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Product
LXI Microwave Matrix, 10GHz, Dual 3x3, Terminated With Loop-Thru
60-750-233-C
Matrix Switch Module
The 60-750-233-C is a dual 3x3 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Time-Frequency Analysis, Time-Series Analysis and Wavelets
LabVIEW Advanced Signal Processing Toolkit
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Includes the LabVIEW Digital Filter Design Toolkit (also available separately)Time-series analysis -- statistical analysis for description, explanation, prediction, and controlTime-frequency analysis -- analytical, graphical tools for signals with evolving frequency contentWavelet and filter-bank design for short-duration signal characterization, noise reduction, and detrendingIncluded in all NI Software Suites
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Product
Fiber Test & Measurement
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Thorlabs manufactures a range of devices for testing and measuring the performance of optical fiber. Power, spectral signature, polarization, or end face surface geometry can by characterized with out-of-the-box solutions from our catalog. EO modulators, optical switches, and light sources are available to treat light being used on a test bed.
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Product
Signal Integrity Measurement Systems
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GigaTest Labs is a Keysight Technologies Solutions Partner, offering fully configured signal integrity measurement systems for high bandwidth signal integrity characterization. Our wealth of experience with Keysight's Vector Network Analyzer and Time Domain Resonance Oscilloscope tools will help you navigate and understand different instrument capabilities & configuration options that will benefit your engineering team.
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Product
Magnet Testing
m-axis
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m-axis is a measurement system that can be used to characterize permanent magnets in terms of their magnetic specifications (magnetic moment and magnetization angle) with high precision. In addition to the four standard measuring ranges, the modular design allows the system to be adapted to customer-specific requirements. The measurement systems can be used for 100% in-line quality control via our m-axis I/O module.
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Product
Aluminum-Polymer
OS-CON™
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Panasonic Industrial Devices Sales Company of America
Panasonic's OS-CON™ Aluminum-Polymer Solid Capacitors are available in both surface-mount and through hole types. These Solid Electrolyte Aluminum OS-CON™ Capacitors utilize aluminum and a highly conductive polymer material to offer low ESR, excellent noise reduction and ripple current capabilities. The OS-CON Series parts are characterized by a long-life and minimal ESR changes throughout the entire product line’s rated temperature range.
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Product
16 Mux-scrambling Modulator
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Hangzhou Softel Optic Co., Ltd.
SFT3394C is a high performance and cost-effective QAM modulator designed by Softel. It has 16 DVB-S/S2 FTA tuner input to 16 non-adjacent carrier output with multiplexing, scrambling and QAM modulating included. It also supports maximum 512 IP input port and one IP (MPTS) output through GE1 and TS input for re-mux through 2 ASI ports. SFT3394C is also characterized with high integrated level, high performance and low cost. It supports dual power supply (optional). This is very adaptable to newly generation CATV broadcasting system.
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Product
LXI Microwave Matrix, 10GHz, Single 8x4
60-750-184-B
Matrix Switch Module
The 60-750-184-B is a single 8x4 10GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-01
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
Current-Voltage Measurement System
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The SSIVT is an electrical current-voltage measurement system used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load. The performance of the photovoltaic cell is determined by measuring this output I-V relationship while it is being illuminated.
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Product
C-SGN Emulator
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The C-SGN Emulator combines the MME, SGW, and PGW functions, simulating the optimized EPC network required for CIoT. As part of the NetTest suite, the C-SGN Emulator creates an end-to-end lab environment for testing functions and features that characterize enhanced Machine Type Communication (eMTC) and Narrow Band Internet of Things (NB-IoT) implementations. In order to reduce complexity in the setup of a test environment, it also supports simulation of SMS Central Function (SMS-SC) and the Service Capability Exposure Functions (SCEF).
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Product
Pulser / Sampler Core
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Furaxa has researched, developed, and characterized a novel monolithic arrayable pulse and sample aperture generation technology. Recent results include demonstration of sub-10ps pulse/aperture generation at repetition rates up to 3 Billion Pulses/Samples Per Second (BPPS) with jitter that is estimated at sub-10fs. Further, simulations in a number of InP DHBT processes exhibit sub-3ps 20BPPS performance. The IP is process-independent, and has been achieved in CMOS SOI, InP HBT, SiGe and GaAs so far. Please contact us regarding your specific foundry and technical requirements: The company currently licenses the sampler/pulser technology for use by application and market, and is interested in discussing how the technology can enable our partners' applications. A short list of characterized Pulser/Sampler Cores is given below.
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Product
64 Gbaud High-performance BERT
M8040A
Bit Error Rate Tester (BERT)
The Keysight M8040A is a highly integrated BERT for physical layer characterization and compliance testing. With support for PAM-4 and NRZ signals and data rates up to 64 Gbaud (corresponds to 128 Gbit/s) it covers all flavors of 200 and 400 GbE standards.
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Product
Controlled Impedance Analyzers
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HYPERLABS Controlled Impedance Analyzers can be used with various probes and adapters to quickly and reliably characterize impedance on PCB test coupons. These Test Systems are designed to comply with IPC-2141A standards for PCB coupon testing, and can be customized to meet specific customer needs.
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Product
IV-curve Software
Tracer
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In Tracer you will find your all-in-one solution for the measurement and elaboration of IV-curve measurements. Tracer is the core application developed by ReRa that will help you to characterize your solar cells and compare the results.Tracer natively supports the control of Keithley 24xx and 26xx sourcemeters.These instruments have proven their strength over time for the measurement of solar cells.
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Product
Drivetrain Tester
G5.DT
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The G5.DT series is bidirectional regenerative. It was developed specifically for testing DC components of the electrical drive train or DC components of other parts of the vehicle electrical system. It is suitable for use in laboratories and on test benches. The modular and finely graded G5.DT series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies are equipped with a powerful CAN multi-protocol interface (1 kHz, 16 bit) and optionally offer test bench relevant safety functions such as PL e according to EN ISO 13849, insulation monitoring as well as automatic discharge on the load side in case of shutdown.
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Product
Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
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Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Product
High Voltage Optically Isolated Probe, 700 MHz Bandwidth. Includes soft-carrying case.
DL07-ISO
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The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Product
Signal Analysis
Histograph
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The Histograph software is used for statistical signal analysis: finding the statistical values characterizing the signal and building the theoretic histograms based on the data obtained.
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Product
Power Device Analyzer / Curve Tracer
B1505A
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The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
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Product
High-resolution Spectrometer
HR4000
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Our next-generation high-resolution spectrometer is a novel combination of optics and electronics that is ideal for applications such as characterizing lasers, measuring gas absorbance, and determining atomic emission lines.
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Product
LXI Microwave Matrix, 10GHz, Dual 4x4
60-750-244
Matrix Switch Module
The 60-750-244 is a dual 4x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Technical Software Engineering
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Technische Software Entwicklung Plazotta
TSEP is a system house that has specialized since 1988 in the development of system-related software in the fields of communications technology, telecommunications, instrumentation and automotive. Since 2005 TSEP also develops hardware solutions for its customers. Here TSEP offers not only the hardware solution (schematic, layout, production, etc.), but also the software technical integration of hardware into the operating system and the application. These solutions are characterized by the fact that both the hardware and the software are perfectly matched.
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Product
Data Acquisition
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Data Acquisition used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
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Product
ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
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The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Product
PAM4 Bit Error Rate Tester.
BERT-1102
Tester
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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Product
Thermal FFF
TF2000
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The new award winning Postnova TF2000 Thermal FFF Series was invented to become the first professional modular Thermal FFF system available. It is completely integrated by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The TF2000 Series incorporates the combined solid know-how and the proven technologies from three decades of leadership in FFF. Due to its unique design, the TF2000 Thermal FFF system offers more flexibility, higher robustness and better performance than traditional chromatographic systems. No separation column with stationary phase is required anymore and consequently the TF2000 technology sets a complete new standard and offers a real alternative to column-based polymer characterization techniques.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Low-leakage Switch Matrix Family
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Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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Product
Embedded DisplayPort Electrical Performance and Characterization Toolset Software
D9040EDPV
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Characterization testing of eDP designs now supporting AUX channel automation.
