Interface Test Adapters
Interface Test Adapter; Interface Connector Adapter: Interface Device Also known as: ITA
See Also: Test Adapters, Interface Adapters, ITA
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Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
Power Adapters
ADP-PS-433
Power Adapter
The ADP-PS-433 power adapter provides power and reset buttons as well as an easily accessible power connection to the WINSYSTEMS SBC35-427 single board computer. This power connector offers a highly reliable and secure connection to the external power supply allowing easy access to physically remove power from the front I/O panel.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2 x 68-Pin FML VHDCI
510150126-1
PCB Adapter
Single PCB adapter p/n 510150126 ships with 2 x 68-pin VHDCI male double-ended 2m cables, packaged separately. Available PXI card solutions for NI PXI-2535 and PXIe-7868.
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HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Digital/Pattern/PE Card
PEMU32
Interface Card
The PEMU32 represents a new level of MULTIFUNCTION for PXI-based instrumentation. Based on the proven architecture of the PE32, the PEMU32 offers high voltage PMU/DPS and pin electronics in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (8 boards). The PEMU32 also supports deep pattern memory by offering 32 M of on-board vector memory with dynamic per pin direction control and with test rates up to 10 MHz.
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NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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FADEC/EEC Test Platform
Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Interface
RAR-USB
Interface
The RAR-USB is further evidence of Abaco Systems’ commitment to making available avionics solutions that are powerful and flexible, and that respond to the needs of customers.
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SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Ethernet Module
M4K-ETH
Ethernet Interface
The M4K-ETH is an intelligent Gigabit Ethernet interface module for the multiprotocol Excalibur 4000 family of carrier boards. The module supports 10Mhz, 100Mhz and 1Ghz Full Duplex UDP/IP Ethernet.
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Product
PXI Pull-Thru Adapter, Wired, Micro Coaxial, 18 MCX Plugs and 2 SMB Plugs
510140119
Pull-Thru Adapter
PXI Pull-Thru Adapter, Wired, Micro Coaxial, 18 MCX Plugs and 2 SMB Plugs
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Digital Functional Test
CTS100i
Functional Test
Capable of performance testing to defined traceable standards, CTS100i is designed to test Military, Aerospace and Safety-Critical equipment. CTS100i is a cost-effective digital functional test system, available in single, dual and three bay versions.
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Product
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to 2x68 Male SCSI Connectors
510150125
PCB Adapter
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Male SCSI Connectors
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Regenerative Battery Pack Test System
17020E
Test System
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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PCI Express Host Interface SSD/Drive Decode Support
Interface
Teledyne LeCroy provides NVM Express, SATA Express and SCSI Express protocol decoding, analysis and test equipment to SSD storage companies worldwide. It works closely with the following organizations providing equipment to its members and conformance programs.
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Product
Communications Interface PCB Adapter
YAV9COM6
PCB Adapter
6 x Sub D-91 x RJ451 x 2 terminal block
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FEC Accelerator Based On Intel® VRAN Dedicated Accelerator ACC100
PCIe-ACC100
Interface Card
ADLINK’s PCIe-ACC100 is a PCIe interface accelerator adapter developed based on Intel's vRAN Dedicated Accelerator ACC100 eASIC chip. It supports 4G and 5G codec acceleration, checksum rate matching, onboard 4G ECC memory, and hybrid automatic repeat request technology (HARQ). The PCIe form factor HHHL (half-height, half-length) can meet the needs of most application scenarios.
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Product
Multi-Channel 1553 Interface for PCI Express 4 Lane Systems
PCIE4L-1553
Interface Card
Alta Data Technologies’ PCIE4L-1553 interface module is a multi-channel (1-4), ½ size, 4 Lane PCI Express 1553 card supported by the latest software technologies. The PCI Express card is based on the industry’s most advanced 32-bit 1553 FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET (MSVS 2005/08/10 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and reduces integration time.
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Product
Enclosure, 9025TR, Front Mount, Sloped, 15" Depth
410114004
Enclosure
-Due to depth and probable weight of this enclosure, VPC recommends use of this enclosure with the TR model of the 9025 (platform). -When using this enclosure to mate with a standard 9025 Receiver (non-TR/platform), ITA p/n 410104260 with 2" depth must be used for proper clearance.
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Enhanced Serial Interface Module for the Multiprotocol Excalibur 4000 Family of Carrier Boards
M4KSerialPlus
Serial Interface
The M4KSerialPlus is an enhanced serial interface module for the multiprotocol Excalibur 4000 family of carrier boards, that includes several advanced features such as a high baud rate and high throughput. This module supports up to four independent channels of serial communications, each of which can be selected as RS-485, RS-422 or RS-232. The module operates independently of the host computer, reducing the need for host intervention.The M4KSerialPlus module is based on the Exar XR16M570 Universal Asynchronous Receiver/Transmitter (UART). The device is compatible to industry standard 16550 UARTs. Each of the M4KSerialPlus’s four channels contains a transmit FIFO capable of holding up to 16384 bytes and a receive FIFO capable of holding either 16384 receive bytes or 5460 bytes with a 32-bit Time Tag associated with each byte. These large buffers allow application code to transfer large quantities of data with a single non-blocking subroutine call. The 32-bit Time Tag on receive channels is very useful for synchronizing serial data with data from other modules on the 4000 board or on other interface boards. Each channel has a programmable baud rate of up to 10 Mbps and can be configured as RS-232, RS-422 or RS-485.The M4KSerialPlus module is supplied with C drivers, including source code.
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Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
Test System
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, to Two 68 Pin Male VHDCI
510140114
Pull-Thru Adapter
PXI Pull-Thru Adapter, Wired, QuadraPaddle, to Two 68 Pin Male VHDCI
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Interface Module
PMC-MA4
Interface Module
Alta Data Technologies’ PMC-MA4 interface module is a multi-channel, multi-protocol 1553 and ARINC PMC card supported by the latest software technologies. Ideal for SBCs or carriers for VPX, VME and cPCI (Compact PCI/PCIe or PXI) - Commercial or Rugged/Conduction Cooled Systems. This hardware and software package provides increased system performance and reduces integration time.
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Interface
R15-EC
Interface
The R15-EC card provides the highest level of performance and density for MIL-STD-1553A/B in an ExpressCard form factor. The R15-EC card provides 1 or 2 channels integrated with powerful API software that provides instant access to all 1553 databus functionality and data. Standard features include real-time bus playback (with ability to edit out RTs), aperiodic message insertion, error injection/detection, conditional BC branching, 64-bit, 25 nanosecond message timetagging, and “Oneshot” BC operation. The Bus Monitor mode provides 100% bus monitoring of a fully loaded 1553 bus. IRIG-B Receiver (AM or DC/TTL) Generator (DC/TTL) optionally available.
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VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
