter-integrated circuit (I²C), or master interface for serial parallel interface (SPI) devices. With plug-and-play USB connectivity, the I²C/SPI Interface Device is a portable solution to communicate with consumer electronics and integrated circuits. The I²C/SPI Interface Device can be physically located more closely to I²C/SPI devices than PCI interfaces, reducing I²C bus length and minimizing noise problems. The I²C/SPI Interface Device supports I²C rates up to 250 kHz and SPI rates up to 50 MHz, and it also includes eight general-purpose digital I/O lines for a variety of applications, such as configuring the address of I²C devices or toggling LEDs.
-
Product
Flicker Measuring Probe for LCM ATS
A712306
-
The Chroma A712306 Flicker Measuring Probe for LCM ATS is specifically designed for adjusting the flicker on LCM automatically following the FMA(Flicker Modulation Amplitude) standards defined by VESA (Video Electronics Standards Association) and JEITA (Japan Electronics Information Technology Industries Association) for flicker measurement.
-
Product
OEM, Embedded, and Custom Electronics
-
Picosecond timingPrecision analog and mixed signal processingDigital delay and pulse generationHigh speed photonics and fiberoptic timing distributionAerospace instrumentation and simulation
-
Product
PXI 12-Slot BRIC Matrix, 504x12 1-Pole (12 sub-cards)
40-558-121-504X12
-
The 40-558-121-504x12 matrix is part of a range of BRIC ultra-high-density large PXI matrices are available in 2, 4, 8 or 12-slot PXI sizes to suit all high-performance matrix requirements and are constructed using Pickering Electronics' 4mm x 4mm instrumentation quality reed relays.
