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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
Autoanalysis System Set
PGA-710B
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The PGA-710B is a unique electrostatic data analysis device for use with Prostat's PFK-100B Field Meter and Charge Plate Monitor kit. It records, plots, analyzes and automatically constructs reports of body voltage generation, electrostatic decay, voltage retention, ionizer performance and other static measuring functions.
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Complete Set of React Components
ExtReact
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Building React components on your own is time consuming, has integration and maintenance risks, and gets in the way of actually building the app. Now you can easily get all of the components you need to build data-intensive web apps with ExtReact. To learn more, read the FAQ and try ExtReact in a browser with Sencha Fiddle.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Coaxial Attenuators Set
11583C
Attenuator
The Keysight 11583C contains a set of four 8493C attenuators 3, 6, 10, and 20 dB furnished in a handsome walnut accessory case. The Keysight 8493C are APC-3.5 connectors with a maximum frequency of 26.5 GHz. This set is ideal for calibration labs or where precise knowledge of attenuation and SWR is desired.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Transmission Measuring Set
Model 2031 / 2031A
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- Compact Two in One Instrument with Level Oscillator & Level Meter- Selectable Spot Frequencies upto 4KHz- Digital dB Meter to Measure Level from-60dBm to +20dBm- Under / Over Range Indication- Built-in Rechargeable Battery- Lo-Batt Indication- Easy to Operate, Light in Weight & Portable- Selectable Spot Frequencies from 200Hz to 4000Hz- Extra Switchable Input & Output Impedance of 1120 ohms)
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
ANSI Standard Burden Sets
Voltage and Current
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Testing and calibrating instrument transformers often requires standard burdens of reliable accuracy and stability, and burdens that are immune to stray fields and harmonics. The burden sets described below have been carefully designed to meet these requirements.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
High Pressure Vacuum Set Point Vacuum Switch
J205V
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The J205V High Vacuum Low Set Point Vacuum Switches are among our most versatile offering, affording the end user an extensive operating environment and a wide range of set point optionality. These switches can be exposed to severe vacuum conditions without compromising integrity or switch functionality.
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Product
MP CI set
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The MP CI set up to measure coupling impedance is used to determine EMC characteristics of connectors and cables. The coupling inductivity defines the coupling inductance of external disturbance on the shield or on the ground with the desired signals. If the coupling inductivity is considered in the construction set-up and the pin or wire assignment of connectors or cables, then the connectors or cables will be more interference-resistant. The MP CI set-up for measuring coupling impedance can be used for following measurements at connectors or cables: 1. measurement of a single signal (common mode) 2. measurement of a symmetrical signal (common mode) 3. measurement of a symmetrical signal (differential mode)
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Product
Current Injection Sets
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Built in c based Time Interval Meter measuring from1 millisec to 9999 sec. Panel with easy and clear legends to read. Continuosly variable outputs. Auto Cut-off & output isolated. Self sensing of contacts i.e. NO or NC Potential free star stop signals Available in Portable / Lab type models with metal cover
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
Flexible Cable Set, 2.4 Mm To 7 Mm
85135F
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Achieve phase stability with these 62.9-cm cables when a DUT is connected between cable ends
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Optical Talk Set
TM4103N
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TM4103N Optical Talk Set is an intelligent and efficient instrument that combines in one set the functions of both a digital optical phone and a stabilized light source. It is widely used in operations of installation, optical testing, maintenance and fiber attenuation value testing in data network, CATV and Telecommunication network. The TM4103 Talk Set can carry out full-duplex communication with high quality connection and not be affected by distance.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Optical Talk Set
TW4103
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Techwin(China) Industry Co., Ltd
Full-duplex digital communication with high quality conversation connection and low background noiseTogether with Optical Clip-on Coupler, enables on line communications availableCombining functions of both a digital optical phone call and a stabilized light source.Large LCD display with backlightLow battery power indicationApplicationsMaintenance in TelecomMaintenance CATVTest Lab of optical fibersOther Fiber Optic Measurements
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
LS-28-1U Chassis Cable Assembly Set
28U-CBLSET
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Cable assembly set for LS-28-DRSM 1U Rack Mount Unit
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Product
The Imperas Instruction Set Simulator
ISS
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The Imperas ISS is often the first simulation product used in an embedded software development project. The Imperas ISS allows the development and debug of code for the target architecture on an x86 host PC with the minimum of setup and effort. It simply requires the cross compilation of your application and running the ISS with an argument to specify the name of the application object.
