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Product
Instruments
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Advanced Thermal Solutions, Inc.
ATS designs and fabricates the most extensive line of thermal test instruments specifically designed for the electronics industry. These research-quality, state-of-the-art instruments include Pressure, Temperature and Velocity Measurement Systems, Airflow and Heat Flux Controllers, Micron-level Thermography Systems and Cold-Plate Thermal Characterization Systems.
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
Static and dynamic analysis
MEMS
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Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
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Product
RF Analog Signal Generators
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The right solution for your requirements from the broad analog signal generator portfolio of Rohde & Schwarz.With the analog signal generator portfolio we cover the wide range of RF, microwave and mmWave frequencies.Our selection of analog signal generators is characterized by the outstanding signal purity and performance as well as their functionality of the solutions; whether in the high end or midrange area.The solutions benefit industries such as RF semiconductor, wireless communications, aerospace and defense, and also covers tasks featuring development, production and service, and more.
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Product
Supercontinuum White Light Lasers
SuperK series
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The SuperK series is an industry-leading range of turn-key supercontinuum white light lasers used by the most innovative companies within bio-imaging, semiconductor inspection, sorting, device characterization, and scientific instrumentation. The sources are robust and reliable, built for intensive use, and can replace multiple single-line lasers as well as broadband sources like ASE sources, SLEDs and lamps.
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Product
Environmental Monitoring
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Is the processes and activities that are done to characterize and describe the state of the environment.
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Product
Solutions for Nondestructive Characterization of Elastic
Sonelastic
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Sonelastic® is a line of solutions for nondestructive characterization of elastic modulus and damping of materials by the natural frequencies obtained by impulse excitation technique.
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Product
Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Product
Dual Blackbody Wide FOV
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Dual blackbody, all reflective background IR target projector is used to characterize WFOV IR sensor systems. It features a broadband, 3 to 14 micron range, reflective IR target technology for the most accurate and stable differential targets, controlled background radiance, a 5º FOV with 36º uniform background.
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Product
ProxiLAB Quest Contactless Tester
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Fully programmable card (PICC), reader (PCD) and NFC signal emulator for device characterization and protocol conformance verification. ProxiLAB Quest offers the performance and features required for full characterization and conformance validation of all 13.56 MHz contactless technologies, including the latest very high bit-rate evolutions. ProxiLAB Quest integrates with a variety of conformance certification solutions and test automation platforms.
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Product
COLOSUS
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The COLOSUS line of electro-optical test systems from Santa Barbara Infrared Inc. and Labsphere Inc. include collimated optics, software and uniform sources for the optical characterization of sensors and cameras.
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Product
Spectroscopic Ellipsometer
PH-SE
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The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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Product
IP QAM
SFT3332 (-D)
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Hangzhou Softel Optic Co., Ltd.
SFT3332 (-D) IP QAM modulator is Mux-scrambling-modulating all-in-one device developed by SOFTEL. It has 32 multiplexing channels, 32 scrambling channels and 32 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 32 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is characterized with dual RF output ports which broaden the bandwidth for QAM carriers.
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Product
Comprehensive Test and Assessment for IoT Devices
Ixia IoT
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Keysight Network Applications and Security
Characterize and optimize IoT devices under real-world deployment conditions
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Product
PCI Express 6 Base Specification Receiver Test Automation
N5991PB6A
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The N5991PB6A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 6.0 ASICs
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Product
PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Fully Portable Stand-Alone OTDRs
LOR-200
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The LOR-200 is a family of fully portable stand-alone OTDRs. The instrument is integrated in a Windows XP based PC-platform with touchscreen interface.The LOR-200 is based on Luciol's novel scanning photon-counting technology (US patent #7,593,098). It achieves a superior dynamic range, and allows high resolution fiber characterization up to a total distance range of 160 km.
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Product
OTDR
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OTDR, short for optical time-domain reflectometer, is an optoelectronic instrument used to characterize an optical fiber. It can offer you an overview of the whole system you test and can be used for estimating the fiber length and overall attenuation, including splice and mated-connector losses. It can also be used to locate faults, such as breaks, and to measure optical return loss.
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Product
Mux-scrambling Modulator 8 Ch
SFT3394C
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Hangzhou Softel Optic Co., Ltd.
SFT3394C is a high performance and cost-effective QAM modulator designed by Softel. It has 16 DVB-S/S2 FTA tuner input to 16 non-adjacent carrier output with multiplexing, scrambling and QAM modulating included. It also supports maximum 512 IP input port and one IP (MPTS) output through GE1 and TS input for re-mux through 2 ASI ports. SFT3394C is also characterized with high integrated level, high performance and low cost. It supports dual power supply (optional). This is very adaptable to newly generation CATV broadcasting system.
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Product
Dynamic Light Scattering (DLS)
NANOTRAC
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Dynamic Light Scattering (DLS) is an established and precise measurement technique for the characterization of particle sizes in suspensions and emulsions. Microtrac is a pioneer of particle analysis technology and has been developing optical systems based on Dynamic Light Scattering for over 30 years.
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Product
HDT & Vicat Systems
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The Instron line of CEAST Thermo-mechanical systems are used to characterize the behavior of plastic materials at high temperatures, measuring the heat deflection temperature (HDT) and the Vicat softening temperature (Vicat). These HDT and VICAT testers range from very simple units for quality control labs to more advanced and automated systems.
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Product
Refractive Index Profiler
S14
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The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Product
Current-Voltage Measurement System
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Sciencetech''s IV Testers are electrical current-voltage measurement systems used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load.This IV Test system can measure electrical power from photovoltaic cells up to 20W. The voltage envelope is limited to 20V and the current to 1A. A higher power version, up to 60W, is available. In general, the limitation on this model is the 1A current limit: if your solar cell generates more than 1A, we recommend upgrading to the 60W version.
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Product
High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
Source Measure Unit
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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Product
Precision Current-Voltage Analyzers
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The powerful characterization software and integrated SMU of Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into characteristics across a wide range of applications. The Precision Current-Voltage Analyzer Series comprises the following three analyzer families:
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Product
Power Dividers/Combiners
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Macom Technology Solutions Holdings Inc.
MACOM’s power combiners and dividers are used in aerospace and defense, wireless, and wireline communications applications. These devices can also be used for broadband CATV applications. They are available in a variety of connectorized and surface mount packages. Available in subsets operating between the 400 kHz to 26 GHz frequency range, our dividers and combiners are characterized as both 50 and 75 ohm devices
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Product
TLP Tester
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Tokyo Electronics Trading Co., Ltd.
A method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures.
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Product
Measuring Solar Fields
ISET Sensor
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The solar radiation sensor is characterized by a simple and compact but precise structure. Use in balancing monitoring systems for simple, fast and reliable information about the functioning and solar "energy yield" of a PV plant. For site surveys, monitoring and other fields of survey technology.



























