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Product
Cryostats
attoCRYO
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Fundamental research in physics, as well as specimen characterization in materials science often require the use of (ultra) low temperatures. Many phenomena also involve the application of high magnetic fields, usually generated by superconducting magnets. attocube provides a broad portfolio of versatile cryostats for sensitive measurements at variable temperatures and extreme conditions.
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Product
Current-Voltage Measurement System
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The SSIVT is an electrical current-voltage measurement system used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load. The performance of the photovoltaic cell is determined by measuring this output I-V relationship while it is being illuminated.
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Product
Automated Calibration
ORION
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ORION automates the process of characterization and calibration of engines. It facilitates the calibration process by taking control of both the ECU calibration system and the test cell control system to run experiments as part of an automated calibration process. With connectivity to IAV’s EasyDOE, Mathworks’ MBC Toolbox and other DOE tools, ORION provides an extremely powerful environment for mapping an engine and generating the Engine Management System calibration tables. The modular design means the product can be configured to a users’ specific requirements and work practices, rather than having to adhere to rigid methodologies dictated by prescriptive software.
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Product
WaveMaster 8000HD High Bandwidth Oscilloscopes
WaveMaster 8000HD Series
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WaveMaster 8000HD is the only high speed oscilloscope designed for all stages of product development, whether first-silicon characterization, link validation over channels, or debugging across the entire the protocol stack. No other high speed oscilloscope supports more engineering tasks with more unique tools.
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Product
PXIe-5652, 6.6 GHz RF Analog Signal Generator
781217-01
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PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Product
UXG X-Series Agile Signal Generator, Modified Version
N5191A
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et closer to reality: simulate increasingly complex signal environments for radar, EW & antenna-test Test sooner & increase confidence in EW systems by generating signal simulations when you need them: the UXG is a scalable threat simulator Use pulse descriptor words (PDWs) to generate long pulse trains & individually control pulse characteristics Quickly characterize antennas over a wide frequency range with fast frequency tuning Performance without requiring an export license
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Product
PNA-L Microwave Network Analyzer
N5231B
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Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to 13.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Stylus Profilometry
Dektak®
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Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Product
PNA Network Analyzer Family
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Choose between three PNA Series to get the right mix of speed, performance and price In R&D, obtain a higher level of measurement integrity that helps you transform deeper understanding into better designs On the production line, attain the throughput and repeatability you need to transform great designs into competitive products Get the ultimate expression of Keysight expertise in linear and nonlinear device characterization
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Product
PXIe-4139 , ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit
782856-03
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PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 40 W of DC power. This module features analog-to-digital converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
Solid-State & Pouch Cell Test Cell
SSP1
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SSP1 Solid-State & Pouch Cell Test Cell is designed for solid-state battery, liquid battery or in-situ electrochemical research where stable assembly pressure, reliable sealing and repeatable cell geometry are important. It supports laboratory-scale testing, method development and custom battery fixture projects. Choose the test cell or mold according to electrolyte type, target pressure, electrode size and required characterization method. For spectroscopy or imaging experiments, confirm window material, beam path and sealing requirements before ordering.
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
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The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
Automated Optical Inspection
AOI
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No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
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Product
Rheometers
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The MCR rheometer series from the market leader offers you one thing first and foremost: an open range of possibilities. Whatever your rheological requirements are and will be in the future – based on its modular setup, your MCR rheometer is efficiently and comfortably adapted and extended to meet your needs, from routine quality control to high-end R&D applications. An investment in an MCR rheometer is always a safe investment in longstanding technology: The air-bearing-supported EC motor, for example, was developed by Anton Paar and has been used in all MCR models for over 25 years to ensure accuracy across a vast viscosity range. It makes it possible to measure liquids with a viscosity even lower than water and also characterize stiff materials like polymer composites or steel by DMA – and everything in-between.
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Product
Oil-in-Water Analyzer
LR2500
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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Product
Thick Film Divider
GBR-391
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GBR-391 series high-voltage resistive dividers are made in a thick film technology on ceramic substrates (Al2O3 - 96%) with leads for through-hole mounting. Dividers are characterized by very high maximum voltage, and standard voltage division.
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Product
PNA-X Microwave Network Analyzer
N5241A
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Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the worlds widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
IndiRAM CTR With Quantum Characterizer
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The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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Product
Thermal/Mechanical Testing
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Accolade Engineering Solutions
As new products employ advanced materials and processes, the need to measure and characterize those material properties becomes increasingly important. DSC is used to measure heat flow in to or out of a material. Some DSC applications include measurement of melting temperature, polymorphic transitions, crystallization temperature, thermal stability, heat of fusion and degree of cure. TMA is used to measure dimensional changes of a material as a function of temperature.
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Product
PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
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PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Dynamic Image Analysis (DIA)
CAMSIZER
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Dynamic Image Analysis (DIA) is a modern particle characterization method for the determination of size distributions and shape parameters. It allows quick analyses with excellent accuracy and reproducibility over an extremely wide measuring range. With the renowned CAMSIZER system, Microtrac introduced its first Dynamic Image Analyzer over 20 years ago and has pushed technological innovation ever since.
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Product
PNA-X Microwave Network Analyzer, 26.5 GHz
N5242B
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Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Optical Multiport Power Meter
N7745C
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Keysight's popular N7745A optical power meters with eight power-sensor channels provide increased throughput and operational efficiency to meet today's challenges in manufacturing. Designed for characterizing optical multiport components, these optical power meters offer industry-leading solutions for device connectivity, high-speed measurement data acquisition and fast data transfer for post-processing. The multiport power meter enables fast measurement solutions for all multiport devices; for example multiplexers, PON splitters, wavelength selective switches (WSS) and ROADMs, as well as compact setups for simultaneous testing of multiple single-port devices.
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Product
LXI Microwave Matrix, 20GHz, Single 3x3 With Loop-Thru
60-751-133-A
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The 60-751-133-A is a single 3x3 20GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Teradyne Software Solutions
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From design through production, whether developing and debugging code or performing characterization, Teradyne offers an array of seamless solutions that extend beyond our core software to reduce your engineering efforts and speed development.
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Product
Probe Series
CAPELLA Series
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MPI Photonics Automation is the industry leading provider of turnkey test solutions for the LED / Mini LED manufacturing industry. With more than 10,000 MPI probers installed worldwide, the CAPELLA series of probers have a proven track record of superior performance and reliability. The CAPELLA series probers support electrical and optical characterization of all LED product types (Vertical chip, Lateral chip, Flip-chip) from wafer to packaged die level. Whether you need a high-performance, cost-effective or specialty prober system, MPI PA has the most comprehensive range of LED wafer/chip probers to meet your exacting requirements.
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Product
SSD
M.2 SSD (iSLC)
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Innodisk M.2 (S42) 3IE4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Product
Variable Angle Spectroscopic Ellipsometer
VUV-VASE
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The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to characterize numerous types of materials: semiconductors, dielectrics, polymers, metals, multilayers and now liquids such as immersion fluids.
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Product
Booster and In-line Amplifier
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Amonics' EDFA range adopts unique design to produce maximum signal gain and saturated output power while maintaining low noise figure, enabling test capabilities in system or component level manufacturing and characterizing processes, as well as facilitating highly demanding R&D applications. The compact turnkey benchtop or 19" rackmount unit incorporates a user-friendly front panel housing with a LCD monitor display, key switch, power control knob and optical connectors. An integrated RS232 computer interface enables easy control, diagnostic functions and data acquisition.
