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Product
LXI Microwave Matrix, 10GHz, Single 3x3
60-750-133
Matrix Switch Module
The 60-750-133 is a single 3x3 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Test Fixture
OCP NIC 3.0
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These test fixtures are necessary for testing within the OCP NIC subgroup (found under the OCP Server Work Group). These fixtures will arrive meeting the OCP NIC 3.0 Specification with a characterization of the boards. These fixtures mate with the OCP form factor connector, and will allow an electrical break out of each signaling lane.
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Product
Squeak & Rattle Sub-System And Component Testing
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At MB Dynamics, we’re proud to provide clients in a wide range of industries with quiet, custom turnkey component testing systems for combined squeak & rattle testing as well as durability testing of different components and subsystems (in 1 to 6 DOF). Test items can be excited in one or more axes to understand and characterize the physics and root causes of BSRs. Real-world, on-road vibration conditions are multi-axis simultaneous – vertical, fore-aft or longitudinal, lateral, roll, pitch, and yaw – 6 degrees of freedom or 6 DOF. Affordability drives decisions to find BSRs by exciting in one or two – fewer than 6 DOF. That has been a driving force for MB – be effective at finding BSRs with a lesser number of shakers (DOFs) and thus reduce the test equipment cost of finding BSRs. Vertical-only can be effective; sequential vertical then fore-aft then lateral is one step closer to real-world; creating vibration in four or five axes of response simultaneously is even closer; and full 6 DOF systems that are quiet come closest to duplicating in the lab the on-road conditions. MB offers all these possibilities to meet trade-offs of budget, test time, road replication, and BSR detection effectiveness.
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Product
Glow Discharge Optical Emission Spectrometer
GD-Profiler 2™
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The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin and thick films characterization and process studies.
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Product
ATCA 5U 6 Slot Dual Dual Star 40G - with bused IPMB
109ATCA506-1003R
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The 5U 6 slot ATCA backplane is a dual dual start with bused IPMB, designed to meet 40Gbps (4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
Remote Radio Head Test, Reference Solution
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The Remote Radio Head Test, Reference Solution provides the physical interfaces together with the vector signal analysis and vector signal generation you need to carry out comprehensive functional and performance testing of your RRH). Fully characterize the uplink and downlink, RF air-interface to and from the digital "front-haul".
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Product
Oil-in-Water Analyzer
HR25K
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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Product
PXI/PXIe Arbitrary Generators
Waveform Generator
The arbitrary waveform generators of the PXA72xx family are characterized by a resolution of 16 bits with a maximum sample rate of 200 MS per second. The devices can also be used to directly output voltages of up to 30 V (or ±15 V).
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Product
WavePulser 40iX High-speed Interconnect Analyzer
WavePulser 40iX Series
Analyzer
WavePulser 40iX is the ideal single measurement tool for high-speed hardware designers and test engineers. The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox provides unmatched characterization insight of high-speed interconnects.
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Product
Profile Imaging Modules
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The Opto profile imaging modules are characterized by the U-shaped all-aluminum housing, which is only 40mm wide.
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Product
IndiRAM CTR With Quantum Characterizer
Spectrometer
The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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Product
PNA Microwave Network Analyzer
N5224B
Network Analyzer
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Oscilloscopes
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Berkeley Nucleonics Corporation
Is a type of electronic test instrument that graphically displays varying voltages of one or more signals as a function of time. Their main purpose is capturing information on electrical signals for debugging, analysis, or characterization.
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Product
Wide FOV Target Projector
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The Model 13792 is a broadband portable target projector used for characterizing the performance of a wide variety of infrared sensor systems. The system incorporates SBIR standard components to provide accurate and precise stimulus to sensors under test in laboratory, depot and production line environments. Testing can be automated with the use of IRWindows™ test system controller that reduces test times and cost, while improving the consistency and accuracy of test results.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
High Voltage 50 Ω Pulse Generator
TLP-12010A
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High Power Pulse Instruments GmbH
The high-current TLP/HMM test system TLP-12010A offers advanced features intended for the characterization of semiconductor devices, discrete components, such as TVS, varistors, capacitors, gas tubes, circuits and systems in the high power time domain. It includes high current I-V characteristics inpulsed operation mode, turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects e.g. reverse recovery, Safe-Operating-Area (SOA) and ESD measurements in general.
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Product
PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-02
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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Product
Automatic Fixture Removal
S95007B
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Many devices do not have coaxial connectors and so they are put in fixtures in order to measure them in a coaxial environment. You must accurately remove the effects of the fixture to get a good measurement of the device under test (DUT). This option adds a powerful application wizard to guide you through characterizing a fixture and removing it from the measurement. The S95007B software is compatible with M980xA PXI Vector Network Analyzers.
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Product
Optical Communication Analysis
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In lab and manufacturing environments, R&D engineers require scalable and optimized test solutions to enable them to properly characterize new advanced modulation scheme signals for next-generation, ultra-high-speed telecom networks. Through EXFO’s optical communication analyzers, R&D engineers and manufacturing operations involved in the development or production of transmitters or systems based on new high-speed technology will find the right tools for their advanced technology needs.
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Product
Display Measurement Systems
DTS Series
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Instrument Systems Optische Messtechnik GmbH
Characterization of emissive, transmissive, reflective, and transflective displaysViewing-angle-dependent analysis of illuminance, contrast, color, and derived parametersDetermination of the electro-optical transfer function: analysis of luminance, contrast, and color depending on electrical driving conditionsMeasurement of transient properties, such as switching times, flicker, and modulation
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Product
Probes
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D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm diffenrential, single-ended probe.
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Product
PCI Express 4 CEM Receiver Test Automation
N5991PC4A
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The N5991PC4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 4.0 CEM Add-In Cards and systems
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Product
PCI Express 5 CEM Receiver Test Automation
N5991PC5A
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The N5991PC5A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 5.0 CEM Add-In Cards and systems.
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Product
PNA Microwave Network Analyzer
N5225B
Network Analyzer
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Power Management Analyzer Test Suites for 802.3at, 802.3bt, & Hybrid PSEs
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While most PSE ports are part of multi-port PSE, behaviors of such systems of PSE ports are beyond the scope of IEEE 802.3 specifications. Sifos offers two fully automated analyzer suites that uniquely characterize PSE port administration and power management behaviors including PD admittance policies, PSE capacity management, LLDP policies, and powering stability. Each of these suites are built upon Live PD Emulation, a feature that enables each test port to independently and continuously emulate user-described PD’s.
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Product
Modulation Distortion Up To 13.5 GHz
S930701B
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S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Ferroelectric Test System
LCII
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Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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Product
Low Leakage Switch Mainframe
B2201A
Mainframe
The B2201A reduces the cost of test by enabling characterization tests to be automated, with only slight compromise to the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators.
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Product
RF Training Kit And Lab Sheets
Y1800A
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The RF transceiver kit consists of a transmitter unit and a receiver unit in superheterodyne architecture. The transceiver units are made up of various RF building-block modules such as filter, low noise amplifier, power amplifier, mixer and oscillator. The RF transceiver kit is controlled by a Windows-based Control Panel software via USB. A Measurement Automation Program is provided to demonstrate automated characterization and test of RF circuits. A signal generator and a spectrum analyzer are required to run this program.
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Product
Candlestick Sensor
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Advanced Thermal Solutions, Inc.
The Candlestick Sensor is a flexible, robust, base-and-stem design air velocity sensor that measures both temperature and air velocity for characterizing thermal conditions in electronic systems. The Candlestick Sensor is narrow and low profile to minimize the disturbance of the heat flow in the test domain. It features a flexible, plastic-sleeved stem, which facilitates installation and repositioning during the testing process.
